Tech Center 2800 • Art Units: 2877 2884 2896 2899
This examiner grants 85% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18382998 | METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE USING A WAFER INSPECTION APPARATUS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18841353 | WIDE-SPECTRUM ANALYSIS SYSTEM | Non-Final OA | Bio-Rad Laboratories, Inc. |
| 18836511 | OPTICAL FIBER BENDING LOSS MEASURING METHOD | Non-Final OA | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
| 18353203 | INSPECTION APPARATUS AND INSPECTION SYSTEM | Non-Final OA | FUJIFILM Business Innovation Corp. |
| 18793652 | SOLID-STATE SPECTROMETER | Non-Final OA | Masimo Corporation |
| 18800169 | OPTICAL DEVICE | Non-Final OA | VIAVI Solutions Inc. |
| 18843138 | INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD | Non-Final OA | ASML Netherlands B.V. |
| 18711248 | METHOD FOR GENERATING SPECTRAL DATA PERTAINING TO MICROPARTICLE SAMPLE, METHOD FOR ANALYZING MICROPARTICLES, METHOD FOR DISTINGUISHING MICROPARTICLES, METHOD FOR ASSESSING WHETHER CANCER-CELL-DERIVED EXOSOMES ARE PRESENT, SUBSTRATE FOR MEASURING SPECTRUM OF MICROPARTICLES, DEVICE FOR MEASURING SPECTRUM OF MICROPARTICLES, AND APPARATUS FOR MEASURING SPECTRUM OF MICROPARTICLES | Non-Final OA | Osaka University |
| 18838601 | SYSTEM AND METHOD FOR TEMPERATURE PROFILING WITH RAMAN SCATTERING | Non-Final OA | Michigan Aerospace Corporation |
| 18834356 | SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT | Non-Final OA | MICRO-EPSILLON OPTRONIC GMBH |
| 18735970 | Optical Analysis Device For Remote Analysis Of Fluid-Based Tests | Non-Final OA | United States Government As Represented By The Department of Veterans Affairs |
| 18728358 | SYSTEMS AND METHODS FOR SPECTROSCOPIC MEASUREMENTS OF INHOMOGENEOUS MIXTURES | Non-Final OA | Tornado Spectral Systems Inc. |
| 18532673 | INFRARED LIGHT SENSING DEVICE | Non-Final OA | Taiwan-Asia Semiconductor Corporation |
| 18715204 | MATERIAL IDENTIFICATION APPARATUS AND METHOD | Non-Final OA | Tomra Sorting GmbH |
| 18651203 | Three-Dimensional Dynamic Interferometric Surface Probe | Non-Final OA | D4D Technologies, LLC |
| 18627909 | MULTIPATH ANALYZER FOR MEASURING OPTICAL PROPERTIES OF A SAMPLE FLUID TO OBTAIN AT LEAST ONE PROPERTY | Non-Final OA | 14911199 Canada Inc. |
| 18531237 | EXAMINING METHOD FOR A COATING LAYER ON A WAFER | Final Rejection | INGENTEC CORPORATION |
| 18240257 | MATERIAL IMAGING SYSTEM AND METHOD | Final Rejection | MOTION METRICS INTERNATIONAL CORP. |
| 18382047 | OPTICAL ANALYSIS DEVICE FOR DETERMINING A CHARACTERISTIC OF A MEDIUM, HOUSING, AND SYSTEM | Non-Final OA | iSud Solutions GmbH |
| 18088812 | LIDAR AND RANGING METHOD USING SAME | Final Rejection | SiFotonics Technologies (Beijing) Co., Ltd. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy