Technology areas: Chemistry & Materials • Semiconductors, Circuits & Optics
158 pending office actions • 51 art units • 116 examiners • 0 of 158 (0%) have an AI response strategy ready • 299 patents granted in the last 365 days
Hitachi High- Tech Corporation has 1 pending office action. The matter is assigned to 1 examiner, while no art-unit assignment is recorded in the profile.
IPPOLITO, NICOLE MARIE is the busiest examiner, with 1 pending matter. Counsel can therefore focus on one examination record, while the absent art-unit designation should not be used to infer a technical grouping.
Based on the USPTO statutory response window for each pending office action. 40 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 40 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 4 (3%) |
| §101 + other | 23 (15%) |
| §103 only | 39 (25%) |
| §102 only | 9 (6%) |
| §112 only | 6 (4%) |
| Double-patenting only | 1 (1%) |
| Double-patenting + other | 1 (1%) |
| Multi-statute (no §101) | 74 (47%) |
| No statute on record | 1 (1%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| THOMPSON, CURTIS A | 8 | 61.2% | +51.6% |
| WHATLEY, BENJAMIN R | 5 | 66.7% | +68.3% |
| KALISZEWSKI, ALINA ROSE | 4 | 84.6% | +23.3% |
| WRIGHT, PATRICIA KATHRYN | 4 | 65.3% | +42.6% |
| GZYBOWSKI, MICHAEL STANLEY | 4 | 67.6% | +52.2% |
| STOFFA, WYATT A | 3 | 79.3% | +22.3% |
| OSENBAUGH-STEWART, ELIZA W | 3 | 73.0% | +16.8% |
| LI, LARRY | 3 | 66.7% | +66.7% |
| OSMAN, SOMMER YOUSEF | 3 | 44.7% | +47.4% |
| SUN, CAITLYN MINGYUN | 2 | 63.7% | +11.8% |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18009890 | IMAGE PROCESSING METHOD, PATTERN INSPECTION METHOD, IMAGE PROCESSING SYSTEM, AND PATTERN INSPECTION SYSTEM | BEZUAYEHU, SOLOMON G | 224d overdue |
| 17433693 | PLASMA PROCESSING APPARATUS | REYES, JOSHUA NATHANIEL PI | 138d overdue |
| 18215350 | EVALUATION METHOD, SEARCH METHOD, AND SEARCH SYSTEM | TAN, DAVE | 119d overdue |
| 17278423 | PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD | KACKAR, RAM N | 85d overdue |
| 18279755 | PLASMA PROCESSING APPARATUS AND HEATING APPARATUS | BENNETT, CHARLEE | 60d overdue |
| 18300689 | ELECTROCHEMILUMINESCENCE METHOD OF DETECTING AN ANALYTE IN A LIQUID SAMPLE AND ANALYSIS SYSTEM | MARCSISIN, ELLEN JEAN | 45d overdue |
| 18026071 | DIAGNOSTIC APPARATUS AND DIAGNOSTIC METHOD, AND SEMICONDUCTOR MANUFACTURING APPARATUS SYSTEM AND SEMICONDUCTOR APPARATUS MANUFACTURING SYSTEM | ISLAM, MOHAMMAD K | 43d overdue |
| 18026217 | DIAGNOSTIC DEVICE, SEMICONDUCTOR MANUFACTURING EQUIPMENT SYSTEM, SEMICONDUCTOR EQUIPMENT MANUFACTURING SYSTEM, AND DIAGNOSTIC METHOD | SHAMSUZZAMAN, MOHAMMED | 28d overdue |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 16887885 | Charged Particle Beam System and Overlay Shift Amount Measurement Method | OSENBAUGH-STEWART, ELIZA W | 104d overdue |
| 18294267 | ELECTROLYTE ANALYZER AND ANALYSIS METHOD | SUN, CAITLYN MINGYUN | 24d overdue |
| 17781451 | AUTOMATIC ANALYZER | THOMPSON, CURTIS A | 5d overdue |
| 18276751 | AUTOMATIC ANALYZER AND CONTROL METHOD OF AUTOMATIC ANALYZER | GZYBOWSKI, MICHAEL STANLEY | 4d overdue |
| 17798672 | AUTOMATIC ANALYZER | WHATLEY, BENJAMIN R | 4d overdue |
| 18034929 | Vacuum Treatment Apparatus and Vacuum Treatment Method | OSENBAUGH-STEWART, ELIZA W | 5d |
| 17922869 | FILTRATION CARTRIDGE AND MICROBIAL TEST METHOD | GZYBOWSKI, MICHAEL STANLEY | 7d |
| 17910946 | AUTOMATIC ANALYSIS DEVICE | THOMPSON, CURTIS A | 8d |
| Art Unit | Apps |
|---|---|
| 1798 | 31 |
| 2881 | 19 |
| 1758 | 9 |
| 2855 | 6 |
| 1795 | 5 |
| 1797 | 5 |
| 1796 | 5 |
| 1718 | 5 |
| 2857 | 5 |
| 1713 | 4 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19164640 | Battery Deterioration Degree Management System | MORONEY, MICHAEL CORBETT | 3626 | §101§102§103§112 | Non-Final OA | — | Pending | Sep 12, 2025 |
| 19160651 | Mobile Body Control System | KNUDSON, ELLE ROSE | 3667 | §102§103§112 | Non-Final OA | — | Pending | Aug 28, 2025 |
| 19286823 | PLASMA PROCESSING APPARATUS | SATHIRAJU, SRINIVAS | 2845 | §101DP | Non-Final OA | — | Pending | Jul 31, 2025 |
| 19121155 | ION-SELECTIVE ELECTRODE, AND ELECTROLYTE CONCENTRATION MEASURING DEVICE | KAUR, GURPREET | 1795 | §102§103§112 | Non-Final OA | — | Pending | Apr 15, 2025 |
| 19095138 | Semiconductor Treating Device | TRAC, JONATHAN KHANH | — | §102§103§112 | Non-Final OA | — | Pending | Mar 31, 2025 |
| 19114828 | Model Generating Method and Defect Inspection System | VARNDELL, ROSS E | 2674 | §103 | Non-Final OA | — | Pending | Mar 25, 2025 |
| 19107258 | CONTAINER STORAGE DEVICE | MENGESHA, WEBESHET | 3763 | §103§112 | Non-Final OA | — | Pending | Feb 27, 2025 |
| 19100960 | OPTICAL DEVICE | MAHMUD, FARHAN | 2483 | §102 | Final Rejection | 39d | Pending | Feb 04, 2025 |
| 19100769 | Dimension Measurement System, Estimation System, and Dimension Measurement Method | LU, ZHIYU | 2665 | §102§103 | Non-Final OA | — | Pending | Feb 03, 2025 |
| 19099595 | PLASMA PROCESSING METHOD | DEO, DUY VU NGUYEN | 1713 | §102§103 | Non-Final OA | — | Pending | Jan 29, 2025 |
| 19099160 | SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM, SERVER, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | KHUU, HIEN DIEU THI | 2116 | §102 | Non-Final OA | — | Pending | Jan 28, 2025 |
| 18993886 | OBJECT CLASSIFICATION DEVICE, OBJECT CLASSIFICATION METHOD AND OBJECT CLASSIFICATION SYSTEM | CAI, PHUONG HAU | — | §101§102§103§112 | Non-Final OA | — | Pending | Jan 13, 2025 |
| 18993482 | ELECTROPHORESIS DEVICE | DOUMBIA, MOHAMED | 2877 | §103 | Final Rejection | — | Pending | Jan 10, 2025 |
| 18880327 | Automated Analyzer and Method of Adjusting Liquid Amount of Probe Cleaner | BERGNER, ERIN FLANAGAN | 1713 | §101§102§103§112 | Non-Final OA | — | Pending | Dec 31, 2024 |
| 19004865 | PLASMA PROCESSING APPARATUS | LU, JIONG-PING | — | §112 | Non-Final OA | — | Pending | Dec 30, 2024 |
| 18877105 | SPECIMEN CONDITION ASSESSING DEVICE, SPECIMEN CONDITION ASSESSING METHOD, AND SPECIMEN TESTING DEVICE | LU, TOM Y | 2667 | §102 | Non-Final OA | — | Pending | Dec 19, 2024 |
| 18873762 | GRIPPING DEVICE | RODRIGUEZ, SAUL | 3652 | §102§103§112 | Non-Final OA | — | Pending | Dec 11, 2024 |
| 18873963 | ANALYSIS METHOD AND CAPILLARY ELECTROPHORESIS DEVICE | NOGUEROLA, ALEXANDER STEPHAN | 1795 | §103§112 | Non-Final OA | — | Pending | Dec 11, 2024 |
| 18871231 | METHOD FOR CONTINUOUSLY USING SEPARATION MEDIUM | SUN, CAITLYN MINGYUN | 1795 | §103§112 | Non-Final OA | — | Pending | Dec 03, 2024 |
| 18864289 | ION MILLING DEVICE AND ION MILLING METHOD | KALISZEWSKI, ALINA ROSE | 2881 | §102§103§112 | Non-Final OA | — | Pending | Nov 08, 2024 |
| 18859386 | PRESSURE SENSOR | KOLB, NATHANIEL J | 2855 | §103 | Non-Final OA | — | Pending | Oct 23, 2024 |
| 18857632 | ION GUIDE AND MASS SPECTROMETER | MCCORMACK, JASON L | 2881 | §102§112 | Non-Final OA | — | Pending | Oct 17, 2024 |
| 18856757 | CHARGED PARTICLE BEAM DEVICE AND METHOD FOR OUTPUTTING IMAGE DATA OF INTEREST | STOFFA, WYATT A | 2881 | §101§102§112 | Non-Final OA | — | Pending | Oct 14, 2024 |
| 18855724 | Imaging System and Imaging Method | CHOI, JAMES J | 2878 | §103§112 | Non-Final OA | — | Pending | Oct 10, 2024 |
| 18853920 | AUTOMATIC ANALYSIS SYSTEM AND MOBILE TERMINAL | EYASSU, MARRIT | 2855 | §103 | Non-Final OA | — | Pending | Oct 03, 2024 |
| 18853245 | BIOLOGICAL SAMPLE MEASUREMENT DEVICE | MEGNA FUENTES, ANTHONY W | 2855 | §103 | Non-Final OA | — | Pending | Oct 01, 2024 |
| 18896372 | ETCHING METHOD | CULBERT, ROBERTS P | 1716 | DP | Non-Final OA | — | Pending | Sep 25, 2024 |
| 18848611 | Automatic Analysis Device | TRAN, TRAN M. | 2855 | §103§112 | Non-Final OA | — | Pending | Sep 19, 2024 |
| 18848208 | Analysis System, Analysis Method, and Analysis Program | MALEVIC, DJURA | 2884 | §103 | Final Rejection | — | Pending | Sep 18, 2024 |
| 18847379 | EVALUATION APPARATUS AND EVALUATION METHOD | PATEL, JIGNESHKUMAR C | 2116 | §101 | Non-Final OA | — | Pending | Sep 16, 2024 |
| 18843158 | Analysis System, Analysis Method, and Analysis Program | OSENBAUGH-STEWART, ELIZA W | 2881 | §103§112 | Non-Final OA | — | Pending | Aug 30, 2024 |
| 18840098 | ELECTROLYTE ANALYSIS DEVICE | TRAN, VIVIAN AILINH | 1794 | §101§103§112 | Final Rejection | 27d | Pending | Aug 21, 2024 |
| 18839950 | COMMUNICATION CONTROL DEVICE AND CONTROL COMMUNICATION SYSTEM | AL SAMAHI, SANAA SHAKER ABED | 2463 | §103 | Non-Final OA | — | Pending | Aug 20, 2024 |
| 18838013 | Ion Milling Device | GASSEN, CHRISTOPHER J | 2881 | §103§112 | Final Rejection | — | Pending | Aug 13, 2024 |
| 18837212 | AUTOMATIC ANALYSIS SYSTEM | WASHINGTON, BRITNEY NICOLE | 1797 | §102§112 | Non-Final OA | — | Pending | Aug 09, 2024 |
| 18726091 | CONVEYING DEVICE AND CONVEYING METHOD | COOK, CORTEZ M | 2846 | §101§102 | Final Rejection | — | Pending | Jul 01, 2024 |
| 18723771 | CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD | WRIGHT, PATRICIA KATHRYN | 1798 | §103§112 | Non-Final OA | — | Pending | Jun 24, 2024 |
| 18719916 | Charged Particle Beam Device | SMITH, DAVID E | 2881 | §103 | Final Rejection | — | Pending | Jun 14, 2024 |
| 18720377 | SAMPLE SORTING SYSTEM | RIVERA, WILLIAM ARAUZ | 3654 | §103 | Non-Final OA | — | Pending | Jun 14, 2024 |
| 18738425 | PHYSICAL PROPERTY INFORMATION RETRIEVAL SYSTEM, PHYSICAL PROPERTY INFORMATION RETRIEVAL METHOD, AND STORAGE MEDIUM STORING PHYSICAL PROPERTY INFORMATION RETRIEVAL PROGRAM | TRAN, TAN H | 2141 | §102§103 | Non-Final OA | — | Pending | Jun 10, 2024 |
| 18717570 | AUTOMATIC ANALYZER | WRIGHT, PATRICIA KATHRYN | 1798 | §101§112 | Final Rejection | — | Pending | Jun 07, 2024 |
| 18713248 | METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER | KALISZEWSKI, ALINA ROSE | 2881 | §102§103§112 | Non-Final OA | — | Pending | May 24, 2024 |
| 18713240 | Automatic Analyzer and Control Method Thereof | KOLB, NATHANIEL J | 2855 | §102§103§112 | Non-Final OA | — | Pending | May 24, 2024 |
| 18713129 | TEMPERATURE CONTROL DEVICE | HINCAPIE SERNA, GUSTAVO A | 3763 | §102§103 | Final Rejection | — | Pending | May 23, 2024 |
| 18669862 | ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERATING SCHOTTKY EMITTER | STOFFA, WYATT A | 2881 | §102§103§112 | Final Rejection | — | Pending | May 21, 2024 |
| 18668327 | PHOTOELECTRON EMISSION MICROSCOPE | LI, LARRY | 2881 | §103 | Final Rejection | — | Pending | May 20, 2024 |
| 18710305 | AUTOMATIC ANALYSIS DEVICE | NGUYEN, HENRY H | 1758 | §103§112 | Non-Final OA | — | Pending | May 15, 2024 |
| 18706851 | Automated Analysis Device | CHIU, MAY LEUNG | 1758 | §103§112 | Non-Final OA | — | Pending | May 02, 2024 |
| 18706775 | Automatic Analyzer | KRCHA, MATTHEW D | 1796 | §103 | Non-Final OA | — | Pending | May 02, 2024 |
| 18645626 | AUTOMATIC ANALYZER | WRIGHT, PATRICIA KATHRYN | 1798 | Other | Final Rejection | 56d | Pending | Apr 25, 2024 |
IP Author helps IP teams respond to office actions faster with AI-generated responses, examiner analytics, and prosecution intelligence.
Start Free TrialHitachi High-Tech Corporation has 158 pending office actions as of October 2026, spread across 51 art units and 116 examiners.
Curtis A Thompson has the most, with 8 of Hitachi High-Tech Corporation's pending office actions.
Mostly Chemistry & Materials (USPTO Tech Center 1700), based on where its pending office actions are examined.
