Tech Center 2800 • Art Units: 2818 2837 2858 2868
This examiner grants 82% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18487593 | SPIN VALVE DEVICE AND METHOD FOR FORMING A SPIN VALVE DEVICE | Non-Final OA | Infineon Technologies AG |
| 18745999 | TESTING DEVICE FOR TESTING SEMICONDUCTORS | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 19192341 | SELF-CALIBRATING HIGH ACCURACY RADIO FREQUENCY POWER SENSOR | Final Rejection | Bird Technologies Group Inc. |
| 18640788 | Method of self-calibration current sensor | Non-Final OA | HONEYWELL INTERNATIONAL INC. |
| 18768695 | MAGNETIC SENSOR | Non-Final OA | TDK CORPORATION |
| 18667089 | SENSOR DEVICE | Non-Final OA | SKF Lubrication Systems Germany GmbH |
| 18625816 | YAW CONTROL FAULT DETECTION SYSTEM | Final Rejection | Inventus Holdings, LLC |
| 18726200 | Dielectric Spectroscopy Sensor | Non-Final OA | Nippon Telegraph and Telephone Corporation |
| 18506525 | CIRCUITRY FOR MEASUREMENT OF ELECTROCHEMICAL CELLS | Final Rejection | Cirrus Logic International Semiconductor Ltd. |
| 18671982 | CORRECTION SYSTEM AND METHOD FOR SEMICONDUCTOR CIRCUIT | Non-Final OA | Realtek Semiconductor Corporation |
| 18766001 | Device and Method for Sensing an Electrical Property of a Test Sample | Non-Final OA | Stichting IMEC Nederland |
| 18607592 | BATTERY MONITORING DEVICE | Non-Final OA | LAPIS Technology Co., Ltd. |
| 18609375 | GMR LAYOUT FOR COMPACT TRANSDUCER WITH MISMATCH CONTROL | Final Rejection | Allegro MicroSystems, LLC |
| 18677854 | TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOF | Non-Final OA | He Chou Technology INC. |
| 18651272 | Lightweight Magnetic Resonance Imaging Systems With Improved Portability And Reduced Eddy Current Induction | Final Rejection | Zepp Europe Holding B.V. |
| 18376886 | COMPENSATING A HARMONIC | Non-Final OA | TDK - Micronas GmbH |
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