Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2877 2878 2882 2884 2886
This examiner grants 77% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19091121 | SEMICONDUCTOR MEASUREMENT METHOD | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18578067 | OBJECTIVE LENS AND SAMPLE ANALYZER | Non-Final OA | Sony Group Corporation |
| 18873008 | COMPARATOR, LIGHT DETECTION ELEMENT, AND ELECTRONIC DEVICE | Non-Final OA | Sony Semiconductor Solutions Corporation |
| 18711236 | DEPTH SENSOR DEVICE AND METHOD FOR OPERATING A DEPTH SENSOR DEVICE | Non-Final OA | Sony Semiconductor Solutions Corporation |
| 18755217 | REPAIR DIAGRAM GENERATION DEVICE, REPAIR DIAGRAM GENERATION METHOD, AND PROGRAM | Non-Final OA | FUJIFILM Corporation |
| 19090475 | SUBSTRATE EVALUATION METHOD AND SUBSTRATE PROCESSING APPARATUS | Non-Final OA | Tokyo Electron Limited |
| 18414488 | TEST METHOD FOR A WAFER AND WAFER | Final Rejection | United Microelectronics Corp. |
| 18622193 | Multi-Modal Wide-Angle Illumination Employing a Compound Beam Combiner | Non-Final OA | Orbotech Ltd. |
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