Tech Center 2100 • Art Units: 2111 2117 2122
This examiner grants 95% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18744322 | PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER | Final Rejection | Texas Instruments Incorporated |
| 19046319 | MEMORY REPAIR FLAG TOKEN COUNTER | Non-Final OA | Micron Technology, Inc. |
| 18878237 | MODULAR RYDBERG ARCHITECTURES FOR FAULT TOLERANT QUANTUM COMPUTING | Non-Final OA | Massachusetts Institute of Technology |
| 18991656 | METHOD FOR ERROR CORRECTION CODING WITH MULTIPLE HASH GROUPINGS AND DEVICE FOR PERFORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18984990 | DETERMINING HEALTH OF A NON-VOLATILE MEMORY DEVICE BASED ON A PREDETERMINED DATA PATTERN | Non-Final OA | Microchip Technology Incorporated |
| 18893070 | METHOD AND APPARATUS FOR FLEXIBLE ON-CHIP MEMORY CONFIGURATION TO SUPPORT MULTIPLE ERROR DETECTION AND CORRECTION MECHANISMS | Final Rejection | Marvell Asia Pte Ltd |
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