Prosecution Insights
Last updated: October 02, 2026

Examiner: DAGNEW, MEKONNEN D

Tech Center 2800 • Art Units: 2422 2622 2637 2638 2664 2697 2699 2877

This examiner grants 84% of resolved cases

Analysis

Mekonnen D. Dagnew is an examiner in Tech Center 2800 and Art Unit 2422. He has 758 resolved cases. His allowance rate is 83.5 percent, which suggests a favorable environment for patent applicants. The median days to allowance is 916, which is a timeline for reaching a final resolution. These figures are based on the 758 resolved cases currently associated with his profile.

The interview lift for Dagnew is 15.4 percent. This positive lift indicates that interviews are an effective mechanism for further improving the chances of allowance. In Art Unit 2422, the 83.5 percent allowance rate is a key performance metric. Practitioners should consider the 15.4 percent interview lift when planning their prosecution strategy in Tech Center 2800.

The 916 days to allowance provides a benchmark for the expected timeline. With an 83.5 percent allowance rate, the examiner demonstrates a consistent approach to resolving cases. The 15.4 percent interview lift is an actionable data point for applicants seeking to improve their results in Art Unit 2422 and Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

83.5%
Allow Rate
+15.5% vs TC avg
774
Total Applications
+15.4%
Interview Lift
916
Avg Prosecution Days
Based on 758 resolved cases, 2023–2026

Rejection Statute Breakdown

4.7%
§101 Eligibility
19.1%
§102 Novelty
69.0%
§103 Obviousness
3.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
19092640 CONTROL APPARATUS, CONTROL METHOD, AND STORAGE MEDIUM Non-Final OA CANON KABUSHIKI KAISHA
18187782 INTEGRATED CIRCUIT DEVICE WITH PERFORMANCE-ENHANCING LAYOUT Non-Final OA Intel Corporation
18521088 FLASH MEMORY INCLUDING SELF-ALIGNED FLOATING GATES Non-Final OA TEXAS INSTRUMENTS INCORPORATED
19001419 METHOD OF DETECTING A DEFOCUS OF AN IMAGE SENSOR AND IMAGE SENSOR Non-Final OA OMNIVISION TECHNOLOGIES, INC.

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