Tech Center 2800 • Art Units: 2877
This examiner grants 60% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18101275 | Determination Of The Concentration Of One Or More Substances In A Fluid | Non-Final OA | Fenwal, Inc. |
| 18679163 | MEASURING DEVICE, AND RECORDING MEDIUM | Non-Final OA | Mitsubishi Electric Corporation |
| 18694678 | Assembly for Measuring the Thickness of a Continuous Material Web | Non-Final OA | Matthews International Corporation |
| 18160511 | OPTICAL FILTER APPARATUS AND IMAGE PICKUP APPARATUS | Non-Final OA | CANON KABUSHIKI KAISHA |
| 17377179 | LIGHT DETECTION SYSTEM | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18847748 | LIGHT DETECTING DEVICE | Non-Final OA | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18549389 | LIGHT DETECTION DEVICE AND ELECTRONIC DEVICE | Final Rejection | SONY SEMICONDUCTOR SOLUTIONS CORPORATION |
| 18438222 | PHASE MASKING FOR POLARIZATION AND OPTICAL SIGNAL CONTROL IN OPTICAL INSPECTION SYSTEMS | Final Rejection | Applied Materials, Inc. |
| 18587228 | METHOD AND MEASURING DEVICE FOR INSPECTING PHOTOMASKS, AND EUV CAMERA | Non-Final OA | Carl Zeiss SMT GmbH |
| 18367208 | Mesh Integrity Check | Final Rejection | Carl Zeiss SMT GmbH |
| 17759902 | METHOD AND APPARATUS FOR CONTACTLESS MEASURING OF AN OBJECT SURFACE | Final Rejection | FRIEDRICH-SCHILLER-UNIVERSITÄT JENA |
| 18643796 | ANGLE-RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MODULATOR AND THICKNESS MEASURING METHOD FOR THIN FILM | Final Rejection | SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION |
| 17908303 | INSPECTION DEVICE AND INSPECTION METHOD | Final Rejection | HAMAMATSU PHOTONICS K.K. |
| 18838759 | OPTICAL APPARATUS | Non-Final OA | RENISHAW PLC |
| 18559942 | DIFFRACTION GRATING FOR MEASUREMENTS IN EUV-EXPOSURE APPARATUSES | Non-Final OA | ASML NETHERLANDS B.V |
| 18772838 | METROLOGY SYSTEM | Non-Final OA | LEICA GEOSYSTEMS AG |
| 18599847 | SYSTEMS AND METHODS FOR TESTING FIBER OPTIC CABLE INSTALLATION WITH A LIGHT GENERATOR | Final Rejection | Cox Communications, Inc. |
| 17856473 | TRIANGULATION DEVICE | Final Rejection | Banner Engineering Corp. |
| 17735863 | NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF | Final Rejection | OptiPro Systems, LLC |
| 18753904 | Methods and Apparatus for Direct Calibration | Non-Final OA | Woods Hole Oceanographic Institution |
| 18753768 | Methods and Apparatus for Direct Calibration | Non-Final OA | Woods Hole Oceanographic Institution |
| 18260172 | SYSTEMS AND METHODS FOR FIBER OPTIC FOURIER SPECTROMETRY MEASUREMENT | Non-Final OA | SENTEK INSTRUMENT, LLC |
| 18410828 | HIGH SPEED OPTICAL FREQUENCY MEASUREMENT DEVICE | Non-Final OA | Lumentum Technology (UK) Limited |
| 18537948 | POLARIZING FILTER AND POLARIMETRIC IMAGE SENSOR INTEGRATING SUCH A FILTER | Final Rejection | Commissariat à I'Énergie Atomique et aux Énergies Alternatives |
| 18510708 | Optical Time-Domain Reflectometry System and Method | Non-Final OA | II-VI Photonics, Inc. |
| 17935083 | WEAKLY COUPLED ABSORBER TO PLASMONIC DEVICE | Final Rejection | The Government of the United of America, as represented by the Secretary of the Navy |
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