Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2881 2896
This examiner grants 73% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18650860 | ION IMPLANTATION APPARATUS AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18483097 | ELECTRIC DEVICE WITH RADIOACTIVE PAINT | Final Rejection | MILWAUKEE ELECTRIC TOOL CORPORATION |
| 18310974 | Construction Of A Target Assembly For A Compact D-D Or D-T Neutron Generator | Non-Final OA | Halliburton Energy Services, Inc. |
| 18034929 | Vacuum Treatment Apparatus and Vacuum Treatment Method | Final Rejection | Hitachi High-Tech Corporation |
| 16887885 | Charged Particle Beam System and Overlay Shift Amount Measurement Method | Final Rejection | Hitachi High-Tech Corporation |
| 18015554 | PARTICLE BEAM IRRADIATION SYSTEM, CONTROL METHOD FOR PARTICLE BEAM IRRADIATION SYSTEM, AND CONTROL DEVICE FOR PARTICLE BEAM IRRADIATION SYSTEM | Final Rejection | Hitachi, Ltd. |
| 18458774 | RADIATION SHIELDING CONFORMAL COAT FOR PRINTED BOARD ASSEMBLY | Final Rejection | Honeywell International Inc. |
| 18144836 | DOSE MAPPING AND SUBSTRATE ROTATION FOR SUBSTRATE CURVATURE CONTROL WITH IMPROVED RESOLUTION | Non-Final OA | Applied Materials, Inc. |
| 18267281 | HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPY USING THE SAME | Final Rejection | TOHOKU UNIVERSITY |
| 18650576 | ADVECTION-BASED TRANSPORT OF ABLATED MATERIAL | Non-Final OA | AGILENT TECHNOLOGIES, INC. |
| 18751600 | ION DETECTOR AND MASS SPECTROMETER | Non-Final OA | SHIMADZU CORPORATION |
| 18285292 | MEASURING DEVICE | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18287052 | SYSTEMS AND METHODS FOR SINGLE-ION MASS SPECTROMETRY WITH TEMPORAL INFORMATION | Final Rejection | Brown University |
| 18098215 | METHOD AND DEVICE FOR DETERMINING AN ALIGNMENT OF A PHOTOMASK ON A SAMPLE STAGE WHICH IS DISPLACEABLE ALONG AT LEAST ONE AXIS AND ROTATABLE ABOUT AT LEAST ONE AXIS | Non-Final OA | Carl Zeiss SMT GmbH |
| 18641360 | ELECTRON BEAM POSITION DETECTION AND REPOSITIONING | Non-Final OA | KLA Corporation |
| 17204657 | USE OF MAGNETIC ELEMENTS TO SHAPE AND DEFOCUS CHARGED PARTICLE BEAMS | Final Rejection | Varian Medical Systems, Inc. |
| 18530109 | CHARGED PARTICLE APPARATUS AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18064110 | REPLACEABLE MODULE FOR A CHARGED PARTICLE APPARATUS | Non-Final OA | ASML Netherlands B.V. |
| 17798538 | CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD | Final Rejection | ASML NETHERLANDS B.V. |
| 17794435 | CHARGED PARTICLE MANIPULATOR DEVICE | Non-Final OA | ASML NETHERLANDS B.V. |
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