Prosecution Insights
Prosecution Insights
48 pending office actions • 17 art units • 34 examiners • 0 of 48 (0%) have an AI response strategy ready • 77 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 10 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 10 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 5 (10%) |
| §103 only | 15 (31%) |
| §102 only | 5 (10%) |
| §112 only | 2 (4%) |
| Multi-statute (no §101) | 21 (44%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| WHITESELL, STEVEN H | 8 | 81.9% | +12.9% |
| RIDDLE, CHRISTINA A | 4 | 80.8% | +13.8% |
| ASFAW, MESFIN T | 3 | 82.8% | +14.0% |
| NGUYEN, HUNG | 2 | 90.8% | +8.9% |
| MCCORMACK, JASON L | 2 | 84.6% | +7.9% |
| PERSAUD, DEORAM | 1 | 76.8% | +11.8% |
| NGUYEN, SANG H | 1 | 88.6% | +11.8% |
| AYUB, HINA F | 1 | 84.7% | +17.6% |
| DUDEK, JAMES A | 1 | 82.1% | +3.1% |
| BAGHDASARYAN, HOVHANNES | 1 | 77.6% | +16.7% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18775344 | METHOD FOR DETERMINING A LOCATION OF AN OBJECT SURFACE | ASFAW, MESFIN T | 32d overdue |
| 18503693 | HEATING ARRANGEMENT AND METHOD FOR HEATING AN OPTICAL ELEMENT | WHITESELL, STEVEN H | 8d overdue |
| 18895292 | DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS | WHITESELL, STEVEN H | 5d overdue |
| 18362630 | METHOD FOR PRODUCING A MULTI-PART MIRROR OF A PROJECTION ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY | WHITESELL, STEVEN H | 29d |
| 19082444 | METHOD FOR OPERATING A PROJECTION EXPOSURE SYSTEM | WHITESELL, STEVEN H | — |
| 19076000 | HOLDING DEVICE FOR AN OPTICAL COMPONENT HAVING AN OPTICAL SURFACE WITH A POLYGONAL BORDER AND HAVING A CYLINDRICAL SUBSTRATE BODY | RIDDLE, CHRISTINA A | — |
| 19073220 | MICROELECTROMECHANICAL DEVICE | WHITESELL, STEVEN H | — |
| 19034100 | OPTICAL SYSTEM, LITHOGRAPHY MACHINE HAVING AN OPTICAL SYSTEM, AND METHOD FOR PRODUCING AN OPTICAL SYSTEM | ASFAW, MESFIN T | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18319617 | METHOD FOR PRODUCING A MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY, AND MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY | CARRUTH, JENNIFER DOAK | 58d overdue |
| 18367208 | Mesh Integrity Check | CARLSON, JOSHUA MICHAEL | 23d overdue |
| 18456304 | GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM | CHOI, JAMES J | 16d overdue |
| 18899247 | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY INSTALLATION AND METHOD | WHITESELL, STEVEN H | 16d |
| 18419940 | APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD | MCCORMACK, JASON L | 20d |
| 19011435 | MIRROR FOR A PROJECTION EXPOSURE APPARATUS | RIDDLE, CHRISTINA A | — |
| 19000922 | MEASURING ASSEMBLY FOR DETECTING A DISTANCE BETWEEN TWO ELEMENTS, DISTANCE MEASURING DEVICE, OPTICAL MEASURING SYSTEM AND METHOD | NGUYEN, SANG H | — |
| 18999071 | EUV COLLECTOR FOR AN EUV PROJECTION EXPOSURE APPARATUS | NGUYEN, HUNG | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18775344 | METHOD FOR DETERMINING A LOCATION OF AN OBJECT SURFACE | ASFAW, MESFIN T | 32d overdue |
| 18503693 | HEATING ARRANGEMENT AND METHOD FOR HEATING AN OPTICAL ELEMENT | WHITESELL, STEVEN H | 8d overdue |
| 18895292 | DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS | WHITESELL, STEVEN H | 5d overdue |
| 18899247 | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY INSTALLATION AND METHOD | WHITESELL, STEVEN H | 16d |
| 18362630 | METHOD FOR PRODUCING A MULTI-PART MIRROR OF A PROJECTION ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY | WHITESELL, STEVEN H | 29d |
| 19082444 | METHOD FOR OPERATING A PROJECTION EXPOSURE SYSTEM | WHITESELL, STEVEN H | — |
| 19076000 | HOLDING DEVICE FOR AN OPTICAL COMPONENT HAVING AN OPTICAL SURFACE WITH A POLYGONAL BORDER AND HAVING A CYLINDRICAL SUBSTRATE BODY | RIDDLE, CHRISTINA A | — |
| 19073220 | MICROELECTROMECHANICAL DEVICE | WHITESELL, STEVEN H | — |
| Art Unit | Apps |
|---|---|
| 1759 | 6 |
| 2881 | 5 |
| 2882 | 3 |
| 2871 | 3 |
| 2877 | 2 |
| 1713 | 1 |
| 2674 | 1 |
| 2858 | 1 |
| 2857 | 1 |
| 2878 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19082444 | METHOD FOR OPERATING A PROJECTION EXPOSURE SYSTEM | WHITESELL, STEVEN H | — | §103 | Non-Final OA | — | Pending | Mar 18, 2025 |
| 19076000 | HOLDING DEVICE FOR AN OPTICAL COMPONENT HAVING AN OPTICAL SURFACE WITH A POLYGONAL BORDER AND HAVING A CYLINDRICAL SUBSTRATE BODY | RIDDLE, CHRISTINA A | — | §102 | Non-Final OA | — | Pending | Mar 11, 2025 |
| 19073220 | MICROELECTROMECHANICAL DEVICE | WHITESELL, STEVEN H | — | §103 | Non-Final OA | — | Pending | Mar 07, 2025 |
| 19046226 | DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS | PERSAUD, DEORAM | — | §103 | Non-Final OA | — | Pending | Feb 05, 2025 |
| 19034100 | OPTICAL SYSTEM, LITHOGRAPHY MACHINE HAVING AN OPTICAL SYSTEM, AND METHOD FOR PRODUCING AN OPTICAL SYSTEM | ASFAW, MESFIN T | — | §103 | Non-Final OA | — | Pending | Jan 22, 2025 |
| 19017878 | FACET MIRROR ASSEMBLY | ASFAW, MESFIN T | — | §102 | Non-Final OA | — | Pending | Jan 13, 2025 |
| 19012047 | PROJECTION EXPOSURE APPARATUS FOR SEMICONDUCTOR LITHOGRAPHY | NGUYEN, HUNG | — | §103 | Non-Final OA | — | Pending | Jan 07, 2025 |
| 19011435 | MIRROR FOR A PROJECTION EXPOSURE APPARATUS | RIDDLE, CHRISTINA A | — | §103§112 | Non-Final OA | — | Pending | Jan 06, 2025 |
| 19000922 | MEASURING ASSEMBLY FOR DETECTING A DISTANCE BETWEEN TWO ELEMENTS, DISTANCE MEASURING DEVICE, OPTICAL MEASURING SYSTEM AND METHOD | NGUYEN, SANG H | — | §102§103 | Non-Final OA | — | Pending | Dec 24, 2024 |
| 18999071 | EUV COLLECTOR FOR AN EUV PROJECTION EXPOSURE APPARATUS | NGUYEN, HUNG | — | §103§112 | Non-Final OA | — | Pending | Dec 23, 2024 |
| 18988581 | IMAGING EUV OPTICAL UNIT FOR IMAGING AN OBJECT FIELD INTO AN IMAGE FIELD | RIDDLE, CHRISTINA A | — | §102§103§112 | Non-Final OA | — | Pending | Dec 19, 2024 |
| 18935796 | METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING LIGHT REFLECTIVITY AND AN EFFECT OF A POLARIZATION OF MEASURING LIGHT ON A MEASURING LIGHT IMPINGEMENT ON A LITHOGRAPHY MASK | AYUB, HINA F | 2877 | §112 | Final Rejection | — | Pending | Nov 04, 2024 |
| 18903521 | REFLECTIVE OPTICAL ELEMENT FOR A WAVELENGTH IN THE EXTREME ULTRAVIOLET WAVELENGTH RANGE | DUDEK, JAMES A | — | §102 | Non-Final OA | — | Pending | Oct 01, 2024 |
| 18901513 | DEVICE AND METHOD FOR ALIGNING TWO COMPONENTS | WHITESELL, STEVEN H | 1759 | §102§103§112 | Non-Final OA | — | Pending | Sep 30, 2024 |
| 18899247 | CONTROL DEVICE, OPTICAL SYSTEM, LITHOGRAPHY INSTALLATION AND METHOD | WHITESELL, STEVEN H | 1759 | §101§103§112 | Non-Final OA | 16d | Pending | Sep 27, 2024 |
| 18895292 | DRIVE DEVICE, OPTICAL SYSTEM AND LITHOGRAPHY APPARATUS | WHITESELL, STEVEN H | 1759 | §112 | Final Rejection | 5d overdue | Pending | Sep 24, 2024 |
| 18829619 | OPTICAL DEVICE, METHOD FOR MEASURING AN ACTUAL TILT OF AN OPTICAL SURFACE OF AN OPTICAL ELEMENT, AND LITHOGRAPHY SYSTEM | BAGHDASARYAN, HOVHANNES | — | §103 | Non-Final OA | — | Pending | Sep 10, 2024 |
| 18807439 | METHOD FOR MACHINING A WORKPIECE | GATES, BRADFORD M | 1713 | §102§103§112 | Non-Final OA | — | Pending | Aug 16, 2024 |
| 18802115 | COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN IMAGING DATASETS OF A PORTION OF AN OBJECT COMPRISING INTEGRATED CIRCUIT PATTERNS AND CORRESPONDING COMPUTER-READABLE MEDIUM, COMPUTER PROGRAM AND SYSTEM | ROBERTS, RACHEL L | 2674 | §101§102§103§112 | Non-Final OA | — | Pending | Aug 13, 2024 |
| 18795411 | METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD | KIM, ROBERT H | — | §102§103 | Non-Final OA | — | Pending | Aug 06, 2024 |
| 18792766 | METHOD FOR IMAGE ENHANCEMENT IN AN IMAGING DATASET OF AN OBJECT COMPRISING INTEGRATED CIRCUIT PATTERNS AND CORRESPONDING COMPUTER PROGRAM, COMPUTER-READABLE MEDIUM AND SYSTEM | THOMAS, SOUMYA | — | §101§103 | Non-Final OA | — | Pending | Aug 02, 2024 |
| 18792737 | COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN OBJECT COMPRISING INTEGRATED CIRCUIT PATTERNS AND CORRESPONDING COMPUTER-READABLE MEDIUM, COMPUTER PROGRAM AND SYSTEM | PHAM, ANNIE | — | §101§102§103§112 | Non-Final OA | — | Pending | Aug 02, 2024 |
| 18775344 | METHOD FOR DETERMINING A LOCATION OF AN OBJECT SURFACE | ASFAW, MESFIN T | 2882 | §102 | Final Rejection | 32d overdue | Pending | Jul 17, 2024 |
| 18741925 | METHOD AND APPARATUS FOR PRODUCING AT LEAST ONE HOLLOW STRUCTURE, MIRROR, EUV LITHOGRAPHY SYSTEM, FLUID FEED APPARATUS AND METHOD FOR FEEDING A FLUID | KIM, PETER B | 2882 | §102§103 | Non-Final OA | — | Pending | Jun 13, 2024 |
| 18674144 | COMPENSATION RASTER SCANNING | MCCORMACK, JASON L | — | §102§103§112 | Non-Final OA | — | Pending | May 24, 2024 |
| 18666211 | METHOD, OPTICAL SYSTEM, TEST DEVICE AND ARRANGEMENT | MILLER, DANIEL R | 2858 | §102§103 | Final Rejection | — | Pending | May 16, 2024 |
| 18661793 | ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN | EINHORN, MICA JILLIAN | 2881 | §102§103§112 | Non-Final OA | — | Pending | May 13, 2024 |
| 18638890 | MEASURING DEVICE AND METHOD FOR INSPECTING PHOTOMASKS INTENDED FOR EUV MICROLITHOGRAPHY | WHITESELL, STEVEN H | 1759 | §103 | Non-Final OA | — | Pending | Apr 18, 2024 |
| 18639028 | MEASUREMENT APPARATUS AND METHOD FOR INSPECTING PHOTOMASKS INTENDED FOR EUV MICROLITHOGRAPHY | WANG, JING | 2881 | §103 | Final Rejection | — | Pending | Apr 18, 2024 |
| 18612175 | OPTICAL COMPONENT GROUP, IN PARTICULAR FOR USE IN AN ILLUMINATION DEVICE OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS | MERLIN, JESSICA M | 2871 | §103 | Non-Final OA | — | Pending | Mar 21, 2024 |
| 18612515 | APPARATUS AND METHOD FOR ANALYZING AN ELEMENT OF A PHOTOLITHOGRAPHY PROCESS WITH THE AID OF A TRANSFORMATION MODEL | DINH, LYNDA | 2857 | §101§103§112 | Non-Final OA | — | Pending | Mar 21, 2024 |
| 18419940 | APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD | MCCORMACK, JASON L | 2881 | §102§103 | Final Rejection | 20d | Pending | Jan 23, 2024 |
| 18503693 | HEATING ARRANGEMENT AND METHOD FOR HEATING AN OPTICAL ELEMENT | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 8d overdue | Pending | Nov 07, 2023 |
| 18480263 | ACTUATOR-SENSOR DEVICE AND LITHOGRAPHY APPARATUS | RIDDLE, CHRISTINA A | 2882 | §102§103 | Non-Final OA | — | Pending | Oct 03, 2023 |
| 18367208 | Mesh Integrity Check | CARLSON, JOSHUA MICHAEL | 2877 | §103§112 | Non-Final OA | 23d overdue | Pending | Sep 12, 2023 |
| 18456304 | GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM | CHOI, JAMES J | 2878 | §102§103§112 | Non-Final OA | 16d overdue | Pending | Aug 25, 2023 |
| 18456309 | ION BEAM INSPECTION AND REPAIR WITH INCREASED SECONDARY ELECTRON YIELD | GHYKA, ALEXANDER G | 2812 | §103§112 | Non-Final OA | — | Pending | Aug 25, 2023 |
| 18362630 | METHOD FOR PRODUCING A MULTI-PART MIRROR OF A PROJECTION ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 29d | Pending | Jul 31, 2023 |
| 18350522 | OPTICAL ELEMENT FOR REFLECTING RADIATION, AND OPTICAL ASSEMBLY | GASSEN, CHRISTOPHER J | 2881 | §103 | Non-Final OA | 12d | Pending | Jul 11, 2023 |
| 18319617 | METHOD FOR PRODUCING A MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY, AND MAIN BODY OF AN OPTICAL ELEMENT FOR SEMICONDUCTOR LITHOGRAPHY | CARRUTH, JENNIFER DOAK | 2871 | §102§103 | Non-Final OA | 58d overdue | Pending | May 18, 2023 |
| 18124171 | METHOD AND APPARATUS FOR MASK REPAIR | ANGEBRANNDT, MARTIN J | 1737 | §102§103 | Non-Final OA | — | Pending | Mar 21, 2023 |
| 18098215 | METHOD AND DEVICE FOR DETERMINING AN ALIGNMENT OF A PHOTOMASK ON A SAMPLE STAGE WHICH IS DISPLACEABLE ALONG AT LEAST ONE AXIS AND ROTATABLE ABOUT AT LEAST ONE AXIS | OSENBAUGH-STEWART, ELIZA W | 2881 | §103§112 | Non-Final OA | — | Pending | Jan 18, 2023 |
| 18090067 | OPTICAL ELEMENT FOR THE VUV WAVELENGTH RANGE, OPTICAL ARRANGEMENT, AND METHOD FOR MANUFACTURING AN OPTICAL ELEMENT | AHVAZI, BIJAN | 1763 | §103 | Non-Final OA | — | Pending | Dec 28, 2022 |
| 17981798 | METHOD FOR PRODUCING REFLECTIVE OPTICAL ELEMENTS FOR THE EUV WAVELENGTH RANGE, AND REFLECTIVE OPTICAL ELEMENTS FOR THE EUV WAVELENGTH RANGE | DILLON, DANIEL P | 1783 | §103 | Final Rejection | — | Pending | Nov 07, 2022 |
| 17836367 | OPTICAL ELEMENT HAVING A PROTECTIVE COATING, METHOD FOR THE PRODUCTION THEREOF AND OPTICAL ARRANGEMENT | MEDICH, ANGELA MARGOT | 2871 | §103§112 | Final Rejection | — | Pending | Jun 09, 2022 |
| 17742733 | METHOD FOR DETERMINING A REGISTRATION ERROR | RODGERS, ALEXANDER JOHN | 2661 | §102Other | Non-Final OA | — | Pending | May 12, 2022 |
| 17685432 | MIRROR ASSEMBLY HAVING A HYDROGEN BARRIER AND OPTICAL ASSEMBLY | PASKO, NICHOLAS R | 2896 | §103§112 | Final Rejection | — | Pending | Mar 03, 2022 |
| 17540976 | CROSS SECTION IMAGING WITH IMPROVED 3D VOLUME IMAGE RECONSTRUCTION ACCURACY | PARK, CHAN S | 2669 | §103 | Non-Final OA | — | Pending | Dec 02, 2021 |
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