Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2877 2886
This examiner grants 82% of resolved cases
Gordon J. Stock Jr is a patent examiner in Tech Center 2800 and Art Unit 2877. He has a record of 962 resolved cases. The examiner maintains an allowance rate of 81.5 percent, which indicates that a majority of applications reach issuance. This percentage suggests that the examination process in this unit frequently results in a grant for the applicant.
The median time to allowance is 864 days. This timeframe provides a clear expectation for the duration of the prosecution cycle, showing that successful applications reach issuance within this median period. This efficiency is a key characteristic of the examiner's historical data and is an important consideration for practitioners managing patent portfolios in Tech Center 2800.
The data also shows an interview lift of 17.5 percent. This metric indicates that the probability of allowance increases when an interview is conducted, even with a base allowance rate of 81.5 percent. With 962 resolved cases, these figures represent a stable set of outcomes for practitioners. The combination of the allowance rate and the median days to allowance defines the typical experience for applicants in Art Unit 2877.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18923191 | FLUORESCENCE-CODED MID-INFRARED PHOTOTHERMAL MICROSCOPE | Non-Final OA | Trustees of Boston University |
| 18893278 | FIBER OPTIC LOSS AND LENGTH TEST SYSTEMS AND METHODS WITH EMBEDDED FIBER BRAGS SYSTEMS | Non-Final OA | AFL Telecommunications LLC |
| 18815266 | SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 18751577 | OPTICAL CENTER AIMING | Non-Final OA | Ford Global Technologies, LLC |
| 19024459 | METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANUFACTURING MACHINES | Non-Final OA | Applied Materials, Inc. |
| 18409900 | FLOW CYTOMETER AND SAMPLE MEASUREMENT METHOD | Non-Final OA | SYSMEX CORPORATION |
| 18412079 | MULTIPLE MAGNIFICATION INSPECTION OF DUTS | Non-Final OA | VIAVI SOLUTIONS INC. |
| 18766377 | EVANESCENT FIELD RESONANCE IMAGING MICROSCOPY APPARATUS AND METHOD | Non-Final OA | The University of Melbourne |
| 18686742 | METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18684391 | COMPENSATING OPTICAL SYSTEM FOR NONUNIFORM SURFACES, A METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF | Final Rejection | ASML Netherlands B.V. |
| 18289765 | METROLOGY METHOD AND ASSOCIATED METROLOGY TOOL | Non-Final OA | ASML NETHERLANDS B.V. |
| 18980276 | WAFER ALIGNMENT, CLEANLINESS, AND SURFACE QUALITY VERIFICATION USING LASER LIGHT SCATTERING | Non-Final OA | Axcelis Technologies, Inc. |
| 19018943 | SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY | Non-Final OA | KLA Corporation |
| 18372531 | SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY | Non-Final OA | KLA Corporation |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | Non-Final OA | KLA Corporation |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | Final Rejection | FemtoMetrix, Inc. |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | Non-Final OA | FemtoMetrix, Inc. |
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