Prosecution Insights
Last updated: August 18, 2026

Examiner: LEE, SHUN K

Tech Center 2800 • Art Units: 2884

This examiner grants 42% of resolved cases

Performance Statistics

41.8%
Allow Rate
-26.2% vs TC avg
765
Total Applications
+15.4%
Interview Lift
1297
Avg Prosecution Days
Based on 710 resolved cases, 2023–2026

Rejection Statute Breakdown

2.3%
§101 Eligibility
14.7%
§102 Novelty
54.4%
§103 Obviousness
25.6%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18325438 DETECTOR AND MOBILE TERMINAL Non-Final OA HUAWEI TECHNOLOGIES CO., LTD.
18981774 GENERATING METHOD, SYSTEM, AND DEVICE OF SCANNING IMAGE, AND COMPUTER-READABLE STORAGE MEDIUM Non-Final OA Shanghai United Imaging Healthcare Co., Ltd.
18772245 BOLOMETER, DETECTION METHOD, AND BOLOMETER MANUFACTURING METHOD Final Rejection NEC Corporation
18547533 TIME-OF-FLIGHT POSITRON EMISSION TOMOGRAPHY DETECTOR MODULE Non-Final OA The Regents of the University of California
18589689 MEDICAL ENGINEERING APPARATUS WITH DETERMINING UNIT FOR DETERMINING A DISTANCE Final Rejection Siemens Healthineers AG
18489455 METHOD FOR MANUFACTURING A RADIATION DETECTOR MODULE AND RADIATION DETECTOR MODULE Final Rejection Siemens Healthcare GmbH
17965416 LITHIUM-ION CELL ELECTRODE CHARACTERIZATION Final Rejection LENOVO (SINGAPORE) PTE. LTD.
18771774 METHOD AND SYSTEM FOR AUTOMATIC SCAN SUBJECT POSITIONING Final Rejection GE Precision Healthcare LLC
18637171 METHODS AND SYSTEMS FOR X-RAY DETECTOR FLASH MEMORY Final Rejection GE Precision Healthcare LLC
19102963 DEVICE FOR MEASURING AN EMISSION CURRENT OF AN X-RAY TUBE Non-Final OA KONINKLIJKE PHILIPS N.V.
18998713 DIAMOND RADIATION DETECTOR Non-Final OA TOHOKU UNIVERSITY
18382094 SENSOR DEVICE Final Rejection Murata Manufacturing Co., Ltd.
18878759 RADIATION DETECTOR, INTEGRATED CIRCUIT, AND RADIATION DETECTION METHOD Non-Final OA HAMAMATSU PHOTONICS K.K.
18772689 MEASUREMENT APPARATUS AND MEASUREMENT METHOD Final Rejection Yokogawa Electric Corporation
18780724 METHOD FOR EVALUATING SiC SUBSTRATE, METHOD FOR MANUFACTURING SiC SUBSTRATE, AND SiC SUBSTRATE EVALUATION DEVICE Final Rejection Resonac Corporation

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