Prosecution Insights
Last updated: October 02, 2026

Examiner: ZHANG, HAIDONG

Tech Center 2800 • Art Units: 2857 2858

This examiner grants 81% of resolved cases

Analysis

Haidong Zhang works in Art Unit 2857 of Tech Center 2800. He has 476 resolved cases and an allowance rate of 81.1 percent. This 81.1 percent rate indicates a probability of success for applicants. The median days to allowance is 1077. This 1077-day figure serves as a benchmark for prosecution timing. Practitioners should use this metric to manage client expectations regarding the process in Tech Center 2800.

The interview lift is 12.5 percent. This 12.5 percent lift suggests that interviews are a way to resolve remaining issues and secure a grant. With 476 resolved cases, the 81.1 percent allowance rate is an indicator for Art Unit 2857. The 12.5 percent lift indicates that the examiner is open to verbal arguments. The 1077-day median is a specific point of reference for the duration of the patent grant process. The data suggests a consistent environment for those appearing before this examiner.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

81.1%
Allow Rate
+13.1% vs TC avg
491
Total Applications
+12.5%
Interview Lift
1077
Avg Prosecution Days
Based on 476 resolved cases, 2023–2026

Rejection Statute Breakdown

13.3%
§101 Eligibility
7.4%
§102 Novelty
48.2%
§103 Obviousness
23.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18216667 OVERLOAD CAPABILITY AND REMAINING LIFE OF AN ELECTRICAL ASSET Non-Final OA Eaton Intelligent Power Limited
18393336 METHOD AND APPARATUS FOR DIAGNOSING DEFECTIVE BATTERY PACK ASSEMBLY Non-Final OA Samsung SDI Co., Ltd.
18284934 PARTIAL DISCHARGE DETERMINATION APPARATUS AND PARTIAL DISCHARGE DETERMINATION METHOD Non-Final OA HITACHI, LTD.
18355011 SYSTEMS AND METHODS FOR ABNORMAL POWER CONNECTION DETECTION Non-Final OA Advanced Micro Devices, Inc.
18800842 APPARATUSES AND METHODS FOR TESTING SEMICONDUCTOR CIRCUITRY USING MICROELECTROMECHANICAL SYSTEMS SWITCHES Non-Final OA Analog Devices International Unlimited Company
19212337 DISTRIBUTED TEST PATTERN GENERATION AND SYNCHRONIZATION Non-Final OA Synopsys, Inc.
18619080 TEST SOCKET AND METHOD FOR FABRICATING THE SAME Non-Final OA LEENO INDUSTRIAL INC.

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