Prosecution Insights
Last updated: October 02, 2026

Examiner: RICHTER, KARA MARIE

Tech Center 4100 • Art Units: 2871 2882 2884 3645 3667 4100

This examiner grants 54% of resolved cases

Analysis

Kara Marie Richter serves in Tech Center 4100 and Art Unit 2871, where she has 22 resolved cases. Her allowance rate of 54.5 percent indicates a balanced environment where just over half of the applications result in a grant. This 54.5 percent rate suggests that success is achievable through careful prosecution and strong technical arguments.

The data highlights a substantial interview lift of 32.9 percent. This 32.9 percent boost in allowance probability is a strong indicator that direct dialogue with the examiner is highly effective. With 22 resolved cases, this lift suggests that an interview can be a decisive factor in moving an application from a rejection to an allowance.

The median days to allowance for her docket is 1447. This 1447 day timeline is relatively long, requiring a sustained effort from practitioners. By leveraging the 32.9 percent interview lift, applicants may be able to more effectively navigate the 1447 day process and improve their odds beyond the 54.5 percent baseline allowance rate.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

54.5%
Allow Rate
-5.5% vs TC avg
70
Total Applications
+32.9%
Interview Lift
1447
Avg Prosecution Days
Based on 22 resolved cases, 2023–2026

Rejection Statute Breakdown

2.7%
§101 Eligibility
27.6%
§102 Novelty
53.7%
§103 Obviousness
14.2%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18000967 Method For Determining Wind Velocity Components by Means of a Laser Remote Sensor and by Means of a Temporal Coherence Non-Final OA IFP Energies nouvelles
17978949 DISTANCE MEASUREMENT SYSTEM, LIGHT EMITTING DEVICE, AND LIGHT RECEIVING DEVICE Final Rejection FUJIFILM Business Innovation Corp.
18203637 OPTOELECTRONIC SENSOR FOR DISTANCE MEASUREMENT WITH A ROUTING LAYER Final Rejection SICK AG
17880932 BEAM SPLITTER ARRANGEMENT FOR OPTOELECTRONIC SENSOR, OPTOELECTRONIC SENSOR HAVING SAME, AND METHOD OF BEAM SPLITTING IN AN OPTOELECTRONIC SENSOR Final Rejection SICK AG
17864186 SCANNING LIGHT SOURCE WITHOUT MOVING PARTS Non-Final OA Robert Bosch GmbH
17471814 APPARATUS FOR SELECTING LIDAR TARGET SIGNAL, LIDAR SYSTEM HAVING THE SAME, AND METHOD THEREOF Final Rejection Kia Corporation
18191815 FREQUENCY ESTIMATION SYSTEMS AND METHODS FOR COHERENT RANGE ESTIMATION Final Rejection Mitsubishi Electric Research Laboratories, Inc.
18848511 DISTANCE MEASURING MODULE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18693412 LIGHT SOURCE DEVICE, DISTANCE MEASURING DEVICE, AND DEVICE Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18559730 DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD Final Rejection Sony Semiconductor Solutions Corporation
18555485 PHOTODETECTION DEVICE AND DISTANCE MEASUREMENT SYSTEM Final Rejection Sony Semiconductor Solutions Corporation
18250759 DISTANCE MEASURING SENSOR AND DISTANCE MEASURING SYSTEM Final Rejection SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18255590 LIDAR SYSTEM, VEHICLE AND OPERATION METHOD Final Rejection ams-OSRAM International GmbH
17875895 OPTOELECTRONIC SEMICONDUCTOR DEVICE AND METHOD FOR OPERATING AN OPTOELECTRONIC SEMICONDUCTOR DEVICE Final Rejection ams International AG
18729370 MEASUREMENT DEVICE Non-Final OA KOITO MANUFACTURING CO., LTD.
17455637 OPTICAL RANGING DEVICE Final Rejection DENSO CORPORATION
18951179 PROXIMITY SENSING DEVICE Non-Final OA STMicroelectronics International N.V.
18423453 TESTER, SYSTEM, AND METHOD FOR TESTING AN OPTICAL SENSOR Final Rejection Rohde & Schwarz GmbH & Co. KG
18697527 STRUCTURED LIGHT PATTERN COMBINED WITH PROJECTION OF MARKERS Non-Final OA TRINAMIX GMBH
17868655 METHOD AND DEVICE FOR MEASURING TIME OF FLIGHT, STORAGE MEDIUM, AND LIDAR Non-Final OA SUTENG INNOVATION TECHNOLOGY CO., LTD.
18595040 TECHNIQUES FOR GALVO AFE WITH ENHANCED DYNAMIC RANGE CONTROL AND IMPROVED SENSITIVITY TO ELECTROMAGNETIC INTERFERENCE Non-Final OA AEVA, INC.
18126612 OPTICAL IMAGING DEVICE DEGRADATION CHECK Final Rejection Rosemount Aerospace Inc.
18186721 SYSTEMS AND TECHNIQUES FOR MITIGATING CROSSTALK AND INTERFERENCE FOR FLASH IMAGING LIGHT DETECTION AND RANGING (LiDAR) DEVICES Final Rejection GM Cruise Holdings LLC

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