Prosecution Insights
Last updated: May 29, 2026

Examiner: TANDY, LAURA ELOISE

Tech Center 2800 • Art Units: 2881

This examiner grants 62% of resolved cases

Performance Statistics

62.0%
Allow Rate
-6.0% vs TC avg
90
Total Applications
+41.0%
Interview Lift
1152
Avg Prosecution Days
Based on 50 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
2.2%
§102 Novelty
87.2%
§103 Obviousness
9.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18293052 DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER FOR SIDE ENTRY ELECTRON MICROSCOPES Non-Final OA Ohio State Innovation Foundation
18441483 THERMOELECTRIC CONTROL FOR A CRUCIBLE FOR USE WITH AN ION SOURCE Non-Final OA Applied Materials, Inc.
18303370 GA IMPLANT PROCESS CONTROL FOR ENHANCED PARTICLE PERFORMANCE Non-Final OA Applied Materials, Inc.
18107819 System and Method for Reducing Particle Formation in a Process Chamber of an Ion Implanter Non-Final OA Applied Materials, Inc.
18298031 METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
17591569 COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE IMAGING Non-Final OA KLA Corporation
18124026 BLADE EDGE TIP MEASUREMENT Final Rejection The Gillette Company LLC
17747597 MECHANISM FOR CURING ADHESIVE IN A ROBOTIC ASSEMBLY CELL Final Rejection DIVERGENT TECHNOLOGIES, INC.
18204593 IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BEAM DEVICE Non-Final OA Carl Zeiss Microscopy GmbH
17999932 DEVICE FOR REDUCING ICE CONTAMINATION OF A SAMPLE, FOCUSED ION BEAM MILLING APPARATUS AND METHOD FOR FOCUSED ION BEAM MILLING OF A SAMPLE Final Rejection MAX-PLANCK-GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN E. V.
18448430 METHOD AND SYSTEM FOR PREPARING A SPECIMEN Non-Final OA FEI Company
18447812 THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT Non-Final OA FEI Company
18299635 TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY Final Rejection FEI Company
18178156 METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS Final Rejection FEI Company
18343645 SWITCHABLE-PATH ION GUIDE Non-Final OA Thermo Fisher Scientific (Bremen) GmbH
18043591 PULSE SPECTROSCOPY DEVICE Final Rejection Ushio Denki Kabushiki Kaisha
17983220 PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTICLE MICROSCOPE Non-Final OA Carl Zeiss MultiSEM GmbH
18364942 DIRECTIONAL BROADBAND EMISSIVITY WITH ANGLED MICROSTRUCTURES PRODUCED BY LASER SURFACE PROCESSING (LSP) Final Rejection NUtech Ventures, Inc.
18098471 SYSTEMS AND METHODS FOR MASS SPECTROMETRY Final Rejection THE BOARD OF TRUSTEES OF WESTERN MICHICAN UNIVERSITY
18012209 COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-RESOLVED SPECTRA Final Rejection Scienta Omicron AB
17987984 TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREFOR Final Rejection Xiamen Chip-Nova Technology Co., Ltd.
17797684 POLE PIECE FOR A TRANSMISSION ELECTRON MICROSCOPE Non-Final OA THE PROVOST, FELLOWS, SCHOLARS AND OTHER MEMBERS OF BOARD OF TRINITY COLLEGE DUBLIN
17719801 FLASH RADIOTHERAPY SYSTEMS AND METHODS OF USE Final Rejection The New York Proton Center

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