2 pending office actions
| App # | Title | Examiner | Art Unit | Status | Filed |
|---|---|---|---|---|---|
| 18840843 | Device and Method for Measuring Wafers | LEE, HWA S | 2877 | Non-Final OA | Aug 22, 2024 |
| 18282759 | CHROMATIC CONFOCAL MEASURING SYSTEM FOR HIGH-SPEED DISTANCE MEASUREMENT | AKANBI, ISIAKA O | 2877 | Non-Final OA | Sep 18, 2023 |
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