Tech Center 3700 • Art Units: 2855 3754 3794
This examiner grants 75% of resolved cases
Tran M. Tran is an examiner in Tech Center 3700 and Art Unit 2855. The record includes 643 resolved cases. The allowance rate is 74.8 percent, which represents the frequency of grants for applications. These 643 resolved cases provide the data set for the examiner's historical performance. This volume of resolved cases forms the basis for the current metrics.
The interview lift is 23.4 percent, which measures the change in allowance probability after an interview. The median days to allowance is 932, which is the duration for successful prosecution. In Art Unit 2855, these metrics offer a view of the examiner's past outcomes.
Practitioners should consider the 23.4 percent interview lift when planning their strategy. The 74.8 percent allowance rate and the 932 median days to allowance are factors for managing expectations. These data points from Tech Center 3700 help in understanding the prosecution environment.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18834885 | GYRO SENSOR | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18827921 | SENSOR SYSTEM WITH A MEMS GYROSCOPE AND METHOD FOR OPERATING A SENSOR SYSTEM WITH A MEMS GYROSCOPE | Non-Final OA | Robert Bosch GmbH |
| 18590771 | PIEZOELECTRIC MEMS CONTACT DETECTION SYSTEM | Non-Final OA | QUALCOMM Incorporated |
| 18735207 | APPARATUS FOR GAS SAMPLE COLLECTION | Non-Final OA | THE UNIVERSITY OF BRITISH COLUMBIA |
| 18843934 | WIND SPEED AND DIRECTION MEASUREMENT SYSTEM AND DEVICE | Non-Final OA | Ohio State Innovation Foundation |
| 18863473 | ROCK PROPERTIES MEASUREMENT CELL AND ASSOCIATED ROCK PROPERTIES MEASUREMENT SYSTEM | Non-Final OA | TotalEnergies OneTech |
| 18862648 | METHOD FOR PREPARING A ROCK SAMPLE WITH A TARGET INITIAL FIRST FLUID SATURATION PROFILE ALONG A ROCK SAMPLE AXIS | Non-Final OA | TotalEnergies OneTech |
| 18851750 | Method for Ascertaining the Fill Level of a Pipe, Analysis Unit, Flow Measuring System, and Computer Program Product | Non-Final OA | Siemens Aktiengesellschaft |
| 18848611 | Automatic Analysis Device | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 18852435 | STATE MONITORING SYSTEM AND PROGRAM OF INSPECTION EQUIPMENT | Non-Final OA | KYB Corporation |
| 17538782 | SEMICONDUCTOR FORCE SENSORS | Non-Final OA | TEXAS INSTRUMENTS INCORPORATED |
| 18597775 | PIEZO ELEMENT DIAGNOSIS DEVICE, PIEZO ELEMENT DIAGNOSIS METHOD, PIEZO ELEMENT DIAGNOSIS PROGRAM, FLUID CONTROL DEVICE, AND VAPORIZATION SYSTEM | Final Rejection | HORIBA STEC, Co., Ltd. |
| 18717047 | ADHESIVE DISPENSING SYSTEMS AND METHODS | Non-Final OA | 3M INNOVATIVE PROPERTIES COMPANY |
| 18718438 | METHOD FOR LEAK SOURCE LOCATION INVESTIGATION | Non-Final OA | Molex, LLC |
| 18848505 | MONITORING SYSTEMS AND MONITORING METHODS FOR PNEUMATICALLY ACTUATED DOOR | Non-Final OA | Nanyang Technological University |
| 18847800 | SENSOR FOR LOCATING INTERFACE POSITION, AND LIQUID LEVEL GAUGE | Non-Final OA | JAPAN AVIATION ELECTRONICS INDUSTRY, LIMITED |
| 18819415 | SYSTEMS, METHODS, AND DEVICES FOR NEUROLOGICAL AND/OR MUSCULOSKELETAL PARAMETER CHARACTERIZATION | Non-Final OA | GS-HealthMatrix, LLC |
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