Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2877 2886
This examiner grants 82% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18372391 | SEMICONDUCTOR MEASUREMENT APPARATUS | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18793875 | OPTICAL-BASED VALIDATION OF ORIENTATIONS OF INTERNAL FACETS | Non-Final OA | LUMUS LTD. |
| 18686742 | METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18684391 | COMPENSATING OPTICAL SYSTEM FOR NONUNIFORM SURFACES, A METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF | Non-Final OA | ASML Netherlands B.V. |
| 18467371 | ANGLE RESOLVED REFLECTOMETRY FOR THICK FILMS AND HIGH ASPECT RATIO STRUCTURES | Final Rejection | KLA Corporation |
| 18856830 | SYSTEMS AND METHODS FOR INSPECTING A WORKSURFACE | Non-Final OA | 3M INNOVATIVE PROPERTIES COMPANY |
| 18699093 | DEVICE AND METHOD FOR CONVEYING AND LIVE CONTROLLING OF LIGHT BEAMS | Non-Final OA | UNIVERSITE DE LILLE |
| 18335485 | DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS | Non-Final OA | FemtoMetrix, Inc. |
| 18841193 | DEMODULATION SYSTEM FOR OPTICAL FIBER FABRY-PEROT SENSOR | Non-Final OA | BEIJING BYWAVE SENSING TECHNOLOGY CO., LTD. |
| 18752587 | ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD | Non-Final OA | Urugus S.A. |
| 18706056 | METHOD FOR OPTICALLY MEASURING TECHNICAL SURFACES, AND DEVICE FOR CARRYING OUT THE METHOD | Non-Final OA | BREITMEIER MESSTECHNIK GMBH |
| 18187284 | SYSTEMS AND METHODS FOR NON-CONTACT SEMICONDUCTOR TEMPERATURE MEASUREMENT | Non-Final OA | Trustees of Tufts College |
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