Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 1798 2877
This examiner grants 69% of resolved cases
Paul Daniel Schnase is an examiner in Tech Center 2800 and Art Unit 1798. He has 29 resolved cases. The allowance rate for these cases is 69.0 percent. This 69.0 percent rate indicates the proportion of applications that result in a patent grant. Practitioners can use this 29-case history to understand the examiner's general tendencies in Art Unit 1798.
The interview lift is 6.1 percent. This 6.1 percent figure represents the difference in allowance probability when an interview is conducted. A positive value like 6.1 percent indicates that interviews are associated with a slightly higher likelihood of allowance. This suggests that requesting an interview is a helpful strategy for this docket.
The median days to allowance is 1070. This 1070-day duration is the middle value for the time from filing to grant. For applicants, this 1070-day median is a key metric for planning the prosecution timeline. By combining the 69.0 percent allowance rate with the 1070-day median, practitioners can develop a data-grounded strategy for their applications.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19061585 | OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM | Non-Final OA | KABUSHIKI KAISHA TOSHIBA |
| 19085520 | DETECTION DEVICE | Non-Final OA | Magnolia White Corporation |
| 18843455 | IMAGING DEVICE AND IMAGING METHOD | Non-Final OA | NIKON CORPORATION |
| 18036619 | BIOLOGICAL SAMPLE ANALYSIS SYSTEM, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND BIOLOGICAL SAMPLE ANALYSIS METHOD | Non-Final OA | Sony Semiconductor Solutions Corporation |
| 18572215 | COATING EVALUATION DEVICE AND COATING EVALUATION METHOD | Final Rejection | Nissan Motor Co., Ltd. |
| 18587203 | SUSPENDED PARTICLE CONCENTRATION, DETECTION, AND ANALYSIS | Final Rejection | Regents of the University of Minnesota |
| 18357018 | PROBE CARD | Final Rejection | SK hynix Inc. |
| 18740290 | VEHICLE-BASED DUAL-COMB SPECTROMETER MEASUREMENTS | Final Rejection | Honeywell International Inc. |
| 18573375 | TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM | Non-Final OA | Purdue Research Foundation |
| 18778483 | INFEROMETRIC MEASURING APPARATUS | Final Rejection | Carl Zeiss SMT GmbH |
| 19040176 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | Non-Final OA | KLA Corporation |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | Final Rejection | KLA Corporation |
| 17762030 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | Final Rejection | KLA Corporation |
| 18275245 | SPECTROMETRY DEVICE AND SPECTROMETRY METHOD | Final Rejection | Osaka University |
| 18721806 | OPTICAL SENSOR | Final Rejection | WIKA Optical Sensing Limited |
| 18450404 | APPARATUS FOR MEASURING THICKNESS OF SEALING PORTION OF SECONDARY BATTERY AND METHOD FOR MEASURING THICKNESS OF SEALING PORTION USING SAME | Non-Final OA | HANA TECHNOLOGY CO., Ltd. |
| 17767642 | LASER WORKING SYSTEM FOR PERFORMING A WORKING PROCESS ON A WORKPIECE BY MEANS OF A LASER BEAM AND METHOD FOR MONITORING A WORKING PROCESS ON A WORKPIECE BY MEANS OF A LASER BEAM | Non-Final OA | Precitec GmbH & Co. KG |
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