Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2812 2842 2858 2867
This examiner grants 86% of resolved cases
David B. Frederiksen examines cases in Tech Center 2800 and Art Unit 2812, with 486 resolved cases. He has an allowance rate of 86.2% and a median days to allowance of 931. These figures indicate a high likelihood of grant. The 486 resolved cases provide a solid foundation for these performance metrics.
The interview lift is 12.7%, showing that interviews are a productive part of the process. When added to the 86.2% allowance rate, an interview makes success more likely. Practitioners should use the 931-day median timeline as a benchmark for their applications. The 12.7% lift is a significant factor compared to the 86.2% baseline. Together, the 86.2% allowance rate and 12.7% lift suggest a favorable environment for applicants in Art Unit 2812.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18955560 | SYSTEMS AND METHODS FOR COORDINATING SYNCHRONIZED SAMPLING | Non-Final OA | Apple Inc. |
| 18955381 | SYSTEMS AND METHODS FOR COORDINATING SYNCHRONIZED SAMPLING | Non-Final OA | Apple Inc. |
| 18840684 | SENSOR CHIP, MAGNETIC SENSOR HAVING THE SAME, AND MAGNETIC SENSOR MANUFACTURING METHOD | Final Rejection | TDK CORPORATION |
| 18835156 | SENSOR ELEMENT AND MANUFACTURING METHOD THEREFOR | Final Rejection | TDK Corporation |
| 18895785 | POWER SUPPLY DEVICE, DIAGNOSIS DEVICE, AND DIAGNOSIS METHOD | Final Rejection | MURATA MANUFACTURING CO., LTD. |
| 18919906 | CORROSION MONITORING | Non-Final OA | ABB Schweiz AG |
| 18646440 | METHODS AND APPARATUS TO DETERMINE ELECTRICAL PROPERTIES OF COMPONENTS | Final Rejection | Texas Instruments Incorporated |
| 18480482 | ELECTROSTATIC FIELD STRENGTH MEASURING APPARATUS, DETECTING APPARATUS, METHOD OF MEASURING ELECTROSTATIC FIELD STRENGTH OF TARGET OBJECT | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 19013930 | METHOD AND APPARATUS FOR DETECTING AC POWER LOSS AT A DEVICE | Non-Final OA | Honeywell International Inc. |
| 18664628 | METHOD AND APPARATUS FOR WAFER MEASUREMENT | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18668274 | NON-CONTACT VOLTAGE MEASURING METHOD AND SYSTEM THEREOF | Non-Final OA | Qisda Corporation |
| 19050395 | System and method for determining an item count in a rack using magnetic sensors | Non-Final OA | 7-Eleven, Inc. |
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