Tech Center 2800 • Art Units: 1735 1772 2674 2800 2859 2877
This examiner grants 76% of resolved cases
Maher Yazback is an examiner in Tech Center 2800 and Art Unit 1735. The profile includes 68 resolved cases. The allowance rate is 76.5 percent, and the median days to allowance is 1030. These figures offer a view into the typical results and timing for applications in this art unit. The 1030 day median provides a specific benchmark for practitioners to estimate the duration of the examination process from filing to grant.
The interview lift for this examiner is 23.9 percent. This suggests that interviews have a significant positive impact on the probability of allowance. With 68 resolved cases, the 23.9 percent lift and the 76.5 percent allowance rate are key data points for practitioners to consider when planning their strategy. Engaging in an interview may be a highly effective tactic to navigate the 1030 day median timeline for applications assigned to Art Unit 1735.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18766740 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD |
| 18767486 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD |
| 19010880 | WIDE-WAVELENGTH RANGE DEMODULATION METHOD FOR CASCADED FBGS OF SIX-AXIS MULTIDIMENSIONAL STRAIN SENSOR BASED ON TUNABLE DUAL-PEAK RESONANCE LPFG | Non-Final OA | TAIYUAN UNIVERSITY OF TECHNOLOGY |
| 18760157 | BEAM DELIVERY SYSTEM FOR PROBE WITH MULTI-CORE FIBER | Non-Final OA | Alcon Inc. |
| 18403455 | INSPECTION SYSTEM AND METHOD FOR OPERATING THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18850278 | REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, FILM THICKNESS DISTRIBUTION MEASUREMENT DEVICE, REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD, AND FILM THICKNESS DISTRIBUTION MEASUREMENT METHOD | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 19067243 | MOUNTING DEVICE | Non-Final OA | TORAY ENGINEERING CO., LTD. |
| 19012641 | DYNAMIC RANGE EXTENSION OF OPTICAL SYSTEMS WITH MULTIPLE LOW INTENSITY BEAMS | Non-Final OA | KLA Corporation |
| 18848332 | APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CALCULATION AND RECONSTRUCTION | Non-Final OA | NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCIENCES |
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