Listed by the USPTO as AHMED, JAMIL
Tech Center 2800 • Art Units: 2636 2800 2872 2877 2886 2896
This examiner grants 82% of resolved cases
AHMED, JAMIL works in Tech Center 2800 and Art Unit 2636. The examiner has 721 resolved cases, an allowance rate of 82.1%, and a median of 786 days to allowance. Interviews are associated with a 15.1% lift in allowance outcomes, providing a useful prosecution signal for counsel evaluating examiner contact.
The leading company matters are The Board of Trustees of the Leland Stanford Junior University, Canon Inc., and Fujifilm Corporation. The listed firms are BIRCH STEWART KOLASCH & BIRCH, LLP, CANTOR COLBURN LLP, and Chong IP Law Group. The profile combines a substantial examination record with a median timeline under two and a half years, supporting structured planning from initial response through allowance.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19086916 | SENSOR UNIT OF SPECTROSCOPIC ANALYSIS APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD | Non-Final OA | FUJIFILM Corporation |
| 18541810 | METHOD OF MEASURING EDGE ECCENTRICITY WHILE WAFER IS ON PRE-ALIGNER | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18996502 | DEFORMATION SENSING AND OBJECT IDENTIFICATION WITH COLOR-DYNAMIC MECHANO-RESPONSIVE PHOTONIC MATERIALS | Non-Final OA | Massachusetts Institute of Technology |
| 18998479 | Imaging Using Reflected Illuminated Structures | Non-Final OA | The Regents of the University of California |
| 18992718 | L ight manipulation and sensing based on geometric reconfiguration of nanoscale optical systems | Non-Final OA | The Board of Trustees of the Leland Stanford Junior University |
| 18712142 | DEVICES AND METHODS INVOLVING METADEVICES AND PHOTONIC-BASED BIOSENSING | Non-Final OA | The Board of Trustees of the Leland Stanford Junior University |
| 19186758 | SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD | Non-Final OA | Tokyo Electron Limited |
| 19189538 | WAFER POSITIONING METHOD AND APPARATUS | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 19110763 | COMPACT, HIGH-RESOLUTION SNAPSHOT HYPERSPECTRAL IMAGING WITH 3D PRINTED GLASS LIGHTGUIDE ARRAY | Non-Final OA | Arizona Board of Regents on Behalf of the University of Arizona |
| 18877578 | Method of Evaluating Quality of Positive Electrode Active Material, Positive Electrode Active Material and Method of Preparing Positive Electrode | Final Rejection | LG Chem, Ltd. |
| 18852906 | METHOD AND SYSTEM FOR INSPECTING A SURFACE | Non-Final OA | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy82.1% of resolved applications examined by Jamil Ahmed were allowed (721 resolved cases), compared with 62.9% across Art Unit 2636 over the last five years.
This examiner's interview lift is +15.1 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Jamil Ahmed took 786 days on average from filing to allowance.
Jamil Ahmed examines applications in Art Unit 2636 in Tech Center 2800 (Semiconductors, Circuits & Optics).
