Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2881
This examiner grants 71% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18575261 | ULTRAVIOLET LIGHT FLUID TREATMENT DEVICE | Final Rejection | Nichia Corporation |
| 18917129 | Liquid cells for the study of electrochemical processes using transmission electron microscopy | Non-Final OA | The Regents of the University of California |
| 18845779 | HYPOCHLORITE ION MEASUREMENT METHOD | Non-Final OA | SHIMADZU CORPORATION |
| 18833824 | MASS SPECTROMETRY DEVICE | Non-Final OA | SHIMADZU CORPORATION |
| 18426363 | STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, STANDARD SAMPLE, SAMPLE SET, QUANTITATIVE ANALYSIS METHOD, AND TRANSFER FILM | Non-Final OA | The University of Tokyo |
| 18287357 | MULTIPLEXED ELECTROSPRAY IONIZATION SOURCES USING ORTHOGONAL INJECTION INTO AN ELECTRODYNAMIC ION FUNNEL | Non-Final OA | Purdue Research Foundation |
| 18859485 | THERMALLY ACTUATED COOLING SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18852333 | OPTICAL CAVITY WITH ONE OR MORE INTRACAVITY LENSES, AND ASSOCIATED METHODS | Non-Final OA | THE UNIVERSITY OF CHICAGO |
| 18670620 | VOLTAGE SUPPLY FOR MASS SPECTROMETER | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18438165 | VUV LASER-SUSTAINED PLASMA LIGHT SOURCE WITH LONG-PASS FILTERING | Non-Final OA | KLA Corporation |
| 18368310 | Transmission Electron Microscope | Non-Final OA | JEOL Ltd. |
| 18473049 | DEUTERIUM GAS GENERATOR AND DEVICES FOR CONSERVATION THEREOF | Non-Final OA | Thermo Finnigan LLC |
| 18694178 | SYSTEMS AND METHODS FOR SIGNAL DECONVOLUTION FOR NON-CONTACT SAMPLE EJECTION | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18685356 | An Improved Ion Guide Bandpass Filter | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18693796 | ION SOURCE ASSEMBLY | Final Rejection | Micromass UK Limited |
| 18288660 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Final Rejection | Nearfield Instruments B.V. |
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