Prosecution Insights
Last updated: May 29, 2026

Examiner: COSGROVE, JAYSON D

Tech Center 1700 • Art Units: 1737

This examiner grants 50% of resolved cases

Performance Statistics

50.4%
Allow Rate
-14.6% vs TC avg
156
Total Applications
+35.2%
Interview Lift
1368
Avg Prosecution Days
Based on 119 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
4.1%
§102 Novelty
93.4%
§103 Obviousness
1.1%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18273123 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE CURED FILM USING SAME, AND POLYIMIDE CURED FILM Non-Final OA ASAHI KASEI KABUSHIKI KAISHA
17775130 COLORING AGENT COMPOSITION, PHOTOSENSITIVE RESIN COMPOSITION, PHOTORESIST, COLOR FILTER, AND LIQUID CRYSTAL DISPLAY DEVICE Final Rejection LG CHEM, LTD.
18266057 REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Non-Final OA HOYA CORPORATION
17329177 COLORING PHOTOSENSITIVE COMPOSITION, FILM, COLOR FILTER, SOLID-STATE IMAGING ELEMENT, AND IMAGE DISPLAY DEVICE Final Rejection FUJIFILM Corporation
18145038 PRECURSORS AND METHODS FOR PRODUCING BISMUTH-OXY-CARBIDE-BASED PHOTORESIST Non-Final OA Intel Corporation
17679720 OPTICAL ELEMENT FOR REFLECTING EUV RADIATION, EUV LITHOGRAPHY SYSTEM AND METHOD FOR SEALING A GAP Final Rejection Carl Zeiss SMT GmbH
17762497 POSITIVE WORKING PHOTOSENSITIVE MATERIALS Non-Final OA Merck Patent GmbH
18456075 REFLECTIVE MASK BLANK AND METHOD FOR MANUFACTURING REFLECTIVE MASK Non-Final OA Shin-Etsu Chemical Co., Ltd.
18038574 PHOTOSENSITIVE POLYIMIDE RESIN COMPOSITION, RESIN FILM, AND ELECTRONIC DEVICE Final Rejection MITSUBISHI GAS CHEMICAL COMPANY, INC.
17805188 CLEANING COMPOSITION, METHOD OF CLEANING COATING FILM FORMING DEVICE, METHOD OF PRODUCING SUBSTRATE FOR LITHOGRAPHY, AND METHOD OF FORMING RESIST PATTERN Final Rejection TOKYO OHKA KOGYO CO., LTD.
18271556 REFLECTIVE PHOTOMASK BLANK AND REFLECTIVE PHOTOMASK Non-Final OA TEKSCEND PHOTOMASK CORP.
17772340 REFLECTIVE MASK AND PRODUCTION METHOD FOR REFLECTIVE MASK Non-Final OA TEKSCEND PHOTOMASK CORP.
18109589 SYSTEM, METHOD AND PROGRAM PRODUCT FOR IMPROVING ACCURACY OF PHOTOMASK BASED COMPENSATION IN FLAT PANEL DISPLAY LITHOGRAPHY Non-Final OA PHOTRONICS, INC.
17762126 MICRO AND NANO STRUCTURING OF A DIAMOND SUBSTRATE Final Rejection Universität des Saarlandes

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