Listed by the USPTO as KERVEROS, DEMETRIOS C
Tech Center 2100 • Art Units: 2111 2114 2117 2133 2138
This examiner grants 87% of resolved cases
KERVEROS, DEMETRIOS C is a USPTO patent examiner in tech center 2100 and art unit 2111. The record contains 1107 resolved cases, an allowance rate of 87.4%, and a median of 851 days to allowance. Interview lift is 2.6%, indicating a limited measured effect from interviews and placing emphasis on the written prosecution record.
The leading companies are Micron Technology Inc., Intel Corporation, and Winbond Electronics Corp. The leading firms are BIRCH STEWART KOLASCH & BIRCH, LLP, JCIPRNET, and KENJA IP LAW PC. Applicants should present technically precise claims and arguments, use interviews for narrow clarification, and take the recorded allowance timing into account when planning responses, continuation activity, and client expectations.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18907092 | SYSTEMS AND METHODS FOR ERROR DETECTION AND CONTROL FOR EMBEDDED MEMORY AND COMPUTE ELEMENTS | Non-Final OA | Intel Corporation |
| 18853475 | CORRECTABLE ERROR COUNTER AND LEAKY BUCKET FOR PERIPHERAL COMPONENT INTERCONNECT EXPRESS (PCIE) AND COMPUTE EXPRESS LINK (CXL) DEVICES | Non-Final OA | Intel Corporation |
| 18326039 | MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL CIRCUITS | Non-Final OA | Intel Corporation |
| 18106244 | TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY | Final Rejection | Altera Corporation |
| 19219935 | MEMORY SUB-SYSTEM FOR MANAGING BLOCK STRIPE ASSIGNMENT BASED ON BLOCK ERROR CONDITIONS | Non-Final OA | Micron Technology, Inc. |
| 19204228 | ON-DIE ERROR DETECTION AND CORRECTION FOR META DATA | Non-Final OA | Micron Technology, Inc. |
| 19088010 | MULTIPLE BIT FLIP THRESHOLD SETS FOR IMPROVED ERROR CORRECTION IN A MEMORY SUB-SYSTEM | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 19083962 | ADAPTING A LOG-LIKELIHOOD RATIO TO A CODEWORD USING A MACHINE LEARNING MODEL | Non-Final OA | MICRON TECHNOLOGY, INC. |
| 19075572 | OPERATIONAL MODES OF A MEMORY REGISTER | Non-Final OA | Micron Technology, Inc. |
| 19054497 | DISTRIBUTING SELECT GATE SCAN ACROSS ERASE CYCLES | Non-Final OA | Micron Technology, Inc. |
| 18889273 | ERROR CHECK FUNCTIONALITY VERIFICATION USING KNOWN ERRORS | Non-Final OA | Micron Technology, Inc. |
| 18782624 | FLEXIBLE ADDRESS SWAP COLUMN REDUNDANCY | Non-Final OA | Micron Technology, Inc. |
| 19053083 | DYNAMICAL LOCKING OF SEED VALUE FOR LFSR DESCRAMBLER FOR USB | Non-Final OA | Tektronix, Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy87.4% of resolved applications examined by Demetrios C Kerveros were allowed (1,107 resolved cases), compared with 86.7% across Art Unit 2111 over the last five years.
This examiner's interview lift is +2.6 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Demetrios C Kerveros took 851 days on average from filing to allowance.
Demetrios C Kerveros examines applications in Art Unit 2111 in Tech Center 2100 (Computing & Software).
