Tech Center 2800 • Art Units: 1772 2674 2800 2859 2877
This examiner grants 75% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18767486 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Final Rejection | SAMSUNG ELECTRONICS CO., LTD |
| 18766740 | IMAGE MEASUREMENT DEVICE AND METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD |
| 18764677 | SEMICONDUCTOR MEASUREMENT DEVICE | Final Rejection | Samsung Electronics Co., Ltd. |
| 18409680 | APPARATUS FOR MANUFACTURING DISPLAY DEVICE AND METHOD OF MANUFACTURING DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 18833299 | OPTICAL FIBER TEST EQUIPMENT AND OPTICAL FIBER TEST METHOD | Non-Final OA | NTT, Inc. |
| 18408588 | METHOD AND DEVICE FOR INSPECTING ABNORMALITY IN ELECTRODES | Non-Final OA | SK ON CO., LTD. |
| 18760157 | BEAM DELIVERY SYSTEM FOR PROBE WITH MULTI-CORE FIBER | Non-Final OA | Alcon Inc. |
| 18403455 | INSPECTION SYSTEM AND METHOD FOR OPERATING THEREOF | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 19010880 | WIDE-WAVELENGTH RANGE DEMODULATION METHOD FOR CASCADED FBGS OF SIX-AXIS MULTIDIMENSIONAL STRAIN SENSOR BASED ON TUNABLE DUAL-PEAK RESONANCE LPFG | Non-Final OA | TAIYUAN UNIVERSITY OF TECHNOLOGY |
| 18922766 | METHOD OF CAMERA CALIBRATION USING ACTIVE LASER PROJECTION | Non-Final OA | National Taipei University of Technology |
| 18642417 | SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING TARGET USING MULTIPLE WAVELENGTHS | Non-Final OA | KLA Corporation |
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