Tech Center 3700 • Art Units: 1718 2800 2817 2877 2886 2899 3723
This examiner grants 76% of resolved cases
Mohamed K Amara is assigned to Tech Center 3700 and Art Unit 1718. The examiner has 714 resolved cases, maintaining an allowance rate of 75.8 percent. This 75.8 percent rate indicates a generally positive outlook for patent grants, with a high majority of applications being successful. The median days to allowance is 930, which is an efficient timeframe for this volume of cases.
An interview lift of 29.8 percent demonstrates the value of direct communication with this examiner. This 29.8 percent lift can be a decisive factor in securing an allowance within the 930-day median timeframe. With 714 resolved cases, the examiner's statistics are based on a large sample size, suggesting consistent performance over time. The 75.8 percent allowance rate remains a strong baseline, and the added benefit of an interview makes it a highly recommended strategy for practitioners. The data indicates a predictable and applicant-friendly prosecution environment.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18647240 | DEVICE, METHOD, AND SYSTEM FOR TRANSFORMING MEASUREMENT DATA | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 19091540 | OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION | Non-Final OA | Apple Inc. |
| 19082374 | Laser Interferometer And Spectroscopic Apparatus | Non-Final OA | SEIKO EPSON CORPORATION |
| 18122759 | SPECTROSCOPE AND ANALYSIS SYSTEM | Final Rejection | RICOH COMPANY, LTD. |
| 17578858 | INTERFEROMETER OPTIC MATERIAL AND RELATED METHODS | Non-Final OA | GEORGIA TECH RESEARCH CORPORATION |
| 18026059 | SURFACE-ENHANCED RAMAN SCATTERING AGENT | Final Rejection | DAICEL CORPORATION |
| 19220961 | QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAGE GENERATING DEVICE, AND PROGRAM | Non-Final OA | NIKON CORPORATION |
| 19175014 | SUBSTRATE PROCESSING APPARATUS, MEASURING DEVICE, AND MEASURING METHOD | Non-Final OA | Tokyo Electron Limited |
| 18574020 | ANALYSIS DEVICE AND ANALYSIS METHOD | Non-Final OA | HORIBA, LTD. |
| 18544117 | Non-Contact Dynamic Displacement Measurement of Structures Using a Moving Laser Doppler Vibrometer | Non-Final OA | UNM Rainforest Innovations |
| 18926083 | PHOSPHOR COMPOSITIONS AND LIGHT SOURCES FOR SWIR SPECTROSCOPY | Non-Final OA | LUMILEDS LLC |
| 18706789 | WAVEFRONT MEASUREMENT DEVICE AND WAVEFRONT MEASUREMENT METHOD | Final Rejection | HAMAMATSU PHOTONICS K.K. |
| 18863624 | CONTAMINATION MEASUREMENT | Final Rejection | ASML NETHERLANDS B.V. |
| 18568585 | INSPECTION SYSTEM FOR RETICLE PARTICLE DETECTION USING A STRUCTURAL ILLUMINATION WITH APERTURE APODIZATION | Final Rejection | ASML Netherlands B.V. |
| 19078319 | DEVICE AND METHOD FOR CHARACTERIZING A PARTICLE | Non-Final OA | Q.ant GmbH |
| 18014701 | INTERFEROMETRIC SCATTERING CORRELATION (ISCORR) MICROSCOPY | Non-Final OA | Cambridge Enterprise Limited |
| 18368000 | Device For Monitoring Properties of A Laser Beam | Non-Final OA | II-VI Delaware, Inc. |
| 18611339 | APPARATUS FOR TIME-RESOLVED FLUORESCENCE MEASUREMENT USING BANDWIDTH-LIMITED DIGITAL-PULSE LIGHT MODULATION AND METHODS | Final Rejection | The Board of Regents of the University of Oklahoma |
| 18939115 | AUTOFOCUS FUNCTIONALITY IN OPTICAL SAMPLE ANALYSIS | Non-Final OA | Illumina, Inc. |
| 18983330 | OPTICAL SPECKLE RECEIVER | Non-Final OA | ROCKLEY PHOTONICS LIMITED |
| 18736769 | Relative intensity noise Cat's-eye swept source laser for OCT and spectroscopy | Final Rejection | KineoLabs, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy