Prosecution Insights
Prosecution Insights
Tech Center 3600 • Art Units: 2844 2881 3685
This examiner grants 100% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18410075 | SYSTEM AND METHOD FOR RESOLUTION IMPROVEMENT OF CHARGED PARTICLES MICROSCOPY | Non-Final OA | TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED |
| 18618957 | CHARGED PARTICLE APPARATUS AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18687408 | OPTICAL FILTER AND STERILIZATION DEVICE | Non-Final OA | NIPPON ELECTRIC GLASS CO., LTD. |
| 18578086 | RADIATION SHIELDING | Non-Final OA | Wisconsin Alumni Research Foundation |
| 18568165 | VACUUM SYSTEM FOR A MASS SPECTROMETER | Non-Final OA | Micromass UK Limited |
| 18433245 | TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18696002 | Laser Induced Fragmentation for MRM Analysis | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18422476 | SIGNAL MODULATION FOR ENCODING INFORMATION IN MULTIPLE DIMENSIONS | Non-Final OA | TEXAS A&M UNIVERSITY |
| 18407388 | LIQUID METAL ION SOURCE DEVICE FOR USING BISMUTH AND ALLOY OF BISMUTH | Non-Final OA | KOREA BASIC SCIENCE INSTITUTE |
| 18382263 | METHOD OF OPERATING A CHARGED PARTICLE BEAM APPARATUS, AND CHARGED PARTICLE BEAM APPARATUS | Non-Final OA | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH |
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