Listed by the USPTO as WANG, JING
Tech Center 3600 • Art Units: 2844 2881 3646 3685
This examiner grants 100% of resolved cases
WANG, JING works in Tech Center 3600 and Art Unit 2844. The record contains 11 resolved cases, with a 100.0% allowance rate and a median of 921 days to allowance. Every resolved matter in this limited record reached allowance, while the median timing indicates that allowance still required more than two years.
The interview lift is 0.0%, showing no measured association between interviews and allowance in the available matters. The leading companies are ASML Holding N.V., SHIMADZU Corporation, and Dh Technologies Development Pte. Ltd. The leading firms are GOODWIN PROCTER LLP, RENNER, OTTO, BOISSELLE & SKLAR, LLP, and THE WEBB LAW FIRM, P.C. Because the sample is small, practitioners should avoid treating the allowance result as predictive and should maintain disciplined written prosecution.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18833957 | UV-B LIGHT GENERATING SYSTEM | Non-Final OA | SIGNIFY HOLDING B.V. |
| 18940959 | Charged Particle Beam Apparatus | Non-Final OA | Hitachi, Ltd. |
| 18910644 | PARTICLE BEAM SYSTEM WITH COOLING SYSTEM | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 18722784 | SAMPLE SUPPORT BODY AND METHOD FOR MANUFACTURING SAMPLE SUPPORT BODY | Final Rejection | HAMAMATSU PHOTONICS K.K. |
| 18868113 | ELECTRON-OPTICAL APPARATUS AND METHOD OF OBTAINING TOPOGRAPHICAL INFORMATION ABOUT A SAMPLE SURFACE | Non-Final OA | ASML NETHERLANDS B.V. |
| 18866014 | METHOD AND SYSTEM FOR FINE FOCUSING SECONDARY BEAM SPOTS ON DETECTOR FOR MULTI-BEAM INSPECTION APPARATUS | Non-Final OA | ASML Netherlands B.V. |
| 18691828 | SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATION AND IDENTIFICATION IN A CHARGED PARTICLE SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18710286 | INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER | Final Rejection | SHIMADZU CORPORATION |
| 18699230 | MASS SPECTROMETER | Final Rejection | SHIMADZU CORPORATION |
| 18541196 | ION GENERATOR, MASS SPECTROMETER AND METHOD OF GENERATING IONS | Final Rejection | SHIMADZU CORPORATION |
| 18645058 | Radiation Effects Testing System with a Beam Accelerator | Non-Final OA | SHINE Technologies, LLC |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy100.0% of resolved applications examined by Jing Wang were allowed (11 resolved cases), compared with 72.3% across Art Unit 2844 over the last five years.
This examiner's interview lift is +0.0 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Jing Wang took 921 days on average from filing to allowance.
Jing Wang examines applications in Art Unit 2844 in Tech Center 3600 (Transportation, E-Commerce & Mechanical Systems).
