Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2811 2877
This examiner grants 72% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18774473 | SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18487567 | HYPERSPECTRAL COMPRESSIVE IMAGING WITH INTEGRATED PHOTONICS | Non-Final OA | The Regents of the University of California |
| 18543780 | ADVANCED CRYSTALLIZATION TESTING APPARATUS FOR PIPELINE APPLICATIONS | Final Rejection | Saudi Arabian Oil Company |
| 18689525 | Raman Photometer for Simultaneous Multi-Component Analysis, Measuring System and Computer Program Product | Non-Final OA | Siemens Aktiengesellschaft |
| 18886953 | OPTICAL MEASUREMENT SYSTEMS AND METHODS | Non-Final OA | Apple Inc. |
| 18752507 | Systems and Accessories for Optical Analysis of Samples on Portable Electronic Devices | Final Rejection | Apple Inc. |
| 17940970 | METHOD AND APPARATUS FOR MULTI-POINT RAMAN SPECTROSCOPIC ANALYSIS VIA OPTICAL MULTIPLEXING | Non-Final OA | Purdue Research Foundation |
| 18686416 | MICROSCOPIC RAMAN DEVICE | Final Rejection | SHIMADZU CORPORATION |
| 17952104 | AEROSOL DETECTION SYSTEMS | Final Rejection | Hamilton Sundstrand Corporation |
| 18280452 | METHODS AND COMPOSITIONS FOR CALIBRATED LABEL-FREE SURFACE-ENHANCED RAMAN SPECTROSCOPY | Non-Final OA | Virginia Tech Intellectual Properties, Inc. |
| 18689539 | SPECTROMETER AND METHOD OF DETECTING A SPECTRUM | Final Rejection | NATIONAL UNIVERSITY OF SINGAPORE |
| 17886053 | INSPECTION METHOD FOR PELLICLE MEMBRANE OF LITHOGRAPHY SYSTEM | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18571281 | ANALYSIS METHOD AND ANALYSIS DEVICE | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 17958005 | SYSTEM, METHOD, AND COMPUTER-ACCESSIBLE MEDIUM FOR PHENOTYPING OF SINGLE CELLS WITH MULTIPLEXED VIBRATIONAL PROBES | Non-Final OA | The Trustees of Columbia University in the City of New York |
| 18646553 | Spectroscopic Ellipsometry With Detector Resolved Numerical Aperture For Deep Structure Metrology | Final Rejection | KLA Corporation |
| 18387015 | Methods And Systems For Measurement Of Semiconductor Structures With Active Tilt Correction | Non-Final OA | KLA Corporation |
| 18343390 | EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test Photomasks | Final Rejection | KLA Corporation |
| 18377504 | DEVICE MEASURING THE DEFOCUS CURVE OF A MULTIFOCAL INTRAOCULAR LENS | Final Rejection | THE CATHOLIC UNIVERSITY OF KOREA INDUSTRY-ACADEMIC COOPERATION FOUNDATION |
| 18549192 | METHOD AND APPARATUS FOR DETECTION OF RADICAL SPECIES | Final Rejection | Yissum Research Development Company of the Hebrew University of Jerusalem Ltd. |
| 18806648 | ALIGNING A LASER AND A WAVEGUIDE USING A SPECTRAL SIGNATURE | Non-Final OA | DustPhotonics |
| 18560906 | ARC SCANNING METHODS FOR LASER INDUCED BREAKDOWN SPECTROSCOPY APPLICATIONS | Non-Final OA | Thermo Fisher Scientific (Ecublens) SARL |
| 18557497 | MONITORING A MILK MACHINE | Non-Final OA | GEA Farm Technologies GmbH |
| 18421050 | FLUID ANALYSIS USING OPTICAL SYSTEMS | Non-Final OA | STRATEC SE |
| 18634669 | IDENTIFYING SUBSTANCES STORED IN CONTAINERS UTILIZING A PORTABLE RAMAN PROBE | Final Rejection | Wasatch Photonics, Inc. |
| 18619846 | METHOD AND APPARATUS FOR USE IN OPTICAL GAS ABSORPTION MEASUREMENTS | Final Rejection | Servomex Group Limited |
| 18694001 | INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS | Final Rejection | WICKON HIGHTECH GMBH |
| 18684676 | CLEANING SYSTEM FOR PROBE UNIT | Final Rejection | PROANALYSIS AS |
| 18684664 | SYSTEMS, DEVICES AND METHODS FOR CONTROLLING GROWTH OF A PLANT | Non-Final OA | SYMPHONI BIOTECH INC. |
| 18400939 | METHOD AND APPARATUS FOR IMPROVING SENSITIVITY OF VACUUM TESTING OF VACUUM SWITCH | Final Rejection | XI'AN JIAOTONG UNIVERSITY |
| 17431754 | HIGH-SPEED, DENTAL OPTICAL COHERENCE TOMOGRAPHY SYSTEM | Non-Final OA | Dental Imaging Technologies Corporation |
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