Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2878 2881
This examiner grants 68% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18458075 | SEMICONDUCTOR DEVICE | Final Rejection | Toshiba Electronic Devices & Storage Corporation |
| 18162959 | Compact Atomic Beam Generator | Non-Final OA | Georgia Tech Research Corporation |
| 18454285 | OPTOELECTROFLUIDIC DEVICE FOR MASSIVE PARALLEL TRAPPING AND ENHANCED SPECTROSCOPY OF SINGLE NANOSCALE OBJECTS | Final Rejection | Vanderbilt University |
| 18855724 | Imaging System and Imaging Method | Non-Final OA | Hitachi High-Tech Corporation |
| 18128405 | Charged Particle Beam Device | Final Rejection | Hitachi High-Tech Corporation |
| 18464243 | DIRECT WRITING SYSTEM USED FOR ELECTRON BEAM LITHOGRAPHY | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18477251 | METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE | Non-Final OA | FEI Company |
| 17958174 | Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle Systems | Non-Final OA | FEI Company |
| 17948531 | APPARATUS AND METHOD FOR AUTOMATED GRID VALIDATION | Final Rejection | FEI Company |
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