Tech Center 2800 • Art Units: 2872 2878 2881
This examiner grants 86% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18526286 | DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER DIFFRACTION PATTERNS | Non-Final OA | Katholieke Universiteit Leuven |
| 18822120 | SYSTEMS AND METHODS FOR DISINFECTION | Final Rejection | P Tech, LLC |
| 18524043 | ION BEAM CURRENT MEASUREMENT DEVICE AND ION BEAM IMPLANTATION SYSTEM | Non-Final OA | Infineon Technologies AG |
| 18563569 | ION FOCUSING AND MANIPULATION | Non-Final OA | Purdue Research Foundation |
| 18203356 | MASS SPECTROMETER | Final Rejection | SHIMADZU CORPORATION |
| 18391797 | BEARING SYSTEM, LITHOGRAPHY SYSTEM, AND METHOD FOR PRODUCING A BEARING SYSTEM | Non-Final OA | Carl Zeiss SMT GmbH |
| 18678254 | METHODS OF GENERATING EXTREME ULTRAVIOLET RADIATION | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18118023 | EUV SOURCE STABILIZATION APPARATUS AND METHOD | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 18274047 | Lamella Mounting Method, and Analysis System | Final Rejection | Hitachi High-Tech Corporation |
| 18280917 | TARGET MATERIAL TRANSFER SYSTEM COMPONENTS AND METHODS OF MAKING THE SAME | Non-Final OA | ASML Netherlands B.V. |
| 18150745 | CHARGED-PARTICLE MULTI-BEAM COLUMN, CHARGED-PARTICLE MULTI-BEAM COLUMN ARRAY, INSPECTION METHOD | Final Rejection | ASML Netherlands B.V. |
| 18011593 | APPARATUS FOR AND METHOD OF ACCELERATING DROPLETS IN A DROPLET GENERATOR FOR AN EUV SOURCE | Non-Final OA | ASML Netherlands B.V. |
| 18404400 | DEVICE FOR CONTROLLING TRAPPED IONS | Non-Final OA | Infineon Technologies Austria AG |
| 18391947 | COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY | Non-Final OA | FEI COMPANY |
| 18572776 | ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METHOD, AND RECORDING MEDIUM | Non-Final OA | IMS Nanofabrication GmbH |
| 18018960 | EXTREME ULTRAVIOLET LIGHT SOURCE APPARATUS | Non-Final OA | USHIO DENKI KABUSHIKI KAISHA |
| 18280542 | Bifurcated Mass Spectrometer | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18247799 | High Resolution Detection to Manage Group Detection for Quantitative Analysis by MS/MS | Final Rejection | DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
| 18422052 | ULTRAVIOLET LIGHT DISINFECTANT DEVICE | Non-Final OA | NORTHLIGHT ELECTRIC COMPANY LIMITED |
| 18517515 | SCALABLE NEUTRAL ATOM BASED QUANTUM COMPUTING | Non-Final OA | Atom Computing Inc. |
| 18329325 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS | Non-Final OA | FRACTILIA, LLC |
| 18099316 | RADIOTHERAPY SYSTEM AND METHOD FOR CONTROLLING SAFETY INTERLOCK THEREOF | Non-Final OA | NEUBORON THERAPY SYSTEM LTD. |
| 17357893 | HANDHELD UV-C SANITIZING APPARATUS AND METHOD | Non-Final OA | Crosby Innovations, LLC |
| 18091808 | CHARGED PARTICLE BEAM COLUMN, CHARGED PARTICLE BEAM CHROMATIC ABERRATION CORRECTOR, AND METHOD OF CORRECTING CHARGED PARTICLE BEAM CHROMATIC ABERRATION | Final Rejection | ICT Integrated Circuit Testing Gesellschaft für Halbleiterpüftechnik mbH |
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