Tech Center 2800 • Art Units: 2878 2881
This examiner grants 67% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18454285 | OPTOELECTROFLUIDIC DEVICE FOR MASSIVE PARALLEL TRAPPING AND ENHANCED SPECTROSCOPY OF SINGLE NANOSCALE OBJECTS | Non-Final OA | Vanderbilt University |
| 18464243 | DIRECT WRITING SYSTEM USED FOR ELECTRON BEAM LITHOGRAPHY | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18458075 | SEMICONDUCTOR DEVICE | Non-Final OA | Toshiba Electronic Devices & Storage Corporation |
| 18456304 | GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM | Non-Final OA | Carl Zeiss SMT GmbH |
| 18038476 | Slow Atomic Beam Generator, Physical Package, Physical Package for Optical Lattice Clock, Physical Package for Atomic Clock, Physical Package for Atomic Interferometer, Physical Package for Quantum Information Processing Device, and Physical Package System | Final Rejection | RIKEN |
| 17348031 | TUNING APPARATUS FOR MINIMUM DIVERGENCE ION BEAM | Final Rejection | Axcelis Technologies, Inc. |
| 18128405 | Charged Particle Beam Device | Non-Final OA | Hitachi High-Tech Corporation |
| 18127864 | Charged Particle Beam System | Final Rejection | Hitachi High-Tech Corporation |
| 18127858 | Processing System and Charged Particle Beam Apparatus | Final Rejection | Hitachi High-Tech Corporation |
| 18364588 | Warm Wafer After Ion Cryo-Implantation | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 17781485 | CHARGE FILTER ARRANGEMENT AND APPLICATIONS THEREOF | Final Rejection | THE TRUSTEES OF INDIANA UNIVERSITY |
| 17989195 | METHOD FOR FOCUSING AND OPERATING A PARTICLE BEAM MICROSCOPE | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 17891473 | ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND | Final Rejection | APPLIED MATERIALS ISRAEL LTD. |
| 18281722 | System and Method for Variable FFT Analysis Windows in Mass Spectrometry | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18174467 | SYSTEMS, DEVICES, AND METHODS FOR MULTI-DIRECTIONAL DIPOLE MAGNETS AND COMPACT BEAM SYSTEMS | Non-Final OA | TAE TECHNOLOGIES, INC. |
| 18477251 | METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE | Non-Final OA | FEI Company |
| 17957171 | CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER | Non-Final OA | FEI COMPANY |
| 17948531 | APPARATUS AND METHOD FOR AUTOMATED GRID VALIDATION | Non-Final OA | FEI Company |
| 18170142 | ELECTROMAGNETIC LENS AND ELECTRON SOURCE MECHANISM | Non-Final OA | NuFlare Technology, Inc. |
| 18464063 | METHOD OF CONTROLLING A MULTI-POLE DEVICE TO REDUCE OMISSION OF EXITING CHARGED PARTICLES FROM DOWNSTREAM ANALYSIS | Non-Final OA | WATERS TECHNOLOGIES CORPORATION |
| 18041408 | ELECTRON EMITTER AND DEVICE PROVIDED WITH SAME | Non-Final OA | Denka Company Limited |
| 18455356 | TWO FREQUENCY ION TRAP PERFORMANCE | Non-Final OA | Thermo Finnigan LLC |
| 18251934 | Removable Ion Source Capable Of Axial Or Cross Beam Ionization | Final Rejection | THERMO FINNIGAN LLC |
| 18267356 | DEVICE FOR DISINFECTING A FLUID FLOW IN A CONDUIT BY MEANS OF UV-C RADIATION | Final Rejection | ISTITUTO NAZIONALE DI ASTROFISICA |
| 17974331 | Systems, Devices, and Methods for Converting a Neutron Beam | Non-Final OA | TAE Life Sciences, LLC |
| 18352733 | MASS SPECTROMETRY DEVICE WITH SEGMENTED AND GRADUAL ION TRANSPORT CHANNEL | Final Rejection | Hangzhou Calibra TECHNOLOGIES Co., Ltd. |
| 18055999 | EFFICIENT AND STABLE SECONDARY ION EXTRACTION APPARATUS | Final Rejection | Institute of Geology, Chinese Academy of Geological Sciences |
| 17779796 | ELECTRON BEAM RADIATION SYSTEM WITH ADVANCED APPLICATOR COUPLING SYSTEM HAVING INTEGRATED DISTANCE DETECTION AND TARGET ILLUMINATION | Final Rejection | INTRAOP MEDICAL CORPORATION |
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