Technology area: Semiconductors, Circuits & Optics
13 pending office actions • 11 art units • 13 examiners • 0 of 13 (0%) have an AI response strategy ready • 15 patents granted in the last 365 days
Onto Innovation Inc. has 13 pending office actions in Semiconductors, Circuits & Optics. The matters are assigned to 13 examiners across 11 art units, showing broad distribution with some repeated art-unit coverage.
KIDWELL, KAITLYN ELIZABETH is the busiest examiner, with 1 pending matter. No examiner has a larger allocation in the supplied data, so portfolio management should emphasize consistent technical framing and application-specific response development.
Based on the USPTO statutory response window for each pending office action. 2 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 2 (15%) |
| §103 only | 7 (54%) |
| Multi-statute (no §101) | 4 (31%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| KIDWELL, KAITLYN ELIZABETH | 1 | 76.5% | +22.6% |
| ASFAW, MESFIN T | 1 | 83.1% | +13.9% |
| GEISEL, KARA E | 1 | 75.2% | +18.2% |
| GRAVES, TIMOTHY P | 1 | 81.1% | +15.2% |
| FABIAN JR, ROBERTO | 1 | 71.0% | +28.5% |
| LEE, ERIC D | 1 | 81.5% | +19.3% |
| BESLER, CHRISTOPHER JAMES | 1 | 68.6% | +41.0% |
| HALL, ELIZABETH MARY CAMPBEL | 1 | 69.0% | +8.3% |
| DAVIS, CYNTHIA L | 1 | 71.4% | +30.2% |
| MARINI, MATTHEW G | 1 | 60.6% | +21.9% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19042393 | FIDUCIAL PATTERN ALIGNMENT TECHNIQUES | ASFAW, MESFIN T | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 46d |
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | — |
| 18851340 | SYSTEM AND METHOD FOR PERFORMING CHARACTERIZATION OF A SAMPLE USING MULTI-WAVELENGTH LASER ACOUSTICS | GRAVES, TIMOTHY P | — |
| 18574554 | PERFORMANCE MANAGEMENT OF SEMICONDUCTOR SUBSTRATE TOOLS | LEE, ERIC D | — |
| 18466932 | Parameter Aggregation and Normalization for Manufacturing Tools | DAVIS, CYNTHIA L | — |
| 18358495 | LOG FILE AGGREGATOR AND DATA VISUALIZATION FOR SEMICONDUCTOR CONTROL SYSTEMS | MARINI, MATTHEW G | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 46d |
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | — |
| 19042393 | FIDUCIAL PATTERN ALIGNMENT TECHNIQUES | ASFAW, MESFIN T | — |
| 18954038 | SURFACE INSPECTION USING LASER TRIANGULATION | GEISEL, KARA E | — |
| 18851340 | SYSTEM AND METHOD FOR PERFORMING CHARACTERIZATION OF A SAMPLE USING MULTI-WAVELENGTH LASER ACOUSTICS | GRAVES, TIMOTHY P | — |
| 18784611 | TRANSIENT ELLIPSOMETRY WITH ASYNCHRONOUS OPTICAL SAMPLING | FABIAN JR, ROBERTO | — |
| 18574554 | PERFORMANCE MANAGEMENT OF SEMICONDUCTOR SUBSTRATE TOOLS | LEE, ERIC D | — |
| 18466932 | Parameter Aggregation and Normalization for Manufacturing Tools | DAVIS, CYNTHIA L | — |
| Art Unit | Apps |
|---|---|
| 2877 | 3 |
| 2882 | 1 |
| 2855 | 1 |
| 2851 | 1 |
| 3726 | 1 |
| 2872 | 1 |
| 2857 | 1 |
| 2853 | 1 |
| 2188 | 1 |
| 2671 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19071685 | VARIABLE WAVELENGTH INTERFEROMETRY | KIDWELL, KAITLYN ELIZABETH | 2877 | §103§112 | Non-Final OA | — | Pending | Mar 05, 2025 |
| 19042393 | FIDUCIAL PATTERN ALIGNMENT TECHNIQUES | ASFAW, MESFIN T | 2882 | §103 | Non-Final OA | — | Pending | Jan 31, 2025 |
| 18954038 | SURFACE INSPECTION USING LASER TRIANGULATION | GEISEL, KARA E | 2877 | §103 | Final Rejection | — | Pending | Nov 20, 2024 |
| 18851340 | SYSTEM AND METHOD FOR PERFORMING CHARACTERIZATION OF A SAMPLE USING MULTI-WAVELENGTH LASER ACOUSTICS | GRAVES, TIMOTHY P | 2855 | §102§103 | Non-Final OA | — | Pending | Sep 26, 2024 |
| 18784611 | TRANSIENT ELLIPSOMETRY WITH ASYNCHRONOUS OPTICAL SAMPLING | FABIAN JR, ROBERTO | 2877 | §103 | Final Rejection | — | Pending | Jul 25, 2024 |
| 18574554 | PERFORMANCE MANAGEMENT OF SEMICONDUCTOR SUBSTRATE TOOLS | LEE, ERIC D | 2851 | §102§103 | Non-Final OA | — | Pending | Dec 27, 2023 |
| 18522038 | STAGE ACTUATOR PARTICLE SHIELD | BESLER, CHRISTOPHER JAMES | 3726 | §102§103 | Final Rejection | 46d | Pending | Nov 28, 2023 |
| 18475684 | BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION | HALL, ELIZABETH MARY CAMPBEL | 2872 | §103 | Non-Final OA | — | Pending | Sep 27, 2023 |
| 18466932 | Parameter Aggregation and Normalization for Manufacturing Tools | DAVIS, CYNTHIA L | 2857 | §101§102§103 | Non-Final OA | — | Pending | Sep 14, 2023 |
| 18358495 | LOG FILE AGGREGATOR AND DATA VISUALIZATION FOR SEMICONDUCTOR CONTROL SYSTEMS | MARINI, MATTHEW G | 2853 | §101§103 | Final Rejection | — | Pending | Jul 25, 2023 |
| 18339973 | MULTIPLE SOURCES OF SIGNALS FOR HYBRID METROLOGY USING PHYSICAL MODELING AND MACHINE LEARNING | COTHRAN, BERNARD E | 2188 | §103 | Non-Final OA | — | Pending | Jun 22, 2023 |
| 18170792 | DEFECT DETECTION IN MANUFACTURED ARTICLES USING MULTI-CHANNEL IMAGES | FELIX, BRADLEY OBAS | 2671 | §103 | Non-Final OA | 23d overdue | Pending | Feb 17, 2023 |
| 18062112 | DYNAMIC MODELING FOR SEMICONDUCTOR SUBSTRATE DEFECT DETECTION | DULANEY, KATHLEEN YUAN | 2666 | §103 | Final Rejection | — | Pending | Dec 06, 2022 |
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Start Free TrialOnto Innovation Inc. has 13 pending office actions as of October 2026, spread across 11 art units and 13 examiners.
Kaitlyn Elizabeth Kidwell has the most, with 1 of Onto Innovation Inc.'s pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.