Prosecution Insights
Last updated: October 02, 2026

Nearfield Instruments B V

Technology area: Semiconductors, Circuits & Optics

6 pending office actions • 3 art units • 6 examiners • 0 of 6 (0%) have an AI response strategy ready • 7 patents granted in the last 365 days

Analysis

Nearfield Instruments B V manages 6 pending office actions within the Semiconductors, Circuits & Optics technology area. These actions are distributed across 6 distinct examiners and 3 distinct art units. This distribution indicates that while the matters are spread among several examiners, they are concentrated within a smaller number of administrative units. Specifically, the 6 actions are being handled within 3 art units, suggesting some overlap in the technical classification of the company's pending applications.

The busiest examiner for this portfolio is WANG, JING, who is responsible for 1 pending office action. This 1 action represents the maximum workload for any individual examiner within the current set of 6 pending actions. The alignment of 6 actions with 6 distinct examiners shows that each matter is being reviewed by a different official. For the practitioner, this means that while the art unit environment is somewhat consolidated across the 3 units, the individual examiner interactions are unique for each of the 6 pending matters. The prosecution strategy must account for 6 different perspectives.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Portfolio Summary

6
Total Pending OAs
3
Non-Final OAs
3
Final Rejections
0
Advisory / Quayle

Response Deadline Pressure

Based on the USPTO statutory response window for each pending office action. 3 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.

3
Overdue
0
Due this week
0
Due this month
0
Due in next 60 days
0
Due later

Deadline Fire Line

Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 3 of the docket's apps have a known mailing date.

-30dToday30d60d90d120d
Overdue (3)

Case Difficulty Mix

Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.

5
Hard (83%)
1
Medium (17%)
0
Easy (0%)
0
Unknown (0%)

Rejection Statute Mix

BucketCases
§101 + other2 (33%)
§103 only1 (17%)
Multi-statute (no §101)3 (50%)

Industry Mix

How the docket's pending cases split across USPTO tech-center bands.

0
Life Sciences
0% of docket
0
Information Tech
0% of docket
0
Communications
0% of docket
5
Semiconductors
83% of docket
0
Mechanical / Eng
0% of docket
1
Business / Other
17% of docket

Time-on-OA Estimate

Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.

60 h
Manual time on pending OAs
12 h
Time saved (low, 20%)
21 h
Time saved (mid, 35%)
0.5 wks
FTE-weeks freed (mid)

Top Examiners on this docket

ExaminerApps on this docketAllow rateInterview lift
WANG, JING 1 100.0% +0.0%
DEVITO, ALEX T 1 72.1% +12.3%
VAN ROY, TOD THOMAS 1 54.2% +38.1%
LUCK, SEAN M 1 62.7% +27.5%
EINHORN, MICA JILLIAN 1 71.4% +40.0%
OSENBAUGH-STEWART, ELIZA W 1 73.0% +16.7%

Hard Cases (5)

Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 5 ordered by deadline are shown.

App #TitleExaminerDue in
18572344 METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD DEVITO, ALEX T 19d overdue
18289407 SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLATE QUALIFICATION TOOL LUCK, SEAN M 9d overdue
18697040 ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROSCOPY WANG, JING —
18567881 LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODE VAN ROY, TOD THOMAS —
17928190 A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM OSENBAUGH-STEWART, ELIZA W —

Interview Candidates (5)

Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.

App #TitleExaminerDue in
18288660 METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE EINHORN, MICA JILLIAN 42d overdue
18572344 METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD DEVITO, ALEX T 19d overdue
18289407 SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLATE QUALIFICATION TOOL LUCK, SEAN M 9d overdue
18567881 LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODE VAN ROY, TOD THOMAS —
17928190 A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM OSENBAUGH-STEWART, ELIZA W —

Top Art Units

Art UnitApps
2881 3
2855 1
2878 1

Pending Office Actions

App #TitleExaminerArt UnitStatutesStatusDue inAIFiled
18697040 ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROSCOPY WANG, JING 2881 §102§103 Non-Final OA — Pending Mar 29, 2024
18572344 METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD DEVITO, ALEX T 2855 §102§103 Non-Final OA 19d overdue Pending Dec 20, 2023
18567881 LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODE VAN ROY, TOD THOMAS — §102§103§112 Non-Final OA — Pending Dec 07, 2023
18289407 SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLATE QUALIFICATION TOOL LUCK, SEAN M 2878 §101§102§103 Final Rejection 9d overdue Pending Nov 03, 2023
18288660 METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE EINHORN, MICA JILLIAN 2881 §103 Final Rejection 42d overdue Pending Oct 27, 2023
17928190 A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM OSENBAUGH-STEWART, ELIZA W 2881 §101§112 Final Rejection — Pending Nov 28, 2022

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