Prosecution Insights
Last updated: October 02, 2026
Application No. 19/018,304

LENS ELEMENT FOR A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS DESIGNED FOR OPERATION IN THE DUV, AND METHOD AND ARRANGEMENT FOR FORMING AN ANTIREFLECTION LAYER

Non-Final OA §103
Filed
Jan 13, 2025
Priority
Jul 11, 2022 — DE 10 2022 207 068.2 +1 more
Examiner
WHITESELL, STEVEN H
Art Unit
Tech Center
Assignee
Carl Zeiss SMT GmbH
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
11m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
799 granted / 975 resolved
+21.9% vs TC avg
Moderate +13% lift
Without
With
+12.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
41 currently pending
Career history
1016
Total Applications
across all art units

Statute-Specific Performance

§101
3.2%
-36.8% vs TC avg
§103
50.4%
+10.4% vs TC avg
§102
27.5%
-12.5% vs TC avg
§112
13.5%
-26.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 975 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Group II in the reply filed on September 1, 2026 is acknowledged. Claims 1-3 and 10-12 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected Groups I and III, there being no allowable generic or linking claim. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 4-7 are rejected under 35 U.S.C. 103 as being unpatentable over Lill [DE 102005017742 A1] in view of Suzuki [JP 5058783]. For claim 4, Lill teaches a method for forming an antireflection layer (a multilayer antireflective coating 14, see the figure) on a lens element for a microlithographic projection exposure apparatus designed for operation in a Deep Ultraviolet (DUV) wavelength range (optical components for shortest UV wavelengths of 248 nm, 193 nm or 157 nm or less, see page 5), the method comprising: providing a lens element substrate (glass lens 13, see the figure); and forming the antireflective layer (14) on the lens substrate from a first material of relatively lower refractive index and at least one second material of relatively higher refractive index (multilayer dielectric systems as a high refractive or low refractive index component, see page 5). Lill fails to explicitly teach a mixing ratio between the first material and the second material is varied in a lateral direction and/or in a vertical direction, and wherein the antireflection layer is formed using separate evaporation sources for the first and second materials, wherein the material from these evaporation sources is respectively supplied via an intermittently open shutter. Suzuki teaches a method for forming an antireflection layer on a lens element, the method comprising: providing a lens element substrate (substrate 41 in chamber 71, see Figs. 2-4 and 8 and page 6 of the translation); and forming the antireflective layer (43) on the lens substrate from a first material of relatively lower refractive index and at least one second material of relatively higher refractive index (layer stack, see Figs. 2-4), wherein a mixing ratio (mixing ratio, see pages 5-7) between the first material and the second material is varied in a lateral direction and/or in a vertical direction (layer stack), and wherein the antireflection layer is formed using separate evaporation sources for the first and second materials (72 and 73), wherein the material from these evaporation sources is respectively supplied via an intermittently open shutter (deposition rate adjusted by shutters 74 and 75). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of the claimed invention to provide the multilayer formation using shutter and multiple sources as taught by Suzuki in the evaporative deposition as taught by Lill in order to more quickly apply the antireflective coating at different desired film thicknesses. For claim 5, Lill teaches the lens element comprises at least one curved lens element surface (curved lens surfaces, see page 6 and the figure). For claim 6, in the combination, Suzuki teaches the evaporation sources are operated at a constant evaporation rate, wherein the variation of the mixing ratio is achieved by a targeted setting of respective opening durations of the shutters respectively assigned to the evaporation sources (predetermined deposition rate, where the shutters adjust the mixing ratio, see page 6). For claim 7, in the combination, Suzuki teaches a simultaneous evaporation from the evaporation sources is carried out, wherein an increase in an evaporation rate of the second material compared to an evaporation rate of the first material is synchronized with a variation of a respective currently coated region of the lens element substrate (variation in the deposition rate is based on the opening and closing of the respective shutters and the gradual increase of one material deposition rate and the decrease of the other materials deposition rate, see page 6). Allowable Subject Matter Claims 8 and 9 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Komiya [JP H11-106901] teaches a plurality of evaporation sources 11,21 and 12, 22 using shielding elements 15, 25 and 16, 26 and blades 31 to provide uniform coating layers from two sources. Yamamoto [JP H11-200022] teaches two sources 11a and 11b that provided a specific distances to provide a desired uniformity. Sudo [JP 2006-089843] teaches in Figs. 1-3 using multiple sources 8 and 9 to provide a plurality of layers to a lens. The previously cited prior art fails to teach the synchronization with the variation of the respective currently coated region of the lens element substrate comprises increasing, in a direction from a central region of the lens element to an edge region of the lens element, the evaporation rate of the second material compared to the evaporation rate of the first material, wherein the variation of the currently coated region of the lens element substrate is implemented by variation of a relative position of an opening aperture located in a shading stop with respect to the lens element. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Okumura [JP 2001-152336], Komiya [JP H10-280132], Harada et al. [US 2004/0159283], Cangemi et al. [US 2009/0141358], and Tomofuji [JP H11-200017] each teach coating a lens surface. Any inquiry concerning this communication or earlier communications from the examiner should be directed to Steven H Whitesell whose telephone number is (571)270-3942. The examiner can normally be reached Mon - Fri 9:00 AM - 5:30 PM (MST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Curt Mayes can be reached at 571-272-1234. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Steven H Whitesell/ Primary Examiner, Art Unit 1759
Read full office action

Prosecution Timeline

Jan 13, 2025
Application Filed
Sep 22, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
95%
With Interview (+12.9%)
2y 7m (~11m remaining)
Median Time to Grant
Low
PTA Risk
Based on 975 resolved cases by this examiner. Grant probability derived from career allowance rate.

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