Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2877
This examiner grants 73% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18367229 | OPTICAL DEVICE, DIE BONDING SYSTEM, AND DIE BONDING METHOD | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18036619 | BIOLOGICAL SAMPLE ANALYSIS SYSTEM, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND BIOLOGICAL SAMPLE ANALYSIS METHOD | Final Rejection | Sony Semiconductor Solutions Corporation |
| 19061585 | OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM | Non-Final OA | KABUSHIKI KAISHA TOSHIBA |
| 18300965 | Optical Phase Imaging Device Optimization Methods | Final Rejection | Georgia Tech Research Corporation |
| 18357018 | PROBE CARD | Final Rejection | SK hynix Inc. |
| 17846029 | LINE PATTERN PROJECTOR FOR USE IN THREE-DIMENSIONAL DISTANCE MEASUREMENT SYSTEM | Non-Final OA | HIMAX TECHNOLOGIES LIMITED |
| 17358011 | DOT PATTERN PROJECTOR FOR USE IN THREE-DIMENSIONAL DISTANCE MEASUREMENT SYSTEM | Non-Final OA | HIMAX TECHNOLOGIES LIMITED |
| 19040176 | CALIBRATED MEASUREMENT OF OVERLAY ERROR USING SMALL TARGETS | Non-Final OA | KLA Corporation |
| 18401569 | CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING | Final Rejection | KLA Corporation |
| 18539069 | FILM THICKNESS MEASUREMENT DEVICE | Non-Final OA | INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE |
| 18477158 | MULTI-PHASE INTERFEROMETER FOR 3D METROLOGY | Non-Final OA | Orbotech Ltd. |
| 18239005 | SYSTEM AND METHOD FOR ENHANCED INSPECTION OF SURFACES WITH SPECULAR REFLECTION | Non-Final OA | Orbotech Ltd. |
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