Prosecution Insights
Last updated: October 02, 2026

Examiner: YAZBACK, MAHER

Tech Center 2800 • Art Units: 1735 1772 2674 2800 2859 2877

This examiner grants 76% of resolved cases

Analysis

Maher Yazback is an examiner in Tech Center 2800 and Art Unit 1735. The profile includes 68 resolved cases. The allowance rate is 76.5 percent, and the median days to allowance is 1030. These figures offer a view into the typical results and timing for applications in this art unit. The 1030 day median provides a specific benchmark for practitioners to estimate the duration of the examination process from filing to grant.

The interview lift for this examiner is 23.9 percent. This suggests that interviews have a significant positive impact on the probability of allowance. With 68 resolved cases, the 23.9 percent lift and the 76.5 percent allowance rate are key data points for practitioners to consider when planning their strategy. Engaging in an interview may be a highly effective tactic to navigate the 1030 day median timeline for applications assigned to Art Unit 1735.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

76.5%
Allow Rate
+8.5% vs TC avg
88
Total Applications
+23.9%
Interview Lift
1030
Avg Prosecution Days
Based on 68 resolved cases, 2023–2026

Rejection Statute Breakdown

4.5%
§101 Eligibility
17.5%
§102 Novelty
60.8%
§103 Obviousness
16.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18766740 IMAGE MEASUREMENT DEVICE AND METHOD THEREOF Non-Final OA SAMSUNG ELECTRONICS CO., LTD
18767486 IMAGE MEASUREMENT DEVICE AND METHOD THEREOF Non-Final OA SAMSUNG ELECTRONICS CO., LTD
19010880 WIDE-WAVELENGTH RANGE DEMODULATION METHOD FOR CASCADED FBGS OF SIX-AXIS MULTIDIMENSIONAL STRAIN SENSOR BASED ON TUNABLE DUAL-PEAK RESONANCE LPFG Non-Final OA TAIYUAN UNIVERSITY OF TECHNOLOGY
18760157 BEAM DELIVERY SYSTEM FOR PROBE WITH MULTI-CORE FIBER Non-Final OA Alcon Inc.
18403455 INSPECTION SYSTEM AND METHOD FOR OPERATING THEREOF Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18850278 REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, FILM THICKNESS DISTRIBUTION MEASUREMENT DEVICE, REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD, AND FILM THICKNESS DISTRIBUTION MEASUREMENT METHOD Non-Final OA HAMAMATSU PHOTONICS K.K.
19067243 MOUNTING DEVICE Non-Final OA TORAY ENGINEERING CO., LTD.
19012641 DYNAMIC RANGE EXTENSION OF OPTICAL SYSTEMS WITH MULTIPLE LOW INTENSITY BEAMS Non-Final OA KLA Corporation
18848332 APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CALCULATION AND RECONSTRUCTION Non-Final OA NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCIENCES

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