Prosecution Insights
Last updated: July 17, 2026
Application No. 18/937,037

SENSE AMPLIFIER, MEMORY DEVICE AND OPERATION METHOD THEREOF

Non-Final OA §102
Filed
Nov 05, 2024
Priority
Jun 25, 2021 — provisional 63/214,790 +1 more
Examiner
TRAN, ANTHAN
Art Unit
2825
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Taiwan Semiconductor Manufacturing Company, Ltd.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
7m
Est. Remaining
85%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
640 granted / 773 resolved
+14.8% vs TC avg
Minimal +2% lift
Without
With
+2.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
16 currently pending
Career history
800
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
74.8%
+34.8% vs TC avg
§102
19.1%
-20.9% vs TC avg
§112
1.2%
-38.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 773 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 1-2 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-2 of U.S. Patent No. 12,165,733. Although the claims at issue are not identical, they are not patentably distinct from each other because: Regarding claim 1, claim 1 of Pat. ‘733 discloses a sense amplifier, comprising: a sense amplifier circuit, including a first reference node and a second reference node, sensing a plurality of bit lines according to an enable signal; and a reference sharing circuit, coupled to the sense amplifier circuit, wherein the reference sharing circuit comprises: a plurality of first switches, coupled to the first reference node of the sense amplifier circuit, controlling a first electrical connection of a first reference signal according to a control signal, wherein the control signal is derived from the enable signal; and a plurality of second switches, coupled to the second reference node of the sense amplifier circuit, controlling a second electrical connection of a second reference signal according to the control signal. Regarding claim 2, claim 2 of Pat. ‘733 discloses wherein when the control signal is in a first logic state, the plurality of first switches and the plurality of second switches are switched on to form the first electrical connection of the first reference signal and the second electrical connection of the second reference signal, and when the control signal is in a second logic state, the plurality of first switches and the plurality of second switches are switched off to break the first electrical connection of the first reference signal and the second electrical connection of the second reference signal. Regarding claim 3, claim 3 of Pat. ‘733 discloses wherein the control signal is an inverted signal of the enable signal. Regarding claim 4, claim 4 of Pat. ‘733 discloses wherein the plurality of first switches and the plurality of second switches are transistors of a same semiconductor type. Regarding claim 5, claim 5 of Pat. ‘733 discloses wherein the plurality of bit lines include a first bit line and a second bit line, and the sense amplifier circuit comprises: a core sense circuit, coupled to the first bit line, pre-charging the first bit line to a target voltage in a pre-charge phase, sensing values from the first bit line in a first sensing phase, and sensing values from the second bit line in a second sensing phase; and a bit line pre-charge branch circuit, coupled to the second bit line, pre-charging the second bit line to the target voltage in the pre-charge phase, wherein the pre-charge phase is performed prior to the first sensing phase and the second sensing phase. Regarding claim 6, claim 6 of Pat. ‘733 discloses wherein the plurality of first switches and the plurality of second switches are switched off during the pre-charge phase. Regarding claim 7, claim 7 of Pat. ‘733 discloses wherein each of the first phase and the second phase includes a first sub-phase during which the enable signal is in the second logic state and a second sub-phase during which the enable signal is in the first logic state, the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched on during the first sub-phase, and the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched off during the second sub-phase. Regarding claim 8, claim 8 of Pat. ‘733 discloses wherein the first reference node supplies the first reference signal for sensing a first logic value from the plurality of bit lines, and the second reference node supplies the second reference signal for sensing a second logic value from the plurality of bit lines. Regarding claim 9, claim 9 of Pat. ‘733 discloses a memory device, comprising: a memory array, including a plurality of memory cells; a sense amplifier, coupled to the memory array through a plurality of bit lines, sensing values stored in the plurality of memory cells through the plurality of bit lines, wherein the sense amplifier comprises: a sense amplifier circuit, including a first reference node and a second reference node, sensing the plurality of bit lines according to an enable signal; and a reference sharing circuit, coupled to the sense amplifier circuit, wherein the reference sharing circuit comprises: a plurality of first switches, coupled to the first reference node of the sense amplifier circuit, controlling a first electrical connection of a first reference signal according to a control signal, wherein the control signal is derived from the enable signal; and a plurality of second switches, coupled to the second reference node of the sense amplifier circuit, controlling a second electrical connection of a second reference signal according to the control signal. Regarding claim 10, claim 10 of Pat. ‘733 discloses wherein when the control signal is in a first logic state, the plurality of first switches and the plurality of second switches are switched on to form the first electrical connection of the first reference signal and the second electrical connection of the second reference signal, and when the control signal is in a second logic state, the plurality of first switches and the plurality of second switches are switched off to break the first electrical connection of the first reference signal and the second electrical connection of the second reference signal. Regarding claim 11, claim 11 of Pat. ‘733 discloses wherein the control signal is an inverted signal of the enable signal. Regarding claim 12, claim 12 of Pat. ‘733 discloses wherein the plurality of bit lines include a first bit line and a second bit line, and the sense amplifier circuit comprises: a core sense circuit, coupled to the first bit line, pre-charging the first bit line to a target voltage in a pre-charge phase, sensing values from the first bit line in a first sensing phase, and sensing values from the second bit line in a second sensing phase; and a bit line pre-charge branch circuit, coupled to the second bit line, pre-charging the second bit line to the target voltage in the pre-charge phase, wherein the pre-charge phase is performed prior to the first sensing phase and the second sensing phase. Regarding claim 13, claim 13 of Pat. ‘733 discloses wherein the plurality of first switches and the plurality of second switches are switched off during the pre-charge phase. Regarding claim 14, claim 14 of Pat. ‘733 discloses wherein each of the first phase and the second phase includes a first sub-phase during which the enable signal is in the second logic state and a second sub-phase during which the enable signal is in the first logic state, the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched on during the first sub-phase, and the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched off during the second sub-phase. Regarding claim 15, claim 15 of Pat. ‘733 discloses wherein the first reference node supplies the first reference signal for sensing a first logic value from the plurality of bit lines, and the second reference node supply the second reference signal for sensing a second logic value from the plurality of bit lines. Regarding claim 16, claim 16 of Pat. ‘733 discloses an operation method of a sense amplifier including a sense amplifier circuit and a reference sharing circuit, the reference sharing circuit is coupled to a first reference node and a second reference node of the sense amplifier circuit, the operation method comprising: receiving, by the sense amplifier circuit of the sense amplifier, an enable signal; receiving, by the reference sharing circuit of the sense amplifier, a control signal, wherein the control signal is derived from the enable signal; when the control signal is in a first logic state, switching on a plurality of first switches and a plurality of second switches to form a first electrical connection of a first reference signal and a second electrical connection of a second reference signal, wherein the plurality of first switches and the plurality of second switches are included in the reference sharing circuit; and when the control signal is in a second logic state, switching off the plurality of first switches and the plurality of second switches to break the first electrical connection of the first reference signal and the second electrical connection of the second reference signal. Regarding claim 17, claim 17 of Pat. ‘733 discloses wherein the plurality of bit lines include a first bit line and a second bit line, and the method further comprising: pre-charging, by a core sense circuit of the sense amplifier circuit, the first bit line to a target voltage in a pre-charge phase; pre-charging, by a bit line pre-charge branch circuit of the sense amplifier circuit, the second bit line to the target voltage in the pre-charge phase; sensing values from the first bit line in a first sensing phase, and sensing values from the second bit line in a second sensing phase, wherein the pre-charge phase is performed prior to the first sensing phase and the second sensing phase. Regarding claim 18, claim 18 of Pat. ‘733 discloses wherein the control signal is an inverted signal of the enable signal. Regarding claim 19, claim 19 of Pat. ‘733 discloses wherein the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched off during the pre-charge phase. Regarding claim 20, claim 20 of Pat. ‘733 discloses wherein each of the first phase and the second phase includes a first sub-phase during which the enable signal is in the second logic state and a second sub-phase during which the enable signal is in the first logic state, the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched on during the first sub-phase, and the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched off during the second sub-phase. PNG media_image1.png 482 510 media_image1.png Greyscale Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Cha et al. (US Pub. 2017/0365308). Regarding claim 1, Fig. 2 of Cha discloses a sense amplifier, comprising: a sense amplifier circuit [BLSA], including a first reference node [N1] and a second reference node [N1, can be the same as first reference node], sensing a plurality of bit lines [BL1, BL2] according to an enable signal; and a reference sharing circuit [combination of 130, and 150], coupled to the sense amplifier circuit [BLSA], wherein the reference sharing circuit comprises: a plurality of first switches [one of switch 150, connects to VREF1], coupled to the first reference node [N1] of the sense amplifier circuit [BLSA], controlling a first electrical connection of a first reference signal [VREF1] according to a control signal [OSO3], wherein the control signal [IS03] is derived from the enable signal [any control signal that used to generated ISO3]; and a plurality of second switches [other switch 150, paragraph 0029], coupled to the second reference node [N1] of the sense amplifier circuit [BLSA], controlling a second electrical connection [connection between VREF2 and N1] of a second reference signal [VREF2] according to the control signal [ISO3]. Regarding claims 2, 10, Fig. 2 of Cha discloses wherein when the control signal is in a first logic state [IS03 = active high], the plurality of first switches [SW1] and the plurality of second switches [SW2] are switched on to form the first electrical connection of the first reference signal [VREF1] and the second electrical connection [VREF2] of the second reference signal, and when the control signal is in a second logic state [off state], the plurality of first switches [SW1] and the plurality of second switches [SW2] are switched off to break the first electrical connection of the first reference signal [VREF1] and the second electrical connection of the second reference signal [VREF2]. Regarding claims 3, 11, and 18, Fig. 15 of Cha discloses Row Decoder [7500] generating control signal ISO. Since signal ISO is high and low, it is inherent that ISO is generated by inverting another signal. Regarding claim 4, Fig. 2 of Cha discloses wherein the plurality of first switches and the plurality of second switches [150] are transistors of a same semiconductor type [paragraph 0029]. Regarding claim 5, 12, Fig. 6 and Fig. 7 of Cha discloses wherein the plurality of bit lines [BL1, BL2] include a first bit line and a second bit line [BLB1, BLB2], and the sense amplifier circuit [2300] comprises: a core sense circuit [2300], coupled to the first bit line, pre-charging the first bit line to a target voltage in a pre-charge phase [voltage on BL3, BLB3, during Precharge (T0 to T1) in Fig. 7], sensing values from the first bit line in a first sensing phase [between T2 and T3], and sensing values from the second bit line in a second sensing phase [LSB Sensing1, between T4 and T5]; and a bit line pre-charge branch circuit, coupled to the second bit line, pre-charging the second bit line to the target voltage in the pre-charge phase [during the period between T0 and T1], wherein the pre-charge phase [T0 to T1] is performed prior to the first sensing phase [between T2 and T3] and the second sensing phase [T5 and T6]. Regarding claims 6, 13, and 19 Fig. 6 of Cha discloses wherein the plurality of first switches and the plurality of second switches [2600] are switched off during the pre-charge phase. Regarding claims 7, 14, and 20, Fig. 7 of Cha discloses wherein each of the first phase [between T2 and T3] and the second phase includes a first sub-phase [between T3 and T4] during which the enable signal is in the second logic state and a second sub-phase [between T4 and T5] during which the enable signal is in the first logic state, the plurality of first switches and the plurality of second switches [2600 in Fig. 6] of the reference sharing circuit are switched on during the first sub-phase, and the plurality of first switches and the plurality of second switches of the reference sharing circuit are switched off during the second sub-phase [switches 2600 are off during pre-charge]. Regarding claims 8, 15, Fig. 6 of Cha discloses wherein the first reference node [VREF1] supplies the first reference signal for sensing a first logic value from the plurality of bit lines [BL1, BLB1], and the second reference node [VREF2] supplies the second reference signal [VREF2] for sensing a second logic value from the plurality of bit lines. Regarding claim 9, Fig. 4 of Cha discloses a memory device, comprising: a memory array [300], including a plurality of memory cells [310, 320, 380, and 390]; a sense amplifier [BLSA], coupled to the memory array through a plurality of bit lines [BL1, BL2], sensing values stored in the plurality of memory cells [310, 320, 380, and 390] through the plurality of bit lines [BL1, BL2], wherein the sense amplifier comprises: a sense amplifier circuit [BLSA], including a first reference node [N1] and a second reference node [N1, same is first node], sensing the plurality of bit lines [BL1, BL2] according to an enable signal; and a reference sharing circuit [350], coupled to the sense amplifier circuit [BLSA], wherein the reference sharing circuit comprises: a plurality of first switches [SW1], coupled to the first reference node [N1] of the sense amplifier circuit, controlling a first electrical connection of a first reference signal [VREF1] according to a control signal, wherein the control signal is derived from the enable signal; and a plurality of second switches [SW2], coupled to the second reference node [N1] of the sense amplifier circuit, controlling a second electrical connection of a second reference signal [VREF2] according to the control signal [ISO3]. Regarding claim 16, Fig. 2 of Cha discloses an operation method of a sense amplifier [100] including a sense amplifier circuit [BLSA] and a reference sharing circuit [150], the reference sharing circuit is coupled to a first reference node [N1] and a second reference node [N1, same as first node] of the sense amplifier circuit, the operation method comprising: receiving, by the sense amplifier circuit of the sense amplifier, an enable signal [IOS6, Fig. 6]; receiving, by the reference sharing circuit of the sense amplifier, a control signal [IS03], wherein the control signal is derived from the enable signal; when the control signal is in a first logic state [when ISO3 is active high], switching on a plurality of first switches [SW1] and a plurality of second switches [Sw2] to form a first electrical connection of a first reference signal and a second electrical connection of a second reference signal [SW1 and SW2 are on], wherein the plurality of first switches and the plurality of second switches are included in the reference sharing circuit [within 150]; and when the control signal is in a second logic state [when ISO3 is low], switching off the plurality of first switches and the plurality of second switches to break the first electrical connection of the first reference signal and the second electrical connection of the second reference signal [when SW1 and SW2 are off, the connection is also off]. Regarding claim 17, Fig. 7 of Cha discloses wherein the plurality of bit lines include a first bit line and a second bit line [BL3], and the method further comprising: pre-charging [between T0 and T1], by a core sense circuit of the sense amplifier circuit, the first bit line to a target voltage in a pre-charge phase [voltage on BL3 during T0 and T1]; pre-charging, by a bit line pre-charge branch circuit of the sense amplifier circuit, the second bit line [BLB3] to the target voltage in the pre-charge phase [voltage on BLB3 between T0 and T1]; sensing values from the first bit line in a first sensing phase [between T2 and T3], and sensing values from the second bit line in a second sensing phase [between T3 and T4], wherein the pre-charge phase [between T0 and T1] is performed prior to the first sensing phase [between T2 and T3] and the second sensing phase [between T3 and T4]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ANTHAN T TRAN whose telephone number is (571)272-8709. The examiner can normally be reached MON-FRI, 9AM-5:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Alexander G Sofocleous can be reached at 571-272-0635. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ANTHAN TRAN/Primary Examiner, Art Unit 2825
Read full office action

Prosecution Timeline

Nov 05, 2024
Application Filed
Jun 23, 2026
Non-Final Rejection mailed — §102 (current)

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
85%
With Interview (+2.5%)
2y 3m (~7m remaining)
Median Time to Grant
Low
PTA Risk
Based on 773 resolved cases by this examiner. Grant probability derived from career allowance rate.

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