Tech Center 3700 • Art Units: 1794 2877 3648 3791
This examiner grants 74% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18987095 | DEVICE FOR MEASURING SEMICONDUCTORS | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18404311 | IDENTIFICATION APPARATUS BASED ON SPECTRAL IMAGING | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18443488 | HYPERSPECTRAL IMAGE SENSOR AND SYSTEM EMPLOYING THE SAME | Non-Final OA | KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
| 18404762 | INSPECTION SYSTEM WITH MULTIWAVELENGTH LIGHT SOURCE AND METHOD | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
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