Prosecution Insights
Prosecution Insights
Tech Center 4100 • Art Units: 2814 2818 4100
This examiner grants 100% of resolved cases
Charlotte Elizabeth Harbottle is an examiner in Tech Center 4100 and Art Unit 2814. The data shows 1 resolved case, which resulted in an allowance rate of 100.0%. The median days to allowance for this single case was 945. Because there is only 1 resolved case, these figures represent a very limited sample size for evaluating the examiner's long-term tendencies.
The interview lift is 0.0%, indicating that no change in the allowance probability was observed in this single instance. The 100.0% allowance rate and 945-day median are the only available metrics for this examiner. Practitioners should note that with only 1 resolved case, these numbers may not predict future performance in Art Unit 2814.
The 945-day timeline for the single resolved case provides a solitary data point for pendency. In Tech Center 4100, this 100.0% allowance rate reflects a successful outcome for the applicant involved. However, the 0.0% interview lift and the single case resolution mean that more data is needed to establish a reliable profile.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18603426 | ELECTROSTATIC DISCHARGE PROTECTION DEVICE | Non-Final OA | MEDIATEK INC. |
| 18740625 | MEMORY DEVICE WITH MULTIPLE MEMORY CELL ARCHITECTURES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18600172 | INTEGRATED CIRCUIT PACKAGES WITH THERMAL RESERVOIR DIES AND METHODS OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18618354 | INTEGRATING NITRIDE STRESS COMPENSATION LAYERS FOR THICK OXIDE WAFER CREATION | Final Rejection | Tokyo Electron Limited |
| 18594605 | SEMICONDUCTOR DEVICE FOR AUDIO | Final Rejection | ROHM CO., LTD. |
| 18736843 | METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE INCLUDING NITROGEN TREATMENT AND SEMICONDUCTOR STRUCTURE THEREOF | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 18839510 | SOLID-STATE IMAGING ELEMENT, AND METHOD FOR MANUFACTURING SOLID-STATE IMAGING ELEMENT | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
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