Technology areas: Semiconductors, Circuits & Optics • Medical Devices & Mechanical Engineering
13 pending office actions • 6 art units • 13 examiners • 0 of 13 (0%) have an AI response strategy ready • 14 patents granted in the last 365 days
Tokyo Seimitsu Co., Ltd. has 13 pending office actions in Semiconductors, Circuits & Optics. The matters involve 13 distinct examiners and 6 distinct art units, showing complete examiner dispersion alongside repeated placement within a limited set of technical units.
XING, CHRISTINA ILONA is the busiest examiner, with 1 pending matter. Examiner-specific coordination is not a major concentration point. Counsel may obtain more value from comparing claim treatment across the repeated art-unit assignments and maintaining consistent technical definitions across the portfolio.
Based on the USPTO statutory response window for each pending office action. 4 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 4 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §103 only | 7 (54%) |
| Multi-statute (no §101) | 6 (46%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| XING, CHRISTINA ILONA | 1 | 83.0% | +10.9% |
| RIZVI, AKBAR HASSAN | 1 | 88.1% | +14.9% |
| RHODES-VIVOUR, TEMILADE S | 1 | 88.7% | +7.6% |
| NGUYEN, KEMAYA DEANN HUU | 1 | 74.4% | +38.1% |
| CHILTON, CLARA GRACE | 1 | 52.5% | +11.7% |
| RAMOS, NICOLE N | 1 | 81.5% | +9.9% |
| ROYCE, LIAM A | 1 | 65.5% | +21.9% |
| KERR, ELIZABETH M | 1 | 64.8% | +27.9% |
| NIELSEN, DEREK LANG | 1 | 70.1% | +40.0% |
| NEIBAUR, ROBERT F | 1 | 77.0% | +31.3% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19210729 | MACHINING DEVICE | RIZVI, AKBAR HASSAN | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 6 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18140452 | LASER MACHINING APPARATUS AND LASER MACHINING METHOD | NORTON, JOHN J | 3d overdue |
| 18404748 | DICING GROOVE INSPECTING METHOD AND DICING METHOD | NIELSEN, DEREK LANG | 63d |
| 19233613 | INSPECTION DEVICE AND INSPECTION METHOD | XING, CHRISTINA ILONA | — |
| 19091543 | WAFER INSPECTION APPARATUS, CHUCK POSITION MEASUREMENT METHOD, AND TARGET | RHODES-VIVOUR, TEMILADE S | — |
| 17642189 | FLY-CUT APPARATUS | RAMOS, NICOLE N | — |
| 18406628 | LASER PROCESSING DEVICE AND LASER PROCESSING METHOD | KERR, ELIZABETH M | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18894717 | SURFACE SHAPE MEASUREMENT DEVICE AND SURFACE SHAPE MEASUREMENT METHOD | NGUYEN, KEMAYA DEANN HUU | 20d |
| 18404748 | DICING GROOVE INSPECTING METHOD AND DICING METHOD | NIELSEN, DEREK LANG | 63d |
| 19233613 | INSPECTION DEVICE AND INSPECTION METHOD | XING, CHRISTINA ILONA | — |
| 19210729 | MACHINING DEVICE | RIZVI, AKBAR HASSAN | — |
| 18827141 | SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD | CHILTON, CLARA GRACE | — |
| 18607514 | PROCESSING DISCHARGE LIQUID FILTRATION DEVICE | ROYCE, LIAM A | — |
| 18406628 | LASER PROCESSING DEVICE AND LASER PROCESSING METHOD | KERR, ELIZABETH M | — |
| 18281941 | PROCESSING APPARATUS | NEIBAUR, ROBERT F | — |
| Art Unit | Apps |
|---|---|
| 2877 | 3 |
| 3761 | 3 |
| 3723 | 2 |
| 2858 | 1 |
| 3645 | 1 |
| 2899 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19233613 | INSPECTION DEVICE AND INSPECTION METHOD | XING, CHRISTINA ILONA | 2877 | §102§103 | Non-Final OA | — | Pending | Jun 10, 2025 |
| 19210729 | MACHINING DEVICE | RIZVI, AKBAR HASSAN | 2877 | §103 | Non-Final OA | — | Pending | May 16, 2025 |
| 19091543 | WAFER INSPECTION APPARATUS, CHUCK POSITION MEASUREMENT METHOD, AND TARGET | RHODES-VIVOUR, TEMILADE S | 2858 | §102§103 | Non-Final OA | — | Pending | Mar 26, 2025 |
| 18894717 | SURFACE SHAPE MEASUREMENT DEVICE AND SURFACE SHAPE MEASUREMENT METHOD | NGUYEN, KEMAYA DEANN HUU | 2877 | §103 | Final Rejection | 20d | Pending | Sep 24, 2024 |
| 18827141 | SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD | CHILTON, CLARA GRACE | 3645 | §103 | Non-Final OA | — | Pending | Sep 06, 2024 |
| 17642189 | FLY-CUT APPARATUS | RAMOS, NICOLE N | — | §102§112 | Final Rejection | — | Pending | May 21, 2024 |
| 18607514 | PROCESSING DISCHARGE LIQUID FILTRATION DEVICE | ROYCE, LIAM A | — | §103 | Final Rejection | — | Pending | Mar 17, 2024 |
| 18406628 | LASER PROCESSING DEVICE AND LASER PROCESSING METHOD | KERR, ELIZABETH M | 3761 | §102§103 | Non-Final OA | — | Pending | Jan 08, 2024 |
| 18404748 | DICING GROOVE INSPECTING METHOD AND DICING METHOD | NIELSEN, DEREK LANG | 2899 | §103§112 | Final Rejection | 63d | Pending | Jan 04, 2024 |
| 18281941 | PROCESSING APPARATUS | NEIBAUR, ROBERT F | 3723 | §103 | Non-Final OA | — | Pending | Sep 13, 2023 |
| 18140452 | LASER MACHINING APPARATUS AND LASER MACHINING METHOD | NORTON, JOHN J | 3761 | §102§103§112 | Final Rejection | 3d overdue | Pending | Apr 27, 2023 |
| 18047389 | OPTICAL SYSTEM AND LASER MACHINING DEVICE | FERDOUSI, FAHMIDA NMN | 3761 | §103 | Final Rejection | — | Pending | Oct 18, 2022 |
| 17902995 | PROCESSING DEVICE | SOTO, CHRISTOPHER ASHLEY | 3723 | §103 | Final Rejection | 16d | Pending | Sep 05, 2022 |
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Start Free TrialTokyo Seimitsu Co., Ltd. has 13 pending office actions as of October 2026, spread across 6 art units and 13 examiners.
Christina Ilona Xing has the most, with 1 of Tokyo Seimitsu Co., Ltd.'s pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.
