Prosecution Insights
Last updated: May 29, 2026

Examiner: SCHNASE, PAUL DANIEL

Tech Center 2800 • Art Units: 2877

This examiner grants 81% of resolved cases

Performance Statistics

81.3%
Allow Rate
+13.3% vs TC avg
53
Total Applications
+33.3%
Interview Lift
994
Avg Prosecution Days
Based on 16 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
6.2%
§102 Novelty
92.0%
§103 Obviousness
1.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18367229 OPTICAL DEVICE, DIE BONDING SYSTEM, AND DIE BONDING METHOD Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18681696 EVENT DETECTION DEVICE, EVENT DETECTION SYSTEM, AND EVENT DETECTION METHOD Final Rejection NEC Corporation
18038146 POSITION SPECIFYING SYSTEM, VIBRATION GENERATOR, AND POSITION SPECIFYING METHOD Non-Final OA NEC Corporation
18300965 Optical Phase Imaging Device Optimization Methods Final Rejection Georgia Tech Research Corporation
18036619 BIOLOGICAL SAMPLE ANALYSIS SYSTEM, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND BIOLOGICAL SAMPLE ANALYSIS METHOD Final Rejection Sony Semiconductor Solutions Corporation
17636134 DISTANCE MEASUREMENT SYSTEM AND ELECTRONIC APPARATUS Non-Final OA SONY SEMICONDUCTOR SOLUTIONS CORPORATION
18573375 TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM Final Rejection Purdue Research Foundation
18740290 VEHICLE-BASED DUAL-COMB SPECTROMETER MEASUREMENTS Non-Final OA Honeywell International Inc.
18778483 INFEROMETRIC MEASURING APPARATUS Non-Final OA Carl Zeiss SMT GmbH
18572215 COATING EVALUATION DEVICE AND COATING EVALUATION METHOD Non-Final OA Nissan Motor Co., Ltd.
18843455 IMAGING DEVICE AND IMAGING METHOD Non-Final OA NIKON CORPORATION
18587203 SUSPENDED PARTICLE CONCENTRATION, DETECTION, AND ANALYSIS Non-Final OA Regents of the University of Minnesota
18539069 FILM THICKNESS MEASUREMENT DEVICE Non-Final OA INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
18401569 CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING Final Rejection KLA Corporation
17762030 CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS Non-Final OA KLA Corporation
18515688 METHOD AND SENSOR FOR THE OPTICAL MEASUREMENT OF MEASURANDS OF TRANSPARENT MEDIA Final Rejection Endress+Hauser Conducta GmbH+Co. KG
18275245 SPECTROMETRY DEVICE AND SPECTROMETRY METHOD Non-Final OA Osaka University
18777117 METHOD AND SYSTEM FOR IMPLEMENTING ELECTROLYTE MONITORING, COMPUTER STORAGE MEDIUM, AND TERMINAL Non-Final OA VRB Energy Inc.
18477158 MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY Non-Final OA Orbotech Ltd.
18239005 SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR REFLECTION Non-Final OA Orbotech Ltd.
17560619 SYSTEM AND METHOD FOR DETERMINING A PLANT STATUS Non-Final OA YARA INTERNATIONAL ASA
18568392 OPTOELECTRONIC BIOSENSOR AND METHOD Non-Final OA ams-OSRAM International GmbH
18639367 DIFFRACTIVE SENSOR FOR SENSING TARGET ANALYTES IN A SAMPLE, AND SYSTEM AND METHOD FOR SENSING TARGET ANALYTES IN A SAMPLE BY SAID DIFFRACTIVE SENSOR Final Rejection DG Group S.P.A.
18585104 APPARATUS AND METHOD FOR MEASURING OPTICAL PARTICLE USING MEASUREMENT REFERENCE VALUE DIFFERENCE Final Rejection KOREA RESERCH INSTITUTE OF STANDARDS AND SCIENCE
18478202 MULTIPLE LIGHT BEAM OPTICAL FREQUENCY MONITORING ASSEMBLY Non-Final OA Lumentum Technology (UK) Limited
17846029 LINE PATTERN PROJECTOR FOR USE IN THREE-DIMENSIONAL DISTANCE MEASUREMENT SYSTEM Final Rejection HIMAX TECHNOLOGIES LIMITED
18391297 LONG COHERENCE RANGE OPTICAL ANALYSIS Final Rejection Medlumics S.L.
18480223 MEASURING ENDFACE GEOMETRY OF FIBER OPTIC CONNECTORS WHILE MOUNTED IN A POLISHING PLATE Final Rejection Direct Optical Research Company, Inc.

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