Listed by the USPTO as FREDERIKSEN, DAVID B
Tech Center 2800 • Art Units: 2812 2842 2858 2867
This examiner grants 86% of resolved cases
FREDERIKSEN, DAVID B has resolved 490 cases in Tech Center 2800 and Art Unit 2812. The allowance rate is 86.1%, and the median time to allowance is 932 days. The 12.9% interview lift shows a positive interview association, supporting preparation for examiner discussions that directly address claim construction and the cited art.
The listed companies are TDK Corporation, Apple Inc., and Taiwan Semiconductor Manufacturing Company, Ltd. The representative firms are APPLE INC. - Fletcher, JCIPRNET, and Rimon PC - MWE. The profile presents a favorable allowance outcome alongside a substantial median timeline, so practitioners should preserve flexibility for continued prosecution even when early examination appears constructive.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18955381 | SYSTEMS AND METHODS FOR COORDINATING SYNCHRONIZED SAMPLING | Non-Final OA | Apple Inc. |
| 18955560 | SYSTEMS AND METHODS FOR COORDINATING SYNCHRONIZED SAMPLING | Non-Final OA | Apple Inc. |
| 18919906 | CORROSION MONITORING | Non-Final OA | ABB Schweiz AG |
| 18917328 | POSITION DETECTION DEVICE, KEY SWITCH, KEYBOARD, MOUSE, AND GAME CONTROLLER | Non-Final OA | TDK Corporation |
| 18840684 | SENSOR CHIP, MAGNETIC SENSOR HAVING THE SAME, AND MAGNETIC SENSOR MANUFACTURING METHOD | Final Rejection | TDK CORPORATION |
| 18835156 | SENSOR ELEMENT AND MANUFACTURING METHOD THEREFOR | Final Rejection | TDK Corporation |
| 18895785 | POWER SUPPLY DEVICE, DIAGNOSIS DEVICE, AND DIAGNOSIS METHOD | Final Rejection | MURATA MANUFACTURING CO., LTD. |
| 18646440 | METHODS AND APPARATUS TO DETERMINE ELECTRICAL PROPERTIES OF COMPONENTS | Final Rejection | Texas Instruments Incorporated |
| 18640939 | SYSTEMS AND METHODS FOR AUTOMATED ANALYSIS OF VOLTAGE CONTRAST DEFECTS IN INTEGRATED CIRCUIT INSPECTION | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18480482 | ELECTROSTATIC FIELD STRENGTH MEASURING APPARATUS, DETECTING APPARATUS, METHOD OF MEASURING ELECTROSTATIC FIELD STRENGTH OF TARGET OBJECT | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18647326 | METHOD OF TESTING A POWER TRANSISTOR | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 19173908 | Position Sensor and Method for Redundantly Determining a Position | Non-Final OA | KNORR-BREMSE Systeme fuer Nutzfahrzeuge GmbH |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy86.1% of resolved applications examined by David B Frederiksen were allowed (490 resolved cases), compared with 82.1% across Art Unit 2812 over the last five years.
This examiner's interview lift is +12.9 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by David B Frederiksen took 932 days on average from filing to allowance.
David B Frederiksen examines applications in Art Unit 2812 in Tech Center 2800 (Semiconductors, Circuits & Optics).
