Tech Center 2800 • Art Units: 2863 2881
This examiner grants 79% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18837969 | NUCLEAR REACTOR SHIELDING FACILITY, NUCLEAR FACILITY, AND NUCLEAR REACTOR SHIELDING FACILITY CONSTRUCTION METHOD | Non-Final OA | MITSUBISHI HEAVY INDUSTRIES, LTD. |
| 18838013 | Ion Milling Device | Non-Final OA | Hitachi High-Tech Corporation |
| 18272948 | METHOD AND APPARATUS FOR A POLYMER ELECTROSPRAY EMITTER | Non-Final OA | Massachusetts Institute of Technology |
| 18384253 | SEMICONDUCTOR PROCESS APPARATUS AND METHOD | Final Rejection | Taiwan Semiconductor Manufacturing Company LTD |
| 18388490 | ION ANGLE SENSOR | Non-Final OA | Applied Materials, Inc. |
| 18593000 | PATTERN SHAPE MEASUREMENT METHOD, PATTERN SHAPE MEASUREMENT DEVICE, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | Non-Final OA | Kioxia Corporation |
| 18506957 | MINIMIZATION OF ENERGY SPREAD IN FOCUSED ION BEAM (FIB) SYSTEMS | Final Rejection | FEI Company |
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