Tech Center 2800 • Art Units: 2863 2881
This examiner grants 80% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18272948 | METHOD AND APPARATUS FOR A POLYMER ELECTROSPRAY EMITTER | Final Rejection | Massachusetts Institute of Technology |
| 18261484 | LIGHT IRRADIATOR | Final Rejection | KYOCERA CORPORATION |
| 18384253 | SEMICONDUCTOR PROCESS APPARATUS AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Company LTD |
| 18350522 | OPTICAL ELEMENT FOR REFLECTING RADIATION, AND OPTICAL ASSEMBLY | Final Rejection | Carl Zeiss SMT GmbH |
| 18419336 | TANDEM DIFFERENTIAL MOBILITY ION MOBILITY SPECTROMETRY | Non-Final OA | Hamilton Sundstrand Corporation |
| 18257941 | ION SOURCE, MASS SPECTROMETER, AND CAPILLARY INSERTION METHOD | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 18293408 | DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION | Non-Final OA | NTT, Inc. |
| 18016811 | METHOD AND APPARATUS FOR IDENTIFYING CONTAMINATION IN A SEMICONDUCTOR FAB | Final Rejection | ASML NETHERLANDS B.V. |
| 18353301 | ION BEAM IRRADIATION APPARATUS AND METHOD | Final Rejection | Nissin Ion Equipment Co., Ltd. |
| 18527998 | HYBRID ARCHITECTURE FOR QUANTUM OBJECT CONFINEMENT APPARATUS | Non-Final OA | Quantinuum LLC |
| 18237854 | NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES | Non-Final OA | APPLIED MATERIALS ISRAEL LTD. |
| 18568404 | MS Calibration for OPI-MS | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18546010 | POWER SUPPLY SYSTEMS AND METHODS | Final Rejection | Micromass UK Limited |
| 18506957 | MINIMIZATION OF ENERGY SPREAD IN FOCUSED ION BEAM (FIB) SYSTEMS | Non-Final OA | FEI Company |
| 18687085 | ADJUSTABLE BROADBAND RADAR ABSORBER | Non-Final OA | RHEIN TECH LABORATORIES INC |
| 18523158 | METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL | Non-Final OA | Bruker Daltonics GmbH & Co. KG |
| 18520783 | TERMINALLY STERILIZED ALPHA-EMITTING ISOTOPE GENERATOR AND METHOD FOR PRODUCING TERMINALLY STERILIZED ALPHA-EMITTING ISOTOPE | Non-Final OA | TAG1 Inc. |
| 18286897 | A SYSTEM TO GENERATE A HIGH YIELD OF NEGATIVE IONS FOR ICP-MS | Non-Final OA | Kimia Analytics Inc |
| 18205131 | AUTOMATED INLINE NANOPARTICLE STANDARD MATERIAL ADDITION | Final Rejection | Elemental Scientific, Inc. |
| 17927137 | AN ION SHUTTER, A METHOD OF CONTROLLING ION SHUTTER, AND DETECTION METHODS AND APPARATUS | Non-Final OA | SMITHS DETECTION-WATFORD LIMITED |
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