Prosecution Insights
Last updated: October 27, 2026

Latanya N Crawford Eason, USPTO Patent Examiner

Listed by the USPTO as CRAWFORD EASON, LATANYA N

Tech Center 2800 • Art Units: 2813

This examiner grants 78% of resolved cases

Analysis

CRAWFORD EASON, LATANYA N examines in USPTO Technology Center 2800 and art unit 2813. The record contains 933 resolved cases, a 78.5% allowance rate, and a 0.4% interview lift. The median time to allowance is 988 days. The interview measure is close to neutral in this record, so written prosecution quality remains the clearer focus despite the strong allowance outcome.

The leading companies are Taiwan Semiconductor Manufacturing Company, Ltd., Samsung Electronics Co., Ltd., and Sony Group Corporation. The leading firms are JCIPRNET, STINSON LLP, and Apex Attorneys at Law, LLP. These recurring participants provide practical context for semiconductor and electronics matters before this examiner.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

78.5%
Allow Rate
+10.5% vs TC avg
993
Total Applications
+0.4%
Interview Lift
988
Avg Prosecution Days
Based on 933 resolved cases, 2023–2026

Rejection Statute Breakdown

0.4%
§101 Eligibility
31.2%
§102 Novelty
54.1%
§103 Obviousness
11.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18390217 IMAGE SENSOR Non-Final OA Samsung Electronics Co., Ltd.
18532504 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18489451 SEMICONDUCTOR DEVICE, ELECTRONIC SYSTEM INCLUDING THE SAME, AND METHOD OF FABRICATING THE SAME Final Rejection Samsung Electronics Co., Ltd.
18556417 SENSOR DEVICE AND MANUFACTURING METHOD Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
17545467 MAGNETIZATION ROTATION ELEMENT, MAGNETORESISTANCE EFFECT ELEMENT, MAGNETIC MEMORY, AND METHOD OF MANUFACTURING SPIN-ORBIT TORQUE WIRING Final Rejection TDK CORPORATION
18919634 DEVICES Non-Final OA InnoLux Corporation
18547752 METHOD TO IMPROVE THE PERFORMANCE OF GALLIUM-CONTAINING MICRON-SIZED LIGHT-EMITTING DEVICES Non-Final OA The Regents of the University of California
18646055 SELECTIVE METAL CAPPING PROCESSES FOR A JUNCTION SILICIDE Non-Final OA Applied Materials, Inc.
18400819 SELECTIVE BOTTOM-UP METAL FILL/CAP ON JUNCTION SILICIDE BY SELECTIVE METAL REMOVAL Non-Final OA Applied Materials, Inc.
18526529 METHODS FOR IMPROVING DEPTH LOADING IN TRANSISTORS Non-Final OA Taiwan Semiconductor Manufacturing Company, LTD.
17861234 MEMORY DEVICE AND METHOD OF FABRICATING THE SAME Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18786724 Conductive Features with Air Spacer and Method of Forming Same Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18780824 Semiconductor Device and Manufacturing Method of Semiconductor Device Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17976949 SUBSTRATE FOR LIGHT EMITTING ELEMENTS, LIGHT EMITTING DEVICE INCLUDING SUBSTRATE FOR LIGHT EMITTING ELEMENTS, AND METHOD OF PRODUCING SUBSTRATE FOR LIGHT EMITTING ELEMENTS Non-Final OA NICHIA CORPORATION
18883932 PACKAGE STRUCTURE INCLUDING AT LEAST TWO MEMORY DEVICES, ASSEMBLY STRUCTURE AND METHOD OF MANUFACTURING THE SAME Non-Final OA NANYA TECHNOLOGY CORPORATION
18809362 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Non-Final OA NANYA TECHNOLOGY CORPORATION
17104244 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM Non-Final OA KOKUSAI ELECTRIC CORPORATION
18788163 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA UNITED MICROELECTRONICS CORP.
18232593 LED HUMAN CENTRIC LIGHTING DEVICE AND METHOD FOR MANUFACTURING SAME Final Rejection NINGBO SUNPU LED CO., LTD.

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Frequently Asked Questions

What is examiner Latanya N Crawford Eason's allowance rate?

78.5% of resolved applications examined by Latanya N Crawford Eason were allowed (933 resolved cases), compared with 80.3% across Art Unit 2813 over the last five years.

Does an interview help with examiner Latanya N Crawford Eason?

This examiner's interview lift is +0.4 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.

How long does examiner Latanya N Crawford Eason take to allow a patent?

Applications allowed by Latanya N Crawford Eason took 988 days on average from filing to allowance.

Which art unit does examiner Latanya N Crawford Eason work in?

Latanya N Crawford Eason examines applications in Art Unit 2813 in Tech Center 2800 (Semiconductors, Circuits & Optics).

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