Listed by the USPTO as RASTOVSKI, CATHERINE T
Tech Center 2800 • Art Units: 2857 2862 2863
This examiner grants 67% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18063637 | IDENTIFYING INFLUENTIAL DISTURBANCES FROM FAILURE OR MALFUNCTION EVENTS | Non-Final OA | International Business Machines Corporation |
| 18025774 | DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, SEMICONDUCTOR MANUFACTURING EQUIPMENT SYSTEM, AND SEMICONDUCTOR EQUIPMENT MANUFACTURING SYSTEM | Final Rejection | Hitachi High-Tech Corporation |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy67.4% of resolved applications examined by Catherine T Rastovski were allowed (322 resolved cases), compared with 72.0% across Art Unit 2857 over the last five years.
This examiner's interview lift is +28.8 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Catherine T Rastovski took 1,257 days on average from filing to allowance.
Catherine T Rastovski examines applications in Art Unit 2857 in Tech Center 2800 (Semiconductors, Circuits & Optics).