Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2800 2877 2884 2896 2899
This examiner grants 85% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18879550 | SIMULTANEOUS MULTI-AXIS DISPLACEMENT MEASUREMENT DEVICE USING OPTICAL SYSTEM | Non-Final OA | LG ELECTRONICS INC. |
| 18353203 | INSPECTION APPARATUS AND INSPECTION SYSTEM | Final Rejection | FUJIFILM Business Innovation Corp. |
| 19063309 | MEASURING APPARATUS AND MEASURING METHOD | Non-Final OA | RICOH COMPANY, LTD. |
| 18797104 | LIDAR DEVICE | Non-Final OA | LG INNOTEK CO., LTD. |
| 19062017 | CONCENTRATION COMPUTATION SECTION, CONCENTRATION MEASUREMENT SYSTEM, AND CONCENTRATION MEASUREMENT METHOD | Non-Final OA | Asahi Kasei Microdevices Corporation |
| 18707921 | METHOD FOR MEASURING TWIST OF OPTICAL FIBER AND METHOD FOR MANUFACTURING OPTICAL FIBER | Final Rejection | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
| 18935796 | METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING LIGHT REFLECTIVITY AND AN EFFECT OF A POLARIZATION OF MEASURING LIGHT ON A MEASURING LIGHT IMPINGEMENT ON A LITHOGRAPHY MASK | Final Rejection | Carl Zeiss SMT GmbH |
| 19057245 | OPTICAL FIBER CHARACTERISTIC MEASUREMENT APPARATUS AND OPTICAL FIBER CHARACTERISTIC MEASUREMENT METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 18851899 | OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND OPTICAL MEASUREMENT METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 18812890 | Angle Of Incidence And Azimuth Angle Resolved Spectroscopic Ellipsometry For Semiconductor Metrology | Non-Final OA | KLA Corporation |
| 18843138 | INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18834356 | SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT | Non-Final OA | MICRO-EPSILLON OPTRONIC GMBH |
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