Tech Center 2800 • Art Units: 2881
This examiner grants 62% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18293052 | DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER FOR SIDE ENTRY ELECTRON MICROSCOPES | Non-Final OA | Ohio State Innovation Foundation |
| 18441483 | THERMOELECTRIC CONTROL FOR A CRUCIBLE FOR USE WITH AN ION SOURCE | Non-Final OA | Applied Materials, Inc. |
| 18303370 | GA IMPLANT PROCESS CONTROL FOR ENHANCED PARTICLE PERFORMANCE | Non-Final OA | Applied Materials, Inc. |
| 18107819 | System and Method for Reducing Particle Formation in a Process Chamber of an Ion Implanter | Non-Final OA | Applied Materials, Inc. |
| 18298031 | METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17591569 | COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE IMAGING | Non-Final OA | KLA Corporation |
| 18124026 | BLADE EDGE TIP MEASUREMENT | Final Rejection | The Gillette Company LLC |
| 17747597 | MECHANISM FOR CURING ADHESIVE IN A ROBOTIC ASSEMBLY CELL | Final Rejection | DIVERGENT TECHNOLOGIES, INC. |
| 18204593 | IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BEAM DEVICE | Non-Final OA | Carl Zeiss Microscopy GmbH |
| 17999932 | DEVICE FOR REDUCING ICE CONTAMINATION OF A SAMPLE, FOCUSED ION BEAM MILLING APPARATUS AND METHOD FOR FOCUSED ION BEAM MILLING OF A SAMPLE | Final Rejection | MAX-PLANCK-GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN E. V. |
| 18448430 | METHOD AND SYSTEM FOR PREPARING A SPECIMEN | Non-Final OA | FEI Company |
| 18447812 | THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT | Non-Final OA | FEI Company |
| 18299635 | TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY | Final Rejection | FEI Company |
| 18178156 | METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS | Final Rejection | FEI Company |
| 18343645 | SWITCHABLE-PATH ION GUIDE | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18043591 | PULSE SPECTROSCOPY DEVICE | Final Rejection | Ushio Denki Kabushiki Kaisha |
| 17983220 | PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTICLE MICROSCOPE | Non-Final OA | Carl Zeiss MultiSEM GmbH |
| 18364942 | DIRECTIONAL BROADBAND EMISSIVITY WITH ANGLED MICROSTRUCTURES PRODUCED BY LASER SURFACE PROCESSING (LSP) | Final Rejection | NUtech Ventures, Inc. |
| 18098471 | SYSTEMS AND METHODS FOR MASS SPECTROMETRY | Final Rejection | THE BOARD OF TRUSTEES OF WESTERN MICHICAN UNIVERSITY |
| 18012209 | COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-RESOLVED SPECTRA | Final Rejection | Scienta Omicron AB |
| 17987984 | TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREFOR | Final Rejection | Xiamen Chip-Nova Technology Co., Ltd. |
| 17797684 | POLE PIECE FOR A TRANSMISSION ELECTRON MICROSCOPE | Non-Final OA | THE PROVOST, FELLOWS, SCHOLARS AND OTHER MEMBERS OF BOARD OF TRINITY COLLEGE DUBLIN |
| 17719801 | FLASH RADIOTHERAPY SYSTEMS AND METHODS OF USE | Final Rejection | The New York Proton Center |
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