Tech Center 2600 • Art Units: 2146 2666 2668
This examiner grants 68% of resolved cases
Amanda Hyeonwoo Pearson is an examiner in Tech Center 2600 and Art Unit 2146. She has handled 37 resolved cases, with an allowance rate of 67.6%. This indicates that a majority of the applications she has resolved resulted in a patent grant. The median days to allowance for these cases is 1119. A significant feature of her profile is the interview lift of 32.4%.
This high lift suggests that conducting an interview is a very effective strategy for increasing the probability of an allowance. Practitioners should strongly consider requesting an interview to address any rejections. While the case count of 37 is relatively small, these figures provide a clear indication of her examination style. The 32.4% lift suggests a substantial benefit to direct communication. The 1119 days to allowance is a key factor for applicants to consider when planning their prosecution timeline. In Art Unit 2146, this examiner's 67.6% allowance rate represents a good level of success.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19035667 | CONTROL DEVICE, CONTROL METHOD, AND STORAGE MEDIUM | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18966002 | HISTOGRAM BASED INTELLIGENT FRAME DROPPING FOR SMOOTH MOTION | Non-Final OA | QUALCOMM Incorporated |
| 18343255 | REGIONAL BRIGHTNESS CONTROL SCHEME FOR DISPLAY POWER SAVING | Non-Final OA | Intel Corporation |
| 18917297 | IMAGE INSPECTION APPARATUS, IMAGE FORMING APPARATUS, IMAGE FORMING SYSTEM, IMAGE INSPECTION METHOD, AND STORAGE MEDIUM | Non-Final OA | KONICA MINOLTA, INC. |
| 18175567 | MEDICAL IMAGE PROCESSING DEVICE AND MEDICAL OBSERVATION SYSTEM | Non-Final OA | Sony Olympus Medical Solutions Inc. |
| 18910050 | COMPUTER-READABLE RECORDING MEDIUM STORING TRAINING PROGRAM, TRAINING METHOD, AND INFORMATION PROCESSING APPARATUS | Non-Final OA | Fujitsu Limited |
| 18607527 | COMPUTING SYSTEM FOR PROVIDING A MAPPING OF A PHYSICAL QUANTITY ON A BIOLOGICAL TISSUE AND METHOD THEREOF | Final Rejection | King's College London |
| 18898866 | Defect Inspection System and Defect Inspection Method | Non-Final OA | Hitachi High-Tech Corporation |
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