Listed by the USPTO as NETTLES, CORALIE ANN
Tech Center 2800 • Art Units: 2893
This examiner grants 60% of resolved cases
NETTLES, CORALIE ANN has resolved 43 cases, with an allowance rate of 60.5% and an interview lift of 31.7%. The median time to allowance is 1247 days. The interview measure is meaningful within the recorded profile, but the case volume is limited enough that counsel should use it as one input rather than a standalone prediction of outcome.
The examiner is assigned to tech center 2800 and art unit 2893. The leading companies are Samsung Electronics Co., Ltd., Sony Group Corporation, and Taiwan Semiconductor Manufacturing Company, Ltd. The leading firms are FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER, FISH & RICHARDSON P.C. (TC), and Robinson Intellectual Property Law Office, P.C. This context points to electronics-focused prosecution experience.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 17912308 | PHOTODIODE AND MANUFACTURING METHOD THEREOF | Non-Final OA | LG ELECTRONICS INC. |
| 18759447 | SEMICONDUCTOR PACKAGE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18739398 | SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18407040 | CAPACITOR AND DEVICE INCLUDING THE SAME | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18509925 | SEMICONDUCTOR DEVICES | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18100216 | IMAGE SENSOR | Final Rejection | Samsung Electronics Co., Ltd. |
| 18422213 | SEMICONDUCTOR DEVICE | Final Rejection | FUJI ELECTRIC CO., LTD. |
| 17704189 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | Final Rejection | FUJI ELECTRIC CO., LTD. |
| 18328351 | PHOTOELECTRIC CONVERSION APPARATUS, METHOD FOR MANUFACTURING PHOTOELECTRIC CONVERSION APPARATUS, DEVICE, AND SUBSTRATE | Final Rejection | CANON KABUSHIKI KAISHA |
| 17932952 | PHOTOELECTRIC CONVERSION APPARATUS | Final Rejection | CANON KABUSHIKI KAISHA |
| 18050989 | DISPLAY APPARATUS | Non-Final OA | LG DISPLAY CO., LTD. |
| 18264784 | IMAGING DEVICE AND METHOD FOR MANUFACTURING THE SAME | Final Rejection | SONY GROUP CORPORATION |
| 18839907 | PHOTOELECTRIC CONVERSION ELEMENT, PHOTODETECTOR, AND ELECTRONIC APPARATUS | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 17626249 | LIGHT RECEIVING ELEMENT AND ELECTRONIC DEVICE | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18458090 | SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SOLID-STATE IMAGING DEVICE | Final Rejection | Toshiba Electronic Devices & Storage Corporation |
| 18217208 | LOW-RESISTANCE VIA STRUCTURES | Final Rejection | Intel Corporation |
| 17811909 | ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF | Final Rejection | InnoLux Corporation |
| 18693649 | POWER SEMICONDUCTOR DEVICE | Non-Final OA | Mitsubishi Electric Corporation |
| 18845920 | SEMICONDUCTOR DEVICE | Non-Final OA | Semiconductor Energy Laboratory Co., Ltd. |
| 18561961 | SEMICONDUCTOR DEVICE | Final Rejection | Semiconductor Energy Laboratory Co., Ltd. |
| 18782477 | BONDED STRUCTURES WITH INTEGRATED PASSIVE COMPONENT | Non-Final OA | ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC. |
| 17690981 | STRUCTURES AND METHODS FOR DICING SEMICONDUCTOR DEVICES | Final Rejection | Micron Technology, Inc. |
| 17766960 | METHOD OF FABRICATING A RESONANT CAVITY AND DISTRIBUTED BRAGG REFLECTOR MIRRORS FOR A VERTICAL CAVITY SURFACE EMITTING LASER ON A WING OF AN EPITAXIAL LATERAL OVERGROWTH REGION | Non-Final OA | The Regents of the University of California |
| 18808257 | SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 17654771 | MARK, TEMPLATE, AND SEMICONDCTOR DEVICE MANUFACTURING METHOD | Non-Final OA | Kioxia Corporation |
| 18491353 | SEMICONDUCTOR DEVICE | Non-Final OA | Murata Manufacturing Co., Ltd. |
| 17793134 | DISPLAY TRANSMISSION OPTIMIZATION | Non-Final OA | ams International AG |
| 18240614 | DUAL PACKAGE SWITCHING POWER DEVICE | Non-Final OA | Texas Instruments Incorporated |
| 18533589 | DOUBLE-SIDED MEMORY DEVICE USING A SHARED TRANSISTOR | Final Rejection | International Business Machines Corporation |
| 17987958 | SEMICONDUCTOR DEVICE | Final Rejection | SK hynix Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy60.5% of resolved applications examined by Coralie Ann Nettles were allowed (43 resolved cases), compared with 79.0% across Art Unit 2893 over the last five years.
This examiner's interview lift is +31.7 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Coralie Ann Nettles took 1,247 days on average from filing to allowance.
Coralie Ann Nettles examines applications in Art Unit 2893 in Tech Center 2800 (Semiconductors, Circuits & Optics).
