Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2878 2881
This examiner grants 67% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18162959 | Compact Atomic Beam Generator | Non-Final OA | Georgia Tech Research Corporation |
| 18454285 | OPTOELECTROFLUIDIC DEVICE FOR MASSIVE PARALLEL TRAPPING AND ENHANCED SPECTROSCOPY OF SINGLE NANOSCALE OBJECTS | Non-Final OA | Vanderbilt University |
| 18131271 | APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM | Final Rejection | Applied Materials, Inc. |
| 18458075 | SEMICONDUCTOR DEVICE | Non-Final OA | Toshiba Electronic Devices & Storage Corporation |
| 18456304 | GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM | Non-Final OA | Carl Zeiss SMT GmbH |
| 18277353 | Atom Beam Generation Device, Physical Package, Optical Lattice Clock Physical Package, Atomic Clock Physical Package, Atomic Interferometer Physical Package, Quantum Information Processing Device Physical Package, and Physical Package System | Final Rejection | RIKEN |
| 18038476 | Slow Atomic Beam Generator, Physical Package, Physical Package for Optical Lattice Clock, Physical Package for Atomic Clock, Physical Package for Atomic Interferometer, Physical Package for Quantum Information Processing Device, and Physical Package System | Final Rejection | RIKEN |
| 18464243 | DIRECT WRITING SYSTEM USED FOR ELECTRON BEAM LITHOGRAPHY | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17348031 | TUNING APPARATUS FOR MINIMUM DIVERGENCE ION BEAM | Final Rejection | Axcelis Technologies, Inc. |
| 18128405 | Charged Particle Beam Device | Final Rejection | Hitachi High-Tech Corporation |
| 18127864 | Charged Particle Beam System | Final Rejection | Hitachi High-Tech Corporation |
| 18127858 | Processing System and Charged Particle Beam Apparatus | Final Rejection | Hitachi High-Tech Corporation |
| 18369619 | FLOOD COLUMN AND CHARGED PARTICLE APPARATUS | Final Rejection | ASML Netherlands B.V. |
| 18209445 | CHARGED PARTICLE SYSTEM, METHOD OF PROCESSING A SAMPLE USING A MULTI-BEAM OF CHARGED PARTICLES | Non-Final OA | ASML Netherlands B.V. |
| 18134020 | APERTURE PATTERNS FOR DEFINING MULTI-BEAMS | Non-Final OA | ASML Netherlands B.V. |
| 17989195 | METHOD FOR FOCUSING AND OPERATING A PARTICLE BEAM MICROSCOPE | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 18477251 | METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE | Non-Final OA | FEI Company |
| 17957171 | CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER | Non-Final OA | FEI COMPANY |
| 18276172 | Mass and Kinetic Energy Ordering of Ions Prior to Orthogonal Extraction Using Dipolar DC | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18464063 | METHOD OF CONTROLLING A MULTI-POLE DEVICE TO REDUCE OMISSION OF EXITING CHARGED PARTICLES FROM DOWNSTREAM ANALYSIS | Non-Final OA | WATERS TECHNOLOGIES CORPORATION |
| 18251934 | Removable Ion Source Capable Of Axial Or Cross Beam Ionization | Non-Final OA | THERMO FINNIGAN LLC |
| 18267356 | DEVICE FOR DISINFECTING A FLUID FLOW IN A CONDUIT BY MEANS OF UV-C RADIATION | Final Rejection | ISTITUTO NAZIONALE DI ASTROFISICA |
| 18352733 | MASS SPECTROMETRY DEVICE WITH SEGMENTED AND GRADUAL ION TRANSPORT CHANNEL | Final Rejection | Hangzhou Calibra TECHNOLOGIES Co., Ltd. |
| 17779796 | ELECTRON BEAM RADIATION SYSTEM WITH ADVANCED APPLICATOR COUPLING SYSTEM HAVING INTEGRATED DISTANCE DETECTION AND TARGET ILLUMINATION | Final Rejection | INTRAOP MEDICAL CORPORATION |
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