Prosecution Insights
Last updated: October 02, 2026

Examiner: KIDWELL, KAITLYN ELIZABETH

Tech Center 2800 • Art Units: 2855 2877

This examiner grants 78% of resolved cases

Analysis

Kaitlyn Elizabeth Kidwell, an examiner in Tech Center 2800 and Art Unit 2855, has resolved 50 cases. The allowance rate is 78.0 percent, and the median days to allowance is 899. These metrics suggest a high probability of success and an efficient path to patent issuance, with nearly eight out of ten applications reaching a grant.

The interview lift is 20.0 percent, showing that interviews are a very effective way to advance prosecution. This significant lift suggests that direct communication can help bridge the gap between the examiner's position and the applicant's claims. Practitioners should consider interviews as a standard part of their strategy to resolve any outstanding issues and secure an allowance more effectively than the 78.0 percent baseline.

For practitioners, the strategy with Kidwell should be to utilize the 20.0 percent interview lift whenever rejections are encountered. The 78.0 percent allowance rate is very favorable, and the 899 median days to allowance indicates a fast pace. Clear communication and early interviews are likely to result in a successful and efficient prosecution experience in Art Unit 2855.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

78.0%
Allow Rate
+10.0% vs TC avg
68
Total Applications
+20.0%
Interview Lift
899
Avg Prosecution Days
Based on 50 resolved cases, 2023–2026

Rejection Statute Breakdown

4.7%
§101 Eligibility
12.8%
§102 Novelty
55.3%
§103 Obviousness
25.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18505965 Electronic Device with Optical Angle Sensor Final Rejection Apple Inc.
19194339 Surface Inspection Apparatus and Method Non-Final OA ABB Schweiz AG
18762221 PHOTOMETRIC APPARATUS AND PHOTOMETRIC METHOD Non-Final OA Konica Minolta, Inc.
18238051 OPTICAL DEFECT DETECTION SYSTEM Non-Final OA RTX Corporation
18795616 OPTICAL FIBER CHARACTERISTICS MEASUREMENT APPARATUS Non-Final OA Yokogawa Electric Corporation
18316199 UTILITY POLE INTEGRITY ASSESSMENT BY DAS AND MACHINE LEARNING USING ENVIRONMENTAL NOISE Final Rejection NEC Laboratories America, Inc.
19032136 METHOD FOR INSPECTING SEMICONDUCTOR DEVICE AND SYSTEM THEREOF Non-Final OA TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
18557557 SUBSTRATE STATE MEASUREMENT DEVICE, PLATING APPARATUS, AND SUBSTRATE STATE MEASUREMENT METHOD Final Rejection EBARA CORPORATION
18580062 OPTICAL ELEMENT FOR USE IN METROLOGY SYSTEMS Non-Final OA ASML NETHERLANDS B.V.
19071685 VARIABLE WAVELENGTH INTERFEROMETRY Non-Final OA Onto Innovation Inc.
18842802 SPECTRUM SCANNING ASSEMBLY AND OPTICAL SEMICONDUCTOR ELEMENT Non-Final OA INNOLIGHT TECHNOLOGY (SUZHOU) LTD.
18435533 Waveguide Defect Control Non-Final OA Dualitas Ltd

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