Tech Center 2800 • Art Units: 2812 2877 2886
This examiner grants 82% of resolved cases
Jonathon Cook is an examiner in Tech Center 2800 and Art Unit 2812. The examiner has 757 resolved cases and an allowance rate of 81.6 percent. This high rate suggests that the majority of applications result in a grant, making it a favorable environment for applicants. The median days to allowance is 852, which represents an efficient timeframe for the prosecution process. These metrics provide a solid foundation for practitioners to plan their filings and set expectations for success.
The interview lift percentage is 17.0 percent. This lift indicates that interviews provide a significant benefit, increasing the likelihood of an allowance above the 81.6 percent baseline. With 757 resolved cases, the examiner has a substantial track record in Art Unit 2812. Practitioners can use the 852-day median pendency to project the timing of patent grants. The 17.0 percent lift suggests that direct discussion is a highly effective tool for resolving any remaining issues. Overall, the 81.6 percent allowance rate reflects a consistent and positive path for applications in Tech Center 2800.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19064242 | WAFER INSPECTION APPARATUS | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18966986 | METHOD FOR MEASURING SEMICONDUCTOR DEVICE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18750009 | OPTICAL FIBER SENSING SYSTEM, OPTICAL FIBER SENSING APPARATUS, AND ROUTE DETERMINATION METHOD | Final Rejection | NEC Corporation |
| 18571402 | OPTICAL COHERENCE TOMOGRAPHY IMAGING APPARATUS, OPTICAL COHERENCE TOMOGRAPHY IMAGING METHOD, AND RECORDING MEDIUM | Final Rejection | NEC Corporation |
| 18551686 | Apparatus, Device and Method for Irradiating an in Particular Biological Specimen with a Holographic Optical Component | Final Rejection | Robert Bosch GmbH |
| 18838462 | SELF-MIXING INTERFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND METHOD OF DETECTING MOVEMENTS | Non-Final OA | ams International AG |
| 18863924 | OPTICAL FIBER SENSING SYSTEM AND OPTICAL FIBER SENSING METHOD | Non-Final OA | NTT, Inc. |
| 18834081 | Defect Inspection Apparatus and Defect Inspection Method | Final Rejection | Hitachi High-Tech Corporation |
| 19197529 | METHOD FOR COMPENSATING THE ARTIFACTS GENERATED BY MOVING MEASUREMENT OBJECTS IN MEASUREMENT SIGNALS OF SWEPT-SOURCE OCT SYSTEMS | Non-Final OA | Carl Zeiss Meditec AG |
| 18861173 | MEASUREMENT OF FABRICATION PARAMETERS BASED ON MOIRÉ INTERFERENCE PATTERN COMPONENTS | Non-Final OA | ASML NETHERLANDS B.V. |
| 19088593 | Methods and Systems for Characterizing Laser Machining Properties by Measuring Keyhole Dynamics Using Interferometry | Non-Final OA | IPG PHOTONICS CORPORATION |
| 18934260 | DEVICE, SYSTEM AND METHOD FOR DETECTING SUBSTANCES IN LIQUID TO BE TESTED USING PLASMA SPECTROSCOPY | Final Rejection | NATIONAL TAIWAN UNIVERSITY |
| 19055839 | OPTICAL MICROSCOPY | Non-Final OA | Cambridge Enterprise Limited |
| 18611299 | FLUORESCENCE MODE FOR WORKPIECE INSPECTION | Final Rejection | KLA Corporation |
| 18212036 | WHITE LIGHT INTERFEROMETRIC INSPECTION USING TILTED REFERENCE BEAM AND SPATIAL FILTERING | Final Rejection | Orbotech Ltd. |
| 18261101 | METHOD AND SYSTEM FOR EVALUATING WORK-AFFECTED LAYER | Non-Final OA | TOYOTA TSUSHO CORPORATION |
| 17994395 | METHODS, APPARATUS, AND SYSTEMS FOR AN OPTICAL FIBER FORWARD SCATTER CHANNEL IN FLOW CYTOMETERS | Non-Final OA | CYTEK BIOSCIENCES, INC. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy