Prosecution Insights
Last updated: October 01, 2026

Examiner: KAO, SOPHIA WEI-CHUN

Tech Center 3600 • Art Units: 2817 2897 3652

This examiner grants 96% of resolved cases

Analysis

Sophia Wei-Chun Kao, an examiner in Tech Center 3600 and Art Unit 2817, has handled 98 resolved cases. The data reveals an allowance rate pct of 95.9 and a median days to allowance of 1108. These 98 resolved cases establish a pattern of outcomes for applications in Art Unit 2817. The 95.9 percent allowance rate indicates the frequency of successful grants.

The interview lift pct of 5.1 shows that personal engagement provides an increase in the probability of allowance. This 5.1 percent lift suggests that interviews can be a tool for resolving specific issues. Practitioners can use the 1108 days to allowance to plan for the duration of the prosecution. The 95.9 percent allowance rate and 1108 days to allowance are the key indicators for this examiner. The 98 resolved cases provide the basis for these observations.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

95.9%
Allow Rate
+43.9% vs TC avg
117
Total Applications
+5.1%
Interview Lift
1108
Avg Prosecution Days
Based on 98 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
26.0%
§102 Novelty
54.7%
§103 Obviousness
17.7%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18431548 IMAGE SENSOR AND MANUFACTURING METHOD OF IMAGE SENSOR Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18534223 LED-CHIP SORTING DEVICE AND LED CHIP MANUFACTURING METHOD Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18440508 LIGHT EMITTING ELEMENT AND DISPLAY DEVICE Non-Final OA Samsung Display Co., LTD.
18368029 ELECTRONIC DEVICE Non-Final OA InnoLux Corporation
18499769 DISPLAY PANEL AND DISPLAY APPARATUS Non-Final OA Tianma Advanced Display Technology Institute (Xiamen) Co., Ltd.
18072026 Slot Bow-Tie Antenna On Package Non-Final OA Texas Instruments Incorporated
18474240 SEMICONDUCTOR DEVICE AND LAYOUT METHOD OF THE SAME Non-Final OA Realtek Semiconductor Corporation
18440483 SACRIFICIAL TEST PAD Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18440671 DELAMINATION DETECTION STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18497643 INTEGRATED CIRCUIT DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
18485953 SEMICONDUCTOR DEVICES WITH EMBEDDED FILLER PARTICLES AND ASSOCIATED METHODS FOR THEIR PRODUCTION Final Rejection Infineon Technologies AG

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