Tech Center 2800 • Art Units: 2817 2877 2886
This examiner grants 76% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18544947 | DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING | Final Rejection | Katholieke Universiteit Leuven |
| 17578858 | INTERFEROMETER OPTIC MATERIAL AND RELATED METHODS | Final Rejection | GEORGIA TECH RESEARCH CORPORATION |
| 18813478 | Optical Module, Electronic Device, And Driving Method | Non-Final OA | SEIKO EPSON CORPORATION |
| 18829173 | OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION | Non-Final OA | Apple Inc. |
| 18163766 | HIGH-PRECISION AND HIGH-THROUGHPUT MEASUREMENT OF PERCENTAGE LIGHT LOSS OF OPTICAL DEVICES | Non-Final OA | Applied Materials, Inc. |
| 18844646 | LIGHT SOURCE APPARATUS | Non-Final OA | SCREEN Holdings Co., Ltd. |
| 18014701 | INTERFEROMETRIC SCATTERING CORRELATION (ISCORR) MICROSCOPY | Final Rejection | Cambridge Enterprise Limited |
| 18676822 | Gas Absorption Spectrometer | Non-Final OA | SHIMADZU CORPORATION |
| 18621827 | WAFER BOW METROLOGY SYSTEM | Final Rejection | Tokyo Electron Limited |
| 18706789 | WAVEFRONT MEASUREMENT DEVICE AND WAVEFRONT MEASUREMENT METHOD | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18696856 | MOLECULAR DIFFUSION EVALUATION METHOD AND SYSTEM | Final Rejection | NTT, Inc. |
| 18544117 | Non-Contact Dynamic Displacement Measurement of Structures Using a Moving Laser Doppler Vibrometer | Final Rejection | UNM Rainforest Innovations |
| 18100897 | METHOD FOR OPERATING A MEDICAL MICROSCOPE, AND MEDICAL MICROSCOPE ARRANGEMENT | Non-Final OA | Carl Zeiss Meditec AG |
| 18848095 | ILLUMINATION ARRANGEMENT FOR A METROLOGY DEVICE AND ASSOCIATED METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18611339 | APPARATUS FOR TIME-RESOLVED FLUORESCENCE MEASUREMENT USING BANDWIDTH-LIMITED DIGITAL-PULSE LIGHT MODULATION AND METHODS | Non-Final OA | The Board of Regents of the University of Oklahoma |
| 18419664 | SYSTEMS AND METHODS FOR AUTOMATIC TEST AND TURN-UP OF OPTICAL TRANSPORT SYSTEMS | Non-Final OA | Verizon Patent and Licensing Inc. |
| 18852873 | LASER BASED GAS DETECTOR | Non-Final OA | Wi-Charge Ltd. |
| 18846451 | CALCULATION MODULE FOR DETERMINING A LOCALIZATION, SYSTEM, EYEWEAR AND COMPUTER IMPLEMENTED METHOD | Non-Final OA | Essilor International |
| 18812047 | OPTICAL MEASUREMENT DEVICE | Non-Final OA | The University of Electro-Communications |
| 18368000 | Device For Monitoring Properties of A Laser Beam | Non-Final OA | II-VI Delaware, Inc. |
| 18800488 | HANDHELD DEVICE FOR DETECTING WELD DEFECTS AND A METHOD THEREOF | Non-Final OA | LTI Mindtree Ltd |
| 18799823 | EMISSIONS LOCALIZATION AND QUANTIFICATION USING COMBINED UNMANNED AERIAL SYSTEMS AND CONTINUOUS MONITORING | Non-Final OA | SeekOps Inc. |
| 18737716 | DEVICE MEASURING A PHYSICAL STATE OF A MATERIAL BY SPECTRUM AND A METHOD THEREOF | Non-Final OA | FAIRTECH CORPORATION |
| 18736769 | Relative intensity noise Cat's-eye swept source laser for OCT and spectroscopy | Non-Final OA | KineoLabs, Inc. |
| 18653489 | DEVICE AND METHOD FOR MATERIAL ANALYSIS USING MICROFLUIDICS, MACHINE VISION, AND LASER-INDUCED BREAKDOWN SPECTROSCOPY | Final Rejection | SDT Inc. |
| 18701918 | REFERENCE MASTER ASSEMBLY FOR CHECKING EQUIPMENT AND METHOD FOR SETTING UP THE REFERENCE MASTER ASSEMBLY | Non-Final OA | Marposs Societa' Per Azioni |
| 18583597 | PHOTOLUMINESCENT IMAGING OF SEMICONDUCTOR SAMPLES | Final Rejection | SEMILAB Zrt. |
| 18515456 | RADIUSED SENSORS FOR MEASURING PRESSURE AND TEMPERATURE | Final Rejection | Simmonds Precision Products, Inc. |
| 17380487 | SYSTEM AND METHOD FOR DETERMINING PRESENCE OF CERTAIN ATTRIBUTES IN A TEST ARTICLE | Final Rejection | Niels Akhtari |
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