Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2878 2881
This examiner grants 68% of resolved cases
James J Choi serves in Tech Center 2800 and Art Unit 2878. The examiner has 401 resolved cases and an allowance rate of 67.8%. This rate indicates that about two-thirds of applications result in a grant, providing a generally positive outlook for applicants. The median days to allowance is 1038, which reflects the typical time required to reach a successful conclusion in this technical area.
The interview lift for this examiner is 45.4%, which is a very high figure. This indicates that the probability of allowance increases substantially when an interview is held. When compared to the 67.8% baseline, the 45.4% lift demonstrates that direct communication is an exceptionally effective tactic for addressing examiner concerns and securing a grant. Practitioners should consider interviews as a primary strategy for moving applications forward in Art Unit 2878.
With 401 resolved cases, the data provides a solid foundation for understanding the examiner's tendencies. The 67.8% allowance rate and 1038 median days to allowance are the key indicators for practitioners in Tech Center 2800. The 45.4% interview lift stands out as a clear recommendation for applicants to engage the examiner directly to maximize their chances of a favorable and efficient outcome.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18520472 | SOURCE VESSEL FOR EUV | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18458075 | SEMICONDUCTOR DEVICE | Final Rejection | Toshiba Electronic Devices & Storage Corporation |
| 18855724 | Imaging System and Imaging Method | Non-Final OA | Hitachi High-Tech Corporation |
| 18716990 | Ion Milling Device | Final Rejection | Hitachi High-Tech Corporation |
| 17953411 | DEVICE FOR CONTROLLING TRAPPED IONS WITH REINFORCED ION TRAP METAL LAYER | Non-Final OA | Infineon Technologies Austria AG |
| 18728105 | SPECIMEN SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18213765 | ELECTRON-OPTICAL DEVICE | Non-Final OA | ASML Netherlands B.V. |
| 18134020 | APERTURE PATTERNS FOR DEFINING MULTI-BEAMS | Non-Final OA | ASML Netherlands B.V. |
| 18123210 | OBJECTIVE LENS ARRAY ASSEMBLY, ELECTRON-OPTICAL SYSTEM, ELECTRON-OPTICAL SYSTEM ARRAY, METHOD OF FOCUSING, OBJECTIVE LENS ARRANGEMENT | Non-Final OA | ASML Netherlands B.V. |
| 18923770 | Charged Particle Gun and Charged Particle Beam System | Non-Final OA | JEOL Ltd. |
| 17825230 | Mass Spectrometer Utilizing Mass Spectral Database Search for Compound Identification | Non-Final OA | Thermo Finnigan LLC |
| 18955676 | TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE EFFECTIVE FOCAL LENGTH | Non-Final OA | FEI Company |
| 17958174 | Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle Systems | Non-Final OA | FEI Company |
| 17957171 | CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER | Final Rejection | FEI COMPANY |
| 17948531 | APPARATUS AND METHOD FOR AUTOMATED GRID VALIDATION | Final Rejection | FEI Company |
| 18464063 | METHOD OF CONTROLLING A MULTI-POLE DEVICE TO REDUCE OMISSION OF EXITING CHARGED PARTICLES FROM DOWNSTREAM ANALYSIS | Final Rejection | WATERS TECHNOLOGIES CORPORATION |
| 17974331 | Systems, Devices, and Methods for Converting a Neutron Beam | Final Rejection | TAE Life Sciences, LLC |
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