Prosecution Insights
Last updated: July 17, 2026
Application No. 18/938,256

NAND String Utilizing Floating Body Memory Cell

Non-Final OA §112§DP
Filed
Nov 05, 2024
Priority
May 01, 2013 — provisional 61/818,305 +9 more
Examiner
HOANG, HUAN
Art Unit
2827
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Zeno Semiconductor Inc.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allowance Rate
1141 granted / 1224 resolved
+25.2% vs TC avg
Moderate +6% lift
Without
With
+5.6%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 8m
Avg Prosecution
15 currently pending
Career history
1241
Total Applications
across all art units

Statute-Specific Performance

§101
1.9%
-38.1% vs TC avg
§103
40.9%
+0.9% vs TC avg
§102
27.7%
-12.3% vs TC avg
§112
9.4%
-30.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1224 resolved cases

Office Action

§112 §DP
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claims 1-20 are objected to because of the following informalities: The term “have” after “said floating body region” in claim 1, line 3, claim 7, line 5 and claim 13, line 6 should be “having”. Appropriate correction is required. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1-6 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 1 recites the limitation "said portions" in line 16. There is insufficient antecedent basis for this limitation in the claim. Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 1-6 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1 and 4 of U.S. Patent No. 9,368,625 in view of Song (DE-102008033763-A1) or 최양규.(KR-100953646). Regarding claim 1, claim 1 of the patent recites a semiconductor memory cell comprising: a floating body region configured to be charged to a level indicative of a state of the semiconductor memory cell, said floating body region have a first conductivity type selected from p-type conductivity type and n-type conductivity type; a first region in electrical contact with said floating body region having a second conductivity type different from said first conductivity type; a second region in electrical contact with said floating body region, spaced apart from said first region and having said second conductivity type; a third region in electrical contact with said floating body region, spaced apart from said first and second regions and having said second conductivity type (claim 4); wherein said third region is configured to function as a collector region to maintain a charge of said floating body region, thereby maintaining said state of said semiconductor memory cell; and a gate positioned between said first and second regions; Claims 1 and 4 of the patent do not recite said gate surrounds a portion of said floating body region and a doping concentration of said portions of said floating body region surrounded by said gate is different from a doping concentration of a part of said floating body region not surrounded by said gate. However, Song or 최양규 discloses the gate 22 surrounds a portion of floating body 18 for the gate insulating layer wo and the gate 22 to touch three sides (Song, Fig. 18 and The gate 22 surrounds the potentially floating body 18, For example, the gate insulating layer 20 and the gate 22 the entirety or a portion of two or more sides of the floating body 18 touch. As in 18 shown, touch the gate insulating layer 20 and the gate 22 a section of three sides of the floating body 18) or 최양규, Forming a gate oxide film on the exposed top surface of the floating body cell, forming a gate structure to surround the top of the floating body cell on which the gate oxide film is formed, and patterning the gate structure to expose both upper portions of the floating body cell). It would have been obvious to one having ordinary skill in the art to use the gate surrounding a portion of the floating body so that the insulating layer and the gate can touch three sides of the floating body and it would have been obvious to one having ordinary skill in the art to recognize that it would have been a matter of design choice to use a doping concentration of said portions of said floating body region surrounded by said gate different from a doping concentration of a part of said floating body region not surrounded by said gate since Applicant has not disclosed the use of different doping concentrations solves any stated problem and it appears that the memory cell would perform well with the doping concentrations of claims 1 and 4 of the patent. Regarding claim 2, it would have been an obvious matter of design choice to arrange the third region between the substrate region and the floating body region. Regarding claims 3 and 4, It is inherent that said state of the semiconductor memory cell is selected from at least first and second states (any memory cell can store at least two states) and said first and second states are stable states. Regarding claim 5, it would have been obvious to one having ordinary skill in the art to recognize that the memory cel of claim 5 and the memory cell of claims 1 and 4 of the patent are identical in structure; therefore, the differences are only functional limitations. Regarding claim 6, it would have been obvious to one having ordinary skill in the art to recognize that claim 6 of the patent recites the semiconductor memory cell of claim 1, wherein said floating body region and said first, second and third regions are provided in a fin structure. Claims 1-18 are rejected on the ground of nonstatutory double patenting as being unpatentable over claim 1 of U.S. Patent No. 12,171,093 in view of Song (DE-102008033763-A1) or 최양규.(KR-100953646). Regarding claim 1, claims 1 and 4 of the patent recites a semiconductor memory cell comprising: a floating body region configured to be charged to a level indicative of a state of the semiconductor memory cell, said floating body region have a first conductivity type selected from p-type conductivity type and n-type conductivity type (claim 1, lines 7-11); a first region in electrical contact with said floating body region having a second conductivity type different from said first conductivity type; a second region in electrical contact with said floating body region, spaced apart from said first region and having said second conductivity type (claim 1, lines 14-30); a third region in electrical contact with said floating body region, spaced apart from said first and second regions and having said second conductivity type (claim 4); wherein said third region is configured to function as a collector region to maintain a charge of said floating body region, thereby maintaining said state of said semiconductor memory cell; and a gate positioned between said first and second regions; Claims 1 and 4 of the patent do not recite said gate surrounds a portion of said floating body region and a doping concentration of said portions of said floating body region surrounded by said gate is different from a doping concentration of a part of said floating body region not surrounded by said gate. However, Song or 최양규 discloses the gate 22 surrounds a portion of floating body 18 for the gate insulating layer wo and the gate 22 to touch three sides (Song, Fig. 18 and The gate 22 surrounds the potentially floating body 18, For example, the gate insulating layer 20 and the gate 22 the entirety or a portion of two or more sides of the floating body 18 touch. As in 18 shown, touch the gate insulating layer 20 and the gate 22 a section of three sides of the floating body 18) or 최양규, Forming a gate oxide film on the exposed top surface of the floating body cell, forming a gate structure to surround the top of the floating body cell on which the gate oxide film is formed, and patterning the gate structure to expose both upper portions of the floating body cell). It would have been obvious to one having ordinary skill in the art to use the gate surrounding a portion of the floating body so that the insulating layer and the gate can touch three sides of the floating body and it would have been obvious to one having ordinary skill in the art to recognize that it would have been a matter of design choice to use a doping concentration of said portions of said floating body region surrounded by said gate different from a doping concentration of a part of said floating body region not surrounded by said gate since Applicant has not disclosed the use of different doping concentrations solves any stated problem and it appears that the memory cell would perform well with the doping concentrations of claims 1 and 4 of the patent. Regarding claim 2, it would have been an obvious matter of design choice to arrange the third region between the substrate region and the floating body region. Regarding claims 3 and 4, It is inherent that said state of the semiconductor memory cell is selected from at least first and second states (any memory cell can store at least two states) and said first and second states are stable states. Regarding claim 5, it would have been obvious to one having ordinary skill in the art to recognize that the memory cel of claim 5 and the memory cell of claims 1 and 4 of the patent are identical in structure; therefore, the differences are only functional limitations. Regarding claim 6, it would have been obvious to one having ordinary skill in the art to recognize that claim 6 of the patent recites said floating body region and said first, second and third regions are provided in a fin structure. Regarding claims 7 and 13, claims 7, 8 and 10 recite a semiconductor memory array comprising: a plurality of semiconductor memory cells arranged in a matrix of rows and columns, wherein each said semiconductor memory cell includes: a floating body region configured to be charged to a level indicative of a state of the semiconductor memory cell, said floating body region have a first conductivity type selected from p-type conductivity type and n-type conductivity type; a first region in electrical contact with said floating body region having a second conductivity type different from said first conductivity type; a second region in electrical contact with said floating body region, spaced apart from said first region and having said second conductivity type; a third region in electrical contact with said floating body region, spaced apart from said first and second regions and having said second conductivity type; wherein said third region is configured to function as a collector region to maintain a charge of said floating body region, thereby maintaining said state of said semiconductor memory cell; and wherein said third region is commonly connected to at least two of said semiconductor memory cells. Claims 7, 8 and 10 of the patent do not recite said gate surrounds a portion of said floating body region and a doping concentration of said portions of said floating body region surrounded by said gate is different from a doping concentration of a part of said floating body region not surrounded by said gate. However, Song or 최양규 discloses the gate 22 surrounds a portion of floating body 18 for the gate insulating layer wo and the gate 22 to touch three sides (Song, Fig. 18 and The gate 22 surrounds the potentially floating body 18, For example, the gate insulating layer 20 and the gate 22 the entirety or a portion of two or more sides of the floating body 18 touch. As in 18 shown, touch the gate insulating layer 20 and the gate 22 a section of three sides of the floating body 18) or 최양규, Forming a gate oxide film on the exposed top surface of the floating body cell, forming a gate structure to surround the top of the floating body cell on which the gate oxide film is formed, and patterning the gate structure to expose both upper portions of the floating body cell). It would have been obvious to one having ordinary skill in the art to use the gate surrounding a portion of the floating body so that the insulating layer and the gate can touch three sides of the floating body and it would have been obvious to one having ordinary skill in the art to recognize that it would have been a matter of design choice to use a doping concentration of said portions of said floating body region surrounded by said gate different from a doping concentration of a part of said floating body region not surrounded by said gate since Applicant has not disclosed the use of different doping concentrations solves any stated problem and it appears that the memory cell would perform well with the doping concentrations of claims 7, 8 and 104 of the patent. Regarding claims 8 and 14, it would have been an obvious matter of design choice to arrange the third region between the substrate region and the floating body region. Regarding claims 9, 10, 15 and 16, It is inherent that said state of the semiconductor memory cell is selected from at least first and second states (any memory cell can store at least two states) and said first and second states are stable states. Regarding claims 11 and 17, it would have been obvious to one having ordinary skill in the art to recognize that the memory cell, the memory array and the integrated circuit of claims 11 and 17 and the memory cell, the memory array and the integrated circuit of claims of the patent are identical in structure; therefore, the differences are only functional limitations. Regarding claims 12 and 18, it would have been obvious to one having ordinary skill in the art to recognize that claim 12 of the patent recites said floating body region and said first, second and third regions are provided in a fin structure. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HUAN HOANG whose telephone number is (571)272-1779. The examiner can normally be reached 7:30AM-4:00PM M-F. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, AMIR ZARABIAN can be reached at 571-272-1852. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HUAN HOANG/Primary Examiner, Art Unit 2827
Read full office action

Prosecution Timeline

Nov 05, 2024
Application Filed
Jul 09, 2026
Non-Final Rejection mailed — §112, §DP (current)

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Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
99%
With Interview (+5.6%)
1y 8m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1224 resolved cases by this examiner. Grant probability derived from career allowance rate.

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