Tech Center 2800 • Art Units: 2877 2886
This examiner grants 81% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18248093 | MULTI-DIMENSIONAL RYDBERG FINGERPRINT SPECTROSCOPY | Final Rejection | King Fahd University of Petroleum & Minerals |
| 19049016 | MEASUREMENT APPARATUS AND MEASUREMENT METHOD | Non-Final OA | RICOH COMPANY, LTD. |
| 19024459 | METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANUFACTURING MACHINES | Non-Final OA | Applied Materials, Inc. |
| 18817652 | DEFECT DETECTION IN PACKAGING APPLICATION | Non-Final OA | Applied Materials, Inc. |
| 18856830 | SYSTEMS AND METHODS FOR INSPECTING A WORKSURFACE | Non-Final OA | 3M INNOVATIVE PROPERTIES COMPANY |
| 18412079 | MULTIPLE MAGNIFICATION INSPECTION OF DUTS | Non-Final OA | VIAVI SOLUTIONS INC. |
| 19018943 | SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY | Non-Final OA | KLA Corporation |
| 18612383 | SYSTEM AND METHOD FOR DEVICE-LIKE OVERLAY TARGETS MEASUREMENT | Non-Final OA | KLA Corporation |
| 18372531 | SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVERLAY METROLOGY | Non-Final OA | KLA Corporation |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | Non-Final OA | KLA Corporation |
| 18686742 | METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18684391 | COMPENSATING OPTICAL SYSTEM FOR NONUNIFORM SURFACES, A METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF | Final Rejection | ASML Netherlands B.V. |
| 18289765 | METROLOGY METHOD AND ASSOCIATED METROLOGY TOOL | Non-Final OA | ASML NETHERLANDS B.V. |
| 18893278 | FIBER OPTIC LOSS AND LENGTH TEST SYSTEMS AND METHODS WITH EMBEDDED FIBER BRAGS SYSTEMS | Non-Final OA | AFL Telecommunications LLC |
| 18752587 | ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD | Non-Final OA | Urugus S.A. |
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