Listed by the USPTO as SCHINDLER, DAVID M
Tech Center 2800 • Art Units: 2858 2862
This examiner grants 41% of resolved cases
SCHINDLER, DAVID M has 623 resolved cases and an allowance rate of 40.6%. The median time to allowance is 1413 days. Interviews correspond to a 23.8% lift in the allowance rate, giving applicants a reason to consider direct examiner discussion while preparing for a difficult prosecution path. The timing measure supports early planning for continued examination activity before allowance.
The listed companies are TDK Corporation, Denso Corporation, and Texas Instruments Incorporated. The listed firms are OLIFF PLC, Harrity & Harrity, LLP, and Precision Patents, P.C. These organizations identify the applicant and counsel experience represented in the examiner’s resolved matters and can guide targeted review of related portfolios.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18716507 | DEVICE FOR MEASURING THE OXIDATION OF A BRAKE DISC BY MEANS OF DIAMAGNETISM MEASUREMENT | Final Rejection | SAFRAN LANDING SYSTEMS |
| 18900952 | DOWNHOLE MEASUREMENT SYSTEM | Final Rejection | Schlumberger Technology Corporation |
| 18513193 | RECONFIGURABLE ANTENNAS AND ELECTRODES | Final Rejection | Halliburton Energy Services, Inc. |
| 18940254 | Battery Management Apparatus, Battery Management Method, and Vehicle | Final Rejection | LG Energy Solution, Ltd. |
| 18247001 | SYSTEM AND METHOD FOR SUPPRESSING LOW FREQUENCY MAGNETIC NOISE IN MAGNETO-RESISTIVE SENSORS | Final Rejection | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE |
| 19051294 | MAGNETIC DETECTION DEVICE, MAGNETIC DETECTION MODULE, MAGNETIC DETECTION SYSTEM, GEAR DRIVING DETECTION DEVICE, MOTOR DRIVING DETECTION DEVICE, AND ENCODER | Non-Final OA | TDK Corporation |
| 18664446 | MAGNETORESISTIVE DEVICE AND METHOD FOR MANUFACTURING THE SAME, AND MAGNETIC SENSOR | Final Rejection | TDK Corporation |
| 17948486 | MAGNETIC SENSOR | Final Rejection | TDK CORPORATION |
| 18620689 | DETECTION DEVICE | Final Rejection | DENSO CORPORATION |
| 18620073 | HALL SENSOR WITH MAGNETIC CONCENTRATORS | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18193099 | HALL SENSOR WITH MAGNETIC FLUX CONCENTRATOR | Final Rejection | TEXAS INSTRUMENTS INCORPORATED |
| 18745997 | TESTING DEVICE FOR TESTING SEMICONDUCTORS AND METHODS OF FABRICATION | Final Rejection | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 18137593 | RAIL STATE MONITORING APPARATUS AND RAIL STATE MONITORING METHOD | Non-Final OA | Hitachi, Ltd. |
| 18948933 | DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORBIT TORQUE EFFECT | Non-Final OA | Infineon Technologies AG |
| 18883261 | VEHICLE OPERATION WITH PHYSIOLOGICAL MONITORING | Final Rejection | Masimo Corporation |
| 19057624 | HIGH PRECISION ANGULAR MEASUREMENT SYSTEM | Non-Final OA | Analog Devices International Unlimited Company |
| 18475135 | MAGNETORESISTIVE SENSOR | Non-Final OA | Analog Devices International Unlimited Company |
| 18033244 | ELECTROMAGNETIC INSPECTION DEVICE CAPABLE OF CALIBRATION | Non-Final OA | POSCO Co., Ltd |
| 19039229 | ABSOLUTE ENCODER | Non-Final OA | MINEBEA MITSUMI Inc. |
| 18625939 | POSITION DETECTION DEVICE | Non-Final OA | Proterial, Ltd. |
| 16935432 | Systems and Methods for MOKE Metrology with Consistent MRAM Die Orientation | Non-Final OA | KLA Corporation |
| 18475674 | INDUCTIVE 360-DEGREE ANGLE SENSOR USING A RADIALLY-SEPARATED DUAL TARGET | Final Rejection | Allegro MicroSystems, LLC |
| 18371883 | HOLOGRAPHIC ELECTROMAGNETIC EXPLORATION METHOD BASED ON FULL-AREA OBSERVATION ALTERNATING COVERAGE INTEGRAL-DIFFERENCE MIXED STIMULUS | Final Rejection | Central South University |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy40.6% of resolved applications examined by David M Schindler were allowed (623 resolved cases), compared with 83.6% across Art Unit 2858 over the last five years.
This examiner's interview lift is +23.8 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by David M Schindler took 1,413 days on average from filing to allowance.
David M Schindler examines applications in Art Unit 2858 in Tech Center 2800 (Semiconductors, Circuits & Optics).
