Prosecution Insights
Last updated: October 02, 2026

Examiner: FABIAN JR, ROBERTO

Tech Center 2800 • Art Units: 2800 2811 2877

This examiner grants 72% of resolved cases

Analysis

Roberto Fabian Jr is an examiner in Tech Center 2800, specifically assigned to Art Unit 2800. Across 134 resolved cases, he maintains an allowance rate of 71.6 percent. This rate of approval indicates the environment for applicants seeking patent protection within this specific unit, where applications reach a grant at the frequency indicated by the 71.6 percent allowance rate.

The interview lift of 27.2 percent highlights the impact of examiner interviews during the prosecution process. When an interview is conducted, the likelihood of allowance increases by this 27.2 percent margin. This suggests that verbal advocacy is a tool for resolving outstanding issues in the 134 cases analyzed, offering a path to change the chances of success during prosecution.

Successful applications reach allowance in a median of 908 days. This timeframe offers a benchmark for pendency when navigating prosecution under this examiner's supervision. The 908-day median duration suggests a specific path to grant for applications. Practitioners can use these figures to manage expectations regarding both the outcome and the timing of their filings in Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

71.6%
Allow Rate
+3.6% vs TC avg
179
Total Applications
+27.2%
Interview Lift
908
Avg Prosecution Days
Based on 134 resolved cases, 2023–2026

Rejection Statute Breakdown

2.7%
§101 Eligibility
17.0%
§102 Novelty
70.3%
§103 Obviousness
8.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18774473 SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18752507 Systems and Accessories for Optical Analysis of Samples on Portable Electronic Devices Final Rejection Apple Inc.
18873817 Battery Inspection Device Non-Final OA LG Energy Solution, Ltd.
18543780 ADVANCED CRYSTALLIZATION TESTING APPARATUS FOR PIPELINE APPLICATIONS Final Rejection Saudi Arabian Oil Company
18182581 APPARATUS AND METHOD FOR LOSS MEASUREMENT AND POLARITY DETECTION OF MULTI-FIBER CONNECTORS AND CABLES Non-Final OA AFL Telecommunications LLC
18689525 Raman Photometer for Simultaneous Multi-Component Analysis, Measuring System and Computer Program Product Final Rejection Siemens Aktiengesellschaft
17886053 INSPECTION METHOD FOR PELLICLE MEMBRANE OF LITHOGRAPHY SYSTEM Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
19099047 PHYSICAL QUANTITY MEASUREMENT APPARATUS Non-Final OA Asahi Kasei Microdevices Corporation
18689539 SPECTROMETER AND METHOD OF DETECTING A SPECTRUM Final Rejection NATIONAL UNIVERSITY OF SINGAPORE
18686416 MICROSCOPIC RAMAN DEVICE Non-Final OA SHIMADZU CORPORATION
17940970 METHOD AND APPARATUS FOR MULTI-POINT RAMAN SPECTROSCOPIC ANALYSIS VIA OPTICAL MULTIPLEXING Final Rejection Purdue Research Foundation
17952104 AEROSOL DETECTION SYSTEMS Non-Final OA Hamilton Sundstrand Corporation
18421050 FLUID ANALYSIS USING OPTICAL SYSTEMS Non-Final OA STRATEC SE
19065158 DIAGNOSTIC TESTING METHOD FOR A SPECTROMETER Non-Final OA Thermo Fisher Scientific (Bremen) GmbH
18646553 Spectroscopic Ellipsometry With Detector Resolved Numerical Aperture For Deep Structure Metrology Final Rejection KLA Corporation
18387015 Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction Non-Final OA KLA Corporation
18343390 EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test Photomasks Final Rejection KLA Corporation
18377504 DEVICE MEASURING THE DEFOCUS CURVE OF A MULTIFOCAL INTRAOCULAR LENS Non-Final OA THE CATHOLIC UNIVERSITY OF KOREA INDUSTRY-ACADEMIC COOPERATION FOUNDATION

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