Prosecution Insights
Last updated: April 19, 2026

Examiner: TANDY, LAURA ELOISE

Tech Center 2800 • Art Units: 2881

This examiner grants 67% of resolved cases

Performance Statistics

66.7%
Allow Rate
-1.3% vs TC avg
86
Total Applications
+43.8%
Interview Lift
1130
Avg Prosecution Days
Based on 42 resolved cases, 2023–2026

Rejection Statute Breakdown

2.0%
§101 Eligibility
18.8%
§102 Novelty
47.8%
§103 Obviousness
28.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18366355 GUIDE PIN, SYSTEM FOR PRECISELY CONTROLLING SPECIMEN INCLUDING THE SAME, AND METHOD FOR OBSERVING SPECIMEN USING THE SAME Non-Final OA Samsung Electronics Co., Ltd.
18293052 DEVICE AND METHOD FOR VIBRATION FREE LOW TEMPERATURE SAMPLE HOLDER FOR SIDE ENTRY ELECTRON MICROSCOPES Non-Final OA Ohio State Innovation Foundation
18303370 GA IMPLANT PROCESS CONTROL FOR ENHANCED PARTICLE PERFORMANCE Non-Final OA Applied Materials, Inc.
18107819 System and Method for Reducing Particle Formation in a Process Chamber of an Ion Implanter Non-Final OA Applied Materials, Inc.
18298031 METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
17917672 NANOTIP ION SOURCES AND METHODS Non-Final OA Brown University
18331764 UV FLOOR COVERING Final Rejection B/E Aerospace, Inc.
18037346 SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD Final Rejection HAMAMATSU PHOTONICS K.K.
17918144 CHARGED PARTICLE BEAM DEVICE Non-Final OA Hitachi High-Tech Corporation
17961247 APERTURE ASSEMBLY, BEAM MANIPULATOR UNIT, METHOD OF MANIPULATING CHARGED PARTICLE BEAMS, AND CHARGED PARTICLE PROJECTION APPARATUS Final Rejection ASML Netherlands B.V.
18124026 BLADE EDGE TIP MEASUREMENT Final Rejection The Gillette Company LLC
18039574 QUADRUPOLE MASS SPECTROMETER AND RESIDUAL GAS ANALYSIS METHOD Final Rejection HORIBA STEC, Co., Ltd.
17862052 MINIATURE ELECTRON OPTICAL COLUMN WITH A LARGE FIELD OF VIEW Final Rejection KLA Corporation
17591569 COMBINING FOCUSED ION BEAM MILLING AND SCANNING ELECTRON MICROSCOPE IMAGING Non-Final OA KLA Corporation
18073691 ANALYSIS SYSTEM, ANALYSIS METHOD, COMPUTER PROGRAM PRODUCT AND SAMPLE HOLDER Non-Final OA Carl Zeiss Microscopy GmbH
17999932 DEVICE FOR REDUCING ICE CONTAMINATION OF A SAMPLE, FOCUSED ION BEAM MILLING APPARATUS AND METHOD FOR FOCUSED ION BEAM MILLING OF A SAMPLE Final Rejection MAX-PLANCK-GESELLSCHAFT ZUR FÖRDERUNG DER WISSENSCHAFTEN E. V.
18031240 Exhaust Flow Boosting for Sampling Probe for Use in Mass Spectrometry Systems and Methods Non-Final OA DH Technologies Development Pte. Ltd.
18448430 METHOD AND SYSTEM FOR PREPARING A SPECIMEN Non-Final OA FEI Company
18447812 THERMAL CONDITIONING ENCLOSURE FOR A CHARGED PARTICLE INSTRUMENT Non-Final OA FEI Company
18178156 METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (TEM) ANALYSIS Final Rejection FEI Company
18343645 SWITCHABLE-PATH ION GUIDE Non-Final OA Thermo Fisher Scientific (Bremen) GmbH
17978693 PRE-CALCULATED COLLIMATOR MODEL FOR DOSE CALCULATION SOURCE MODELING Final Rejection Siemens Healthineers International AG
18355681 ELECTRON BEAM WRITING APPARATUS AND ELECTRON BEAM WRITING METHOD Final Rejection NuFlare Technology, Inc.
18343128 BLANKING APERTURE ARRAY SYSTEM AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS Non-Final OA NuFlare Technology, Inc.
18364942 DIRECTIONAL BROADBAND EMISSIVITY WITH ANGLED MICROSTRUCTURES PRODUCED BY LASER SURFACE PROCESSING (LSP) Final Rejection NUtech Ventures, Inc.
17920881 MICROFLUIDIC DEVICES WITH GAS CHANNELS FOR SAMPLE NEBULIZATION Final Rejection INTABIO, LLC
17797684 POLE PIECE FOR A TRANSMISSION ELECTRON MICROSCOPE Non-Final OA THE PROVOST, FELLOWS, SCHOLARS AND OTHER MEMBERS OF BOARD OF TRINITY COLLEGE DUBLIN
18098471 SYSTEMS AND METHODS FOR MASS SPECTROMETRY Final Rejection THE BOARD OF TRUSTEES OF WESTERN MICHICAN UNIVERSITY
18004569 DEVICE FOR DECONTAMINATING OBJECTS Final Rejection CLARANOR
18012209 COMPUTER-IMPLEMENTED METHOD FOR GENERATING EVENT-AVERAGED AND TIME-RESOLVED SPECTRA Final Rejection Scienta Omicron AB

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