Prosecution Insights
Last updated: May 29, 2026

Examiner: CLARKE, ADAM S

Tech Center 2800 • Art Units: 2858 2867

This examiner grants 79% of resolved cases

Performance Statistics

78.7%
Allow Rate
+10.7% vs TC avg
510
Total Applications
+11.7%
Interview Lift
1138
Avg Prosecution Days
Based on 488 resolved cases, 2023–2026

Rejection Statute Breakdown

2.9%
§101 Eligibility
12.6%
§102 Novelty
76.9%
§103 Obviousness
5.2%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18241176 METHODS TO PERFORM NUCLEAR MAGNETIC RESONANCE MEASUREMENTS, AND NUCLEAR MAGNETIC RESONANCE TOOLS Non-Final OA Halliburton Energy Services, Inc.
18456801 Angular Velocity Detection Element And Angular Velocity Sensor Non-Final OA SEIKO EPSON CORPORATION
18523453 METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE Non-Final OA ROLLS-ROYCE PLC
18164314 SYSTEMS, APPARATUSES, AND METHODS FOR DETECTING A VAPOR Non-Final OA HONEYWELL INTERNATIONAL INC.
18033677 Sensing Device Final Rejection Carnegie Mellon University
18135990 SYSTEM, METHOD AND COMPUTER-ACCESSIBLE MEDIUM FOR SEPARATING FAT AND WATER IN MAGNETIC RESONANCE IMAGING USING FREQUENCY SWEEP RADIOFREQUENCY SATURATION PULSES Non-Final OA New York University
17534903 INTEGRATED ELECTROPHYSIOLOGY AMPLIFYING APPARATUS, COMPUTER-ACCESSIBLE MEDIUM, SYSTEM AND METHOD FOR USE THEREOF Non-Final OA The Trustees of Columbia University in the City of New York
18524722 PORE CHIP AND MICROPARTICLE MEASUREMENT SYSTEM Final Rejection ADVANTEST CORPORATION
18925878 AUTOMATIC CONFIGURATION OF A LOW FIELD MAGNETIC RESONANCE IMAGING SYSTEM Non-Final OA Hyperfine Operations, Inc.
18354895 POSITION SENSING METHOD AND SYSTEM Non-Final OA Allegro MicroSystems, LLC
18631623 TESTING A POWER SUPPLY Non-Final OA Teradyne, Inc.
18624137 TEST FIXTURE SET AND TESTING METHOD Non-Final OA Universal Scientific Industrial (Shanghai) Co., Ltd.
18142676 MOISTURE DETECTION SYSTEM, METHOD FOR USE OF SYSTEM, AND LAMINATE FOR SYSTEM Non-Final OA FLEXIBLE TECHNOLOGIES, INC.
18130558 Device and System for I-V Measurement and Performance Analysis in a PV Array Non-Final OA ATONOMETRICS

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