Prosecution Insights
Last updated: October 01, 2026
Application No. 18/804,929

CHAMBERS AND COATINGS FOR REDUCING BACKSIDE DAMAGE

Non-Final OA §102
Filed
Aug 14, 2024
Priority
Sep 13, 2021 — divisional of 12/094,716
Examiner
ULLAH, ELIAS
Art Unit
Tech Center
Assignee
Applied Materials Inc.
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
2m
Est. Remaining
93%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
729 granted / 858 resolved
+25.0% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
26 currently pending
Career history
867
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
35.6%
-4.4% vs TC avg
§102
53.6%
+13.6% vs TC avg
§112
7.3%
-32.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 858 resolved cases

Office Action

§102
DETAILED ACTION Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-10are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Seo et al. (Seo, US 6,044,534). Regarding claim 1, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4) comprising: a substrate support (stage 12), wherein the substrate support comprises: a platform defining an annular seat operable to support a semiconductor substrate (wafer 100) about a periphery of the semiconductor substrate (wafer 100), wherein the platform defines an internal recess extending within the annular seat (see FIG. 4); and one or more electrodes (electrode 22) operable to seat a wafer or generate plasma (col. 3, line 25+) within the internal recess. Regarding claim 2, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the platform comprises a recessed base defining the internal recess, and wherein the one or more electrodes comprise: an electrode extending about the recessed base as a coil operable as an inductively-coupled plasma coil (See FIG. 4). Regarding claim 3, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the recessed base comprises a dielectric material (stage 12). Regarding claim 4, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the platform comprises an electrode in the annular seat (stage 12), the electrode operable as an electrostatic chuck for the semiconductor substrate (wafer 100). Regarding claim 5, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the platform comprises a recessed base defining the internal recess, wherein the recessed base is grounded relative to the annular seat, and wherein a capacitively coupled plasma is formable within the internal recess (see FIG. 4). Regarding claim 6, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the semiconductor processing chamber comprises a portion of a toroidal plasma loop extending into the internal recess, and operable to deliver plasma effluents into the internal recess (see FIG. 4). Regarding claim 7, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein a portion of the toroidal plasma loop extends outside of the semiconductor processing chamber (see FIG. 4). Regarding claim 8, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the portion of the toroidal plasma loop extending outside of the semiconductor processing chamber defines an access for precursor delivery (see FIG. 4). Regarding claim 9, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the substrate support defines one or more accesses for precursor delivery into the internal recess (see FIG. 4). Regarding claim 10, Seo shows a semiconductor processing chamber (processing chamber 13 in FIG. 4), wherein the substrate support defines one or more accesses for exhaust from the internal recess (see FIG. 4). Allowable Subject Matter Claims 11-20 are allowed. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ELIAS M ULLAH whose telephone number is (571)272-1415. The examiner can normally be reached M-F at 8AM-5PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Yara Green can be reached at 571-270-3035. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ELIAS ULLAH/Primary Examiner, Art Unit 2893
Read full office action

Prosecution Timeline

Aug 14, 2024
Application Filed
Sep 10, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
93%
With Interview (+7.8%)
2y 4m (~2m remaining)
Median Time to Grant
Low
PTA Risk
Based on 858 resolved cases by this examiner. Grant probability derived from career allowance rate.

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