Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2636 2800 2872 2877 2886 2896
This examiner grants 82% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18541810 | METHOD OF MEASURING EDGE ECCENTRICITY WHILE WAFER IS ON PRE-ALIGNER | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18877578 | Method of Evaluating Quality of Positive Electrode Active Material, Positive Electrode Active Material and Method of Preparing Positive Electrode | Non-Final OA | LG Chem, Ltd. |
| 18998479 | Imaging Using Reflected Illuminated Structures | Non-Final OA | The Regents of the University of California |
| 18992718 | L ight manipulation and sensing based on geometric reconfiguration of nanoscale optical systems | Non-Final OA | The Board of Trustees of the Leland Stanford Junior University |
| 18965736 | High-throughput single-molecule photoacoustic absorption spectroscopy with nanomechanical oscillators | Non-Final OA | The Board of Trustees of the Leland Stanford Junior University |
| 18901156 | OPTICAL LEAK SENSOR OUTPUT AGGREGATION AND VISUALIZATION | Final Rejection | DELL PRODUCTS L.P. |
| 18990783 | DIFFRACTIVE EUV SPECTRAL PURITY FILTERS FOR OPTICAL SYSTEMS | Non-Final OA | KLA Corporation |
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